The crystal properties of the sample were characterized from 10 to 80° in 2θ by an X-ray diffractometer with CuKα radiation (Shimadzu XRD 6000, Kyoto, Japan). Morphological characteristics were characterized by FESEM (JEOL JSM-6701F combined with EDX, Tokyo, Japan) and high resolution transmission electron microscope (HRTEM) (JEOL JEM 3010). UV–Vis absorption spectra were recorded by a UV–visible spectrophotometer (Perkin Elmer Lambda 35, (Waltham, MA, USA). The FTIR spectra of biosynthesized CuO NPs were recorded by KBr pellet method using FTIR spectrophotometer (Perkin Elmer RX1). The X-ray photoelectron spectra were obtained using Perkin Elmer PHI5600 (ULVAC-PHI, Inc.,Waltham, MA, USA). A micro-Raman spectrometer equipped with an optical microscope (Olympus BX51, Tokyo, Japan), a CW 532 nm DPSS laser, a Peltier-cooled CCD camera (DV401, Andor Technology, Belfast, UK) and a monochromator (MS257, Oriel Instruments Co., Stratford, CT, USA) were used to measure the Raman spectra.
Phi 5600
Manufactured by PerkinElmer
Sourced in United States
The PHI 5600 is an X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It provides quantitative information about the chemical composition and electronic structure of surfaces and thin films.
Automatically generated - may contain errors
Lab products found in correlation
Jem 2100, by JEOL (2 mentions)
Lambda 35, by PerkinElmer (1 mentions)
Xrd 6000, by Shimadzu (1 mentions)
Jem 3010, by JEOL (1 mentions)
Jsm 6701f, by JEOL (1 mentions)
Phosphoric acid, by Merck Group (1 mentions)
Potassium permanganate, by Merck Group (1 mentions)
Jsm 6500f, by JEOL (1 mentions)
V 670, by Jasco (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
D8 advance system, by Bruker (1 mentions)
S 4800, by Thermo Fisher Scientific (1 mentions)
U 3900h spectrophotometer, by Hitachi (1 mentions)
Icp ms 7700, by Agilent Technologies (1 mentions)
Jem 2011, by JEOL (1 mentions)
Jes fa200, by JEOL (1 mentions)
X pert, by Malvern Panalytical (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
Tristar 2 3020m, by Micromeritics (1 mentions)
Vario el 3 elemental analyser, by Elementar (1 mentions)
12 protocols using phi 5600
1
Comprehensive Characterization of CuO Nanoparticles
2
Synthesizing Graphene Oxide from Graphite
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GO was synthesized via the modified route developed by Marcano et al. (20 (link)). Into the mixture of concentrated sulfuric acid (120 mL; Ward’s Science, 470302-872) and phosphoric acid (13 mL; Sigma-Aldrich, 345245), graphite flakes (1 g; Sigma-Aldrich, 332461) were added. Potassium permanganate (6 g; Sigma-Aldrich, 223468) was slowly added, after which the mixture was placed in a water bath at 45 °C and stirred overnight. The reaction mixture was then moved into an ice bath and deionized (DI) water (100 mL) was poured in, followed by the addition of 30% H2O2 (1.5 mL; Sigma-Aldrich, 216763). The mixture was allowed to sit for 2 h and was then centrifuged at 5,000 rpm for 20 min. The solid material at the bottom was retrieved and washed extensively with DI water by centrifugation until the pH reached 5. Finally, the remaining viscous material was collected and stirred overnight to make a GO stock solution in water. After drying at 80 °C, XPS measurements were performed on GO flakes with a PerkinElmer PHI 5600 X-ray photoelectron spectrometer.
3
Characterization of Nanocomposite Photovoltaic Coatings
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X-ray diffraction (XRD) measurements were recorded with a BrukerD2 phaser diffractometer (Karlsruhe, Germany) using a Cu Kα radiation source in the scan range of 20–80° (2θ) at a scan rate of 2° min−1 and step size of 0.02°. The morphologies and sizes of the prepared powder samples and nanocomposites were studied by field emission scanning electron microscopy (FESEM, JSM6500F, JEOL, Tokyo, Japan) and transmission electron microscopy (TEM, JEOLJEM-2010, Tokyo, Japan). The surface compositions of the samples and the binding energies of the W4f core levels were determined by X-ray photoelectron spectroscopy (XPS, Perkin-Elmer PHI 5600, Waltham, MA, USA). The optical response of the coating was measured by using a spectrophotometer (JASCO V-670, Keith Link Technology, Jasco Analytical Instruments, Easton, MD, USA), which provided the transmittance in the UV, visible, and infrared ranges (300–2500 nm). In order to evaluate the photothermal conversion properties of the nanocomposites, the samples were irradiated with an infrared lamp at a power of 150 W and the temperature distribution was recorded by using a thermal imaging camera (FLIR P384A3-20, CTCT, Co. Ltd., Taipei, Taiwan). The thermal properties of the nanocomposites such as conductivity, absorptivity, and resistivity were measured by using the Alambeta instrument (Sensora Instruments, Thurmansbang, Germany).
4
Comprehensive Material Characterization Protocol
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The morphologies and the corresponding elemental maps of the samples were characterized on the Hitachi S-4800 scanning electron microscope (SEM) and FEI Tecnai G2 F20 transmission electron microscope (TEM). X-ray diffraction (XRD, Bruker D8 Advance system, Cu-Kα, λ = 1.5418 Å) was used to identify the crystal phase of the samples. The chemical elements and bonding characterizations were analyzed on an X-ray photoelectron spectroscopy (XPS, PerkinElmer model PHI 5600). The thermogravimetric analysis (TGA) curves were surveyed on a STA499F5 analyzer. The nitrogen adsorption/desorption isotherms and surface areas were conducted by Brunauer–Emmett–Teller analysis on a physical & chemical adsorption system (ASAP 2460) at the constant temperature of 77 K. The ultraviolet-visible (UV-vis) absorption test was recorded on the U-3900H spectrophotometer (Hitachi, Japan). The optical images were taken using a Sony camera.
5
Characterization of PQAS–AgNPs Composite
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UV-visible absorption spectroscopy (JiHong, China) with quartz cuvettes (1 cm optical path) as the containers was used to record the UV-visible absorption spectra. The morphology and the size of PQAS–AgNPs were determined by transmission electron microscopy (TEM, JEM-2011, Jeol, Japan), which was coupled with an energy dispersive spectrometer (EDS). X-ray photoelectron spectroscopy (XPS) (PHI 5600, PerkinElmer Inc.) was used to determine the valence state of the produced AgNPs. The surface charge of the AgNPs was evaluated by zeta (ζ) potential, using a Zetasizer Nano instrument (Zetasizer Nano ZS 90, Malvern, UK) at 25 °C. The concentration of synthesized composite material was calculated by silver. The silver concentration was measured by an inductively coupled plasma mass spectrometry (ICP-MS7700, Agilent, USA) after being digested with concentrated HNO3 for 2 h.
6
Comprehensive Characterization of Nanomaterials
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The morphology and structure were characterized by high-resolution transmission electron microscopy (JEM-2100, JEOL Co.). XRD (X'Pert, PANalytical BV) was used to analyse the crystal structure. The diffuse reflectance spectra were measured on a ultraviolet–visible spectrophotometer (UV 2550, Shimadzu Co.). The chemical compositions were characterized using XPS (PHI 5600, Perkin-Elmer Inc.) and Raman spectrum (LABRAM-HR, JY Co.). The electronic state of Ti and O atoms were measured to provide structural information by ESR (JES-FA200, JEOL Co.). The surface area was measured using the BET method with a Builder 4200 instrument (Tristar II 3020M, Micromeritics Co.) at liquid nitrogen temperature. The infrared spectra were recorded between 4,000 and 400 cm−1 with a FTIR spectrometer (Magna-IR 750, Nicolet Instrument Co.) using a potassium bromide disc technique.
7
Comprehensive Characterization of Co-Sn Samples
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The phases of the samples were characterized by powder X-ray diffraction (XRD) (SmartLab, Rigaku) with Cu Kα (λ = 1.54178 Å) radiation source. The morphology of the samples was determined by means of scanning electron microscopy (SEM) (JEOL JSM-7800F) and transmission electron microscopy (TEM) (Tecnai G2 F30). The Brunauer–Emmett–Teller (BET) surface area of the sample was measured on a Quantachrome Autosorb-iQ-MP surface area detecting instrument with N2 physisorption at 77 K. X-ray photoelectron spectroscopy (XPS) was carried out on a PHI 5600 instrument (PerkinElmer, USA). Raman spectroscopy was recorded on a Renishaw spectrometer. Thermogravimetric analysis (TGA) was performed under air flow by a TG 209 (Netzsch). Atomic force microscope (AFM) measurement was recorded on a XE7, Park system. The atomic ratio of Co to Sn was confirmed by inductively coupled plasma optical emission spectrometry (ICP-OES, Prodigy 7, Leeman Labs). Elemental analysis was tested by a VarioELIII elemental analyser, Elementar, Germany.
8
Characterization of Nano-Scale Materials
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The sample phases were characterized by powder X-ray diffraction (XRD; Rigaku, D/max-2500) with Cu Kα radiation (λ = 1.5418 Å). The XRD dates were collected over the 2θ range 10–80° at a scanning rate of 2° min−1. The sample morphologies and their element distributions were observed under a field emission scanning electron microscope (FESEM; SU8010) outfitted with X-MAXN energy-dispersive spectroscopy. The microelements in the samples, such as lithium, nickel, cobalt, and aluminum, were verified by inductively coupled plasma spectroscopy (ICP; PerkinElmer, Optima 2100 DV). Table 1 lists the elemental compositions of the as-prepared samples detected by ICP. The specific surface areas and porosities of the precursors at 77 K were measured from the N2 adsorption/desorption isotherms acquired by a Micrometrics ASAP 2020M system. The particle-size distributions in the materials were measured by a laser analyzer (Malvern 3000). Surface analysis was performed by X-ray photoelectron spectroscopy (XPS, PHI5600, PerkinElmer).
9
Comprehensive Characterization of NbC Nanoparticles
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The morphologies of NbC were observed by TEM (JEOL JEM-2100, Japan). The size distribution analysis was conducted on Zetasizer Nano S90 (Malvern Panalytical, UK). The crystal phase was tested by XRD (Shimadzu XD-D1). The composition and chemical valence of NbC were measured by XPS spectra (PerkinElmer PHI 5600). UV-vis-NIR absorptive spectra of samples were performed on a spectrophotometer (U-4100, Hitachi, Japan). The concentration of Nb element within cells was analyzed by inductively coupled plasma (ICP) atomic emission spectrometer (8300, PerkinElmer, USA). Two-dimensional ultrasound (2D US), Color Doppler Flow Imaging (CDFI) and contrast-enhanced ultrasound (CEUS) scans were performed using MyLab twice system (Esaote SpA, Florence, Italy) with LA523 probe. All the data of shave wave elastography (SWE) were recorded by a real-time US device (Aixplorer; SuperSonic Imagine, Aix-en-Provence, France) with 4-15 MHz liner transducer.
10
Characterization of Thin Film Properties
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The sheet resistance of the film was measured using a four-point probe meter (Keithley 2400, Ω-MΩ) (Tektronix technology (China) Co., Ltd., Shanghai, China). The transmittance of the film was measured using an ultraviolet-visible (UV–vis) spectrophotometer at the wavelength of 550 nm, and the transmittance of the glass substrate was subtracted. A field emission-scanning electron microscope (FE-SEM, Hitachi S-4800, Tokyo, Japan) and atomic force microscope (AFM, Bruker, California, USA) were utilized to observe the morphology of the films, and the latter was also used to measure surface roughness. A transmission electron microscope (TEM, TECNAI-20) (Hitachi, Tokyo, Japan) was also used to observe the morphology of the films, prepared by scraping the films off glass substrates using a blade in water with copper grids supporting the films. X-ray photoelectron spectroscopy (XPS, Perkin-Elmer PHI 5600, Al Kα source) (Massachusetts, USA) was used to detect the changes of surface functional groups and elemental content. The performance of OLEDs was tested in a photoelectric tester (SuzhouFstar Scientific InstrumentCo., Ltd., FS-1500GA-OLED) (Suzhou, China).
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