Nicolet 6700 fourier transform infrared ft ir spectrometer

Any structural change after the chemical modification was investigated using infrared spectra obtained on a Nicolet 6700 Fourier Transform Infrared (FTIR) spectrometer from Thermo Scientific™, (Thermo Scientific, Waltham, MA, USA) while IR source (wolfram wire), KBr beamsplitter, and DTGS detector were used for measurement in the middle IR region (MIR 4000–400 cm⁻¹). The KBr pellet press technique (0.5–1 mg of sample homogenized with 200 mg KBr) was also used to collect MIR transmission spectra. The minimization of adsorbed water was achieved by heating the pellets overnight at 140 °C. For each sample, 128 scans with a resolution of 4 cm⁻¹ were recorded.

Each preparation was divided into four groups: curcumin group, carrier group, physical mixture of curcumin and carrier group, and curcumin preparation group. The surface morphology and microscopic structure characterization of each sample were observed by an S4700 scanning electron microscope (SEM, Hitachi, (China) Ltd., Beijing, China). Samples were prepared by fixed dry particles onto the copper plate base with conductive tape followed by injecting for test after spraying gold in an argon environment. The operating voltage was 20 kV. The images were magnified to different multiples for observation.
The molecular structure of all samples was monitored with a Nicolet 6700 Fourier transform infrared (FT-IR) spectrometer (Thermo Fisher Scientific (China) Co., Ltd., Shanghai). The grounded samples were mixed with KBr powder and pressed into discs. The spectral range was 400–4000 cm⁻¹ with 32 scans and a resolution of 1 cm⁻¹.
Moreover, an Ultima IV X-ray diffractometer (XRD, Rigaku Beijing Corporation, Beijing, China) was used to analyze the crystalline state of all samples. The samples were investigated in the 2θ range of 5°–40° with the Cu target. The tube pressure was 40 kV, the tube flow was 100 mA, the divergence slit was 1°, the scattering slit was 1°, the receiving slit was 0.3 mm, and the scanning amplitude was 0.02°.

Scanning electron microscopy (SEM) images were obtained on a Sirion200 microscope (FEI Company, Eindhoven, the Netherlands) at an accelerating voltage of 10.0 kV. The infrared spectra were obtained from a Nicolet 6700 Fourier transform infrared (FT-IR) spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). X-ray diffraction (XRD) pattern was collected on a Bruker axs D8 advanced diffractometer (Bruker Corporation, Frankfurt, Germany) using Cu Kα radiation. X-ray photoelectron spectroscopy (XPS) spectra were collected on a Shimadzu Axis-Ultra multifunctional X-ray photoelectron spectrometer (Shimadzu Corporation, Tokyo, Japan) using an Al K X-ray source. Metal concentrations were confirmed using a Perkin-Elmer Optima 2100 (Perkin-Elmer Company, Waltham, MA, USA) inductively coupled plasma-optical emission spectrometry (ICP-OES).

FTIR spectra were collected at 500 to 4000 cm⁻¹ on a Nicolet 6700 Fourier Transform Infrared (FTIR) Spectrometer (Thermo Fisher Sci, Sydney NSW, Australia). Morphology of the materials was imaged using a scanning electron microscope (FE-SEM, Quanta 450 FEG, FEI, USA) at an operating voltage of 10 kV and a transmission electron microscope at 120 kV (TEM, FEI Tecnai G2 Spirit, FEI, USA; Philips CM200, Japan at 200 kV). Chemical composition and chemical species were analyzed by X-ray Photoelectron Spectroscopy (XPS, AXIS Ultra DLD, Kratos, UK) equipped with a monochromatic Al Kα radiation source (hv = 1486.7 eV) at 225 W, 15 kV and 15 mA. XPS survey scans were performed at 0.5 eV step size over −10 to 1100 eV at 160 eV pass energy with peak fitting analysis executed using Casa XPSTM software. The core-level XPS spectra were calibrated at 284.8 eV. Raman spectrometer (LabRAM HR Evolution, Horiba Jvon Yvon Technology, Kyoto, Japan) with an excitation wavelength of 532 nm (mpc 3000 laser source) was applied from 500 to 3000 cm⁻¹ with an integration time of 10 s for three accumulations to determine the vibrational features of pristine graphene, and thermogravimetric analysis (TGA) of functionalized graphene was performed at a heating rate of 10 °C/min in nitrogen atmosphere from 25 to 1000 °C on a METTLER TOLEDO TGA/DSC 2 instrument.

Transmission infrared spectra of the films were documented at 25 °C in the range of 4000–400 cm⁻¹ using a Nicolet 6700 Fourier transform infrared (FT-IR) spectrometer (Thermo Electron Corporation, Waltham, MA, USA) following the method of Tongdeesoontorn et al. [10 (link)].