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X max 150

Manufactured by Oxford Instruments
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The X-Max 150 is an energy-dispersive X-ray (EDX) spectrometer designed for elemental analysis in scanning electron microscopes (SEMs). It features a 150 mm2 silicon drift detector (SDD) that provides high-resolution X-ray data collection and rapid data acquisition. The X-Max 150 is capable of detecting elements from beryllium (Be) to uranium (U) in a wide range of sample types.

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Lab products found in correlation

Merlin sem, by Zeiss (1 mentions) Invia raman microscope, by Renishaw (1 mentions) Jsm 7800f prime, by JEOL (1 mentions) Gaia3, by TESCAN (1 mentions) Aztec 4, by Oxford Instruments (1 mentions) Aztec software, by Oxford Instruments (1 mentions) Merlin, by Zeiss (1 mentions) Microraman spectrometer, by Horiba (1 mentions) Mira3, by TESCAN (1 mentions) Smartlab se, by Rigaku (1 mentions)

6 protocols using x max 150

1

Comprehensive Characterization of Ball-Milled Reactive Powder

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The ball-milled
RP was characterized using a Rigaku Smartlab 9 kW diffractometer with
a Cu source to acquire the XRD patterns. The particle size of the
RP was checked with a Malvern Mastersizer 2000 DLS analyzer. The sample
is first dispersed in water using a probe sonicator to destroy aggregates.
The dispersion is then added to the tank of the DLS analyzer, where
a He/Ne laser (633 nm) and a diode laser (466 nm) are both used to
determine the particle-size distribution. Zeiss Merlin SEM was also
used to analyze the particle size. A built-in Oxford Instruments X-Max
150 energy-dispersive X-ray (EDX) was used to analyze the element
distribution in the sample. For the cross-sectional analysis, samples
were cut using a precision etching and coating system II (PECS) Gatan,
using an argon ion beam. JEOL 3000F field emission gun TEM was used
to check the composites. A Renishaw InVia Raman microscope was used
to acquire the Raman spectra, using a 785 nm diode laser.
Capone I., Hurlbutt K., Naylor A.J., Xiao A.W, & Pasta M. (2019). Effect of the Particle-Size Distribution on the Electrochemical Performance of a Red Phosphorus–Carbon Composite Anode for Sodium-Ion Batteries. Energy & Fuels, 33(5), 4651-4658.
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2

Characterization of Plasma-Treated Zirconia Surfaces

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The microstructures of the zirconia surfaces after the plasma treatments were characterized by SEM (JSM-7800F Prime, JEOL, Tokyo, Japan) at 2000×, 10,000×, and 40,000× magnifications. In combination with SEM, EDS spectra were obtained by using an EDS detector (X-max 150, Oxford Instruments NanoAnalysis, High Wycombe, UK) to determine the local chemical composition. To examine the subsurface structures, dual-beam cross-section analysis was performed with FIB/SEM imaging. The milling was carried out at a current of 300 pA using gallium ions accelerated at 30 kV.
Kang S.U., Kim C.H., You S., Lee D.Y., Kim Y.K., Kim S.J., Kim C.K, & Kim H.K. (2023). Plasma Surface Modification of 3Y-TZP at Low and Atmospheric Pressures with Different Treatment Times. International Journal of Molecular Sciences, 24(8), 7663.
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3

Shear Strength Analysis of Cu-Cu Bonds

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Shear strength testing is a common method used to determine the strength of a bond. In this study, the PTR-1100 shear tester from RHESCA Co., Ltd. (Tokyo, Japan) was used to measure the shear strength of the Cu-Cu bonds. This shear tester had a maximum load of 50 kgf and was operated at a speed of 20 µm/s. To hold the dies in place during testing, a special clamping tool with 500-µm-high holders was used. The shear strength was calculated as the maximum force required to break the bond divided by the bond area.
Fracture surface analysis is an important step in characterizing die-to-die bonding since it provides valuable information about the bonding quality; shear strength results often have high deviations.
The SEM images and EDX analysis of the fracture surface types were performed using GAIA3 (TESCAN) equipment. The detector X-Max 150 and the analysis software Aztec 4.2 (Oxford Instruments) were used for EDX analysis.
Lykova M., Panchenko I., Schneider-Ramelow M., Suga T., Mu F, & Buschbeck R. (2023). Cu-Cu Thermocompression Bonding with a Self-Assembled Monolayer as Oxidation Protection for 3D/2.5D System Integration. Micromachines, 14(7), 1365.
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4

Scanning Electron Microscopy and EDS Analysis

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The samples were observed with a Zeiss scanning electron microscope Merlin equipped with an energy dispersive spectrometer (EDS) by Oxford Instruments with a silicon drifted detector X-Max 150. EDS measurements were carried out with charge compensator (injected medium was nitrogen), accelerating voltage 5 kV, beam current 1 nA, working distance – 8.5 mm. The EDS maps were analyzed with AZTEC software by Oxford Instruments. Samples were mounted on conductive carbon tape. The samples were not coated.
Vera L., Matej B., Karolina V., Tereza K., Zbyněk T., Miroslav D., Veronika B., Andrej L., Vera S., Barbora V., Andrea S., Petr S., Milena K., Evzen A., Eva F., Franco R, & Michala R. (2018). Osteoinductive 3D scaffolds prepared by blend centrifugal spinning for long-term delivery of osteogenic supplements. RSC Advances, 8(39), 21889-21904.
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5

Characterization of Li-LLZTO-Li Cells

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Pristine and cycled Li–LLZTO–Li
cells were cross-sectioned using an ultrasonic cutter (Sonotec) with
a tungsten carbide blade inside the glovebox. The cross-sectioned
cells were mounted on a custom-made holder with Cu adhesive tape and
transferred from the glovebox into a Zeiss Merlin scanning electron
microscope using an air-sensitive transfer device (Gatan). The cross-sectioned
cells were inspected at an acceleration voltage of 3 kV and probe
current of 100 μA. EDS was performed within the Zeiss Merlin
SEM using a built-in Oxford Instruments X-Max 150 silicon drift detector.
Secondary electron images were acquired and EDS elemental mapping
was performed at an acceleration voltage of up to 3 kV. The collected
data were analyzed using the AZtec software package.
Marbella L.E., Zekoll S., Kasemchainan J., Emge S.P., Bruce P.G, & Grey C.P. (2019). 7Li NMR Chemical Shift Imaging To Detect Microstructural Growth of Lithium in All-Solid-State Batteries. Chemistry of Materials, 31(8), 2762-2769.
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6

Comprehensive Characterization of Thin Films

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Film thicknesses were measured using a stylus prolometer (DektakXT). Surface and cross-section morphologies were studied by SEM (Tescan Mira 3) at 5 kV. Elemental analysis was performed using an attached EDS detector (Oxford Instruments X-max 150) with an electron acceleration voltage of 7 kV for qualitative line scans and 20 kV for quantitative acquisitions. The crystallinity of lms was studied with XRD (Rigaku SmartLab SE) using a Cu K a radiation source (l ¼ 0.15406 nm) operating at 2 kW equipped with Ni CuK b lter-sample; height alignment was performed before each acquisition. Raman spectroscopy was employed to further probe the structure using a Horiba microRaman spectrometer equipped with a 632.8 nm HeNe ion laser as the excitation source calibrated with a Si control reference. Elemental depth proling was performed using SIMS equipped with a Hidden Analytical gas ion gun and quadrupole detector operating an Ar + beam at 4 keV, raster area of $500 mm  500 mm and a grating of 10%.
Naylor M.C., Tiwari D., Sheppard A., Laverock J., Campbell S., Ford B., Xu X., Jones M.D.K., Qu Y., Maiello P., Barrioz V., Beattie N.S., Fox N.A., Fermin D.J, & Zoppi G. (2022). Ex situ Ge-doping of CZTS nanocrystals and CZTSSe solar absorber films. Faraday discussions, 239(0).
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