Fe sem supra 35 vp

The concentration of AgNPs was examined using the ICPOES (710 ICPOES No. my13270004, purchased from Agilent, Santa Clara, CA, USA) operated at a power of 1200 W with Argon flow rate of 15 L·min⁻¹. UV-vis spectra were monitored using the UV-Vis spectrometer (101N4110104, purchased from PerkinElmer, Waltham, MA, USA) operated at a resolution of 1 nm, a scan speed of 960 nm·min⁻¹ and an electromagnetic wavelength in the range of 300 to 700 nm. FTIR spectra were investigated using the FTIR spectrometer (Frontier-GPOB model 96046, purchased from PerkinElmer, Waltham, MA, USA) at a spectrum wavelength in the range of 400 to 4000 cm⁻¹ at a resolution of 4 cm⁻¹ and accumulations of 10 scans at room temperature. In the preparation, a pellet form was prepared by mixing AgNPs with potassium bromide (1:100). FESEM and EDX were examined by means of the field emission scanning electron microscopy (FESEM Supra 35VP, purchased from ZEISS, Oberkochen, Baden-Württemberg, Germany) and SEM-EDX (S-3400N, purchased from HITACHI, Chiyoda, Tokyo, Japan), respectively. The nanoparticles size was obtained by randomly measuring the selected samples from the FESEM data following the procedure established elsewhere [7 (link),48 (link)].

The morphology of the film samples was studied by SEM (FE-SEM SUPRA 35 VP, Carl Zeiss, Germany) with an accelerating voltage of 5 kV along with a variable working distance and comparable magnification. Films were cut into pieces (0.5 cm × 0.5 cm), mounted in a holder, and sputtered with gold to ensure conductivity and prevent charging effects. The images were acquired using a secondary electron detector.

The
microscopic morphology of all bead samples was analyzed using a Carl
Zeiss FE-SEM SUPRA 35 VP scanning electron microscope. The scanning
electron microscopy (SEM) images were recorded with an acceleration
voltage of 1 kV. The samples were mounted on aluminum sample holders,
and no sputtering was performed on the samples’ surfaces.