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D max br diffractometer

Manufactured by Rigaku
Sourced in Japan

The D/Max-BR diffractometer is a laboratory instrument designed for powder X-ray diffraction analysis. It is capable of collecting high-quality diffraction data from various types of solid samples. The core function of the D/Max-BR is to determine the crystallographic structure and composition of materials through the analysis of the diffraction patterns produced when a sample is exposed to X-rays.

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12 protocols using d max br diffractometer

1

Characterizing Material Composition via XRD, DSC, and FTIR

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X-ray diffraction (XRD) patterns were collected on a D/Max-BR diffractometer (Rigaku, Tokyo, Japan) over the 2θ range 5 to 60°. The instrument was supplied with Cu Kα radiation at 40 mV and 30 mA. Differential scanning calorimetry (DSC) was carried out using an MDSC 2910 differential scanning calorimeter (TA Instruments Co., New Castle, DE, USA). Sealed samples were heated at 10 °C·min−1 from 21 to 250 °C. The nitrogen gas flow rate was kept at 40 mL·min−1. Fourier transform infrared (FTIR) spectroscopy was carried out on a Nicolet-Nexus 670 FTIR spectrometer (Nicolet Instrument Corporation, Madison, WI, USA) at a range of 500 to 4000 cm–1 and a resolution of 2 cm−1.
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2

Thermal and Structural Analysis of Materials

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Differential scanning calorimetry (DSC) analyses were carried out using an MDSC 2910 differential scanning calorimeter (TA Instruments Co., New Castle, DE, USA). Sealed samples were heated at 10°C min−1 from ambient temperature (23°C) to 350°C under a nitrogen gas flow of 40 ml min−1. X-ray diffraction (XRD) was performed on a D/Max-BR diffractometer (RigaKu, Tokyo, Japan) over the 2θ range of 5–60° using Cu Kα radiation at 40 mV and 30 mA. Attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectra were recorded on a Nicolet-Nexus 670 FTIR spectrometer (Nicolet Instrument Corporation, Madison, WI, USA) over the range 500–4000 cm−1 and at a resolution of 2 cm−1. Approximately 5 mg of the materials were placed directly on the diamond window for spectra acquisition.
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3

Structural Characterization of Filaments

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Structural characterization of filaments produced was conducted using a D/Max-BR diffractometer (RigaKu, Tokyo, Japan) with Cu Kα radiation operating at 40 kV and 15 mA (Cu Kalpha radiation) over the 2θ range 10−50° with a step size of 0.02° at 2°/min.
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4

Characterization of Nanofiber Mats via Microscopy and X-ray Diffraction

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The morphology of the nanofiber mats was assessed using an S-4800 field emission scanning electron microscope (FESEM; Hitachi, Tokyo, Japan). Prior to examination, samples were platinum sputter-coated. The average nanofiber diameter was determined from at least 100 measurements in FESEM images, using the Image J software (National Institutes of Health, MD, USA). To observe the cross sections of the fibers, mats were placed into liquid nitrogen and manually broken prior to sputtering.
Transmission electron microscope (TEM) images of the samples were recorded on a JEM 2100 F field emission TEM (JEOL, Tokyo, Japan). Fiber samples were collected by fixing a lacey carbon-coated copper grid to the collector. X-ray diffraction (XRD) was conducted using a D/Max-BR diffractometer (Rigaku, Tokyo, Japan) over the 2θ range 5° to 60°. The instrument supplies Cu Kα radiation generated at 40 mV and 30 mA. The raw quercetin particles were also studied under cross-polarized light using an XP-700 polarized optical microscope (Shanghai Changfang Optical Instrument Co. Ltd, Shanghai, China).
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5

Structural and Vibrational Analysis

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XRD patterns were obtained over the 2θ range of 5° to 60° on a D/Max-BR diffractometer (RigaKu, Tokyo, Japan) with Cu Kα radiation at 40 mV and 30 mA. FTIR analysis was conducted on a Nicolet-Nexus 670 FTIR spectrometer (Nicolet Instrument Corporation, Madison, WI, USA) from 500 to 4000 cm−1 at a resolution of 2 cm−1.
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6

X-Ray Diffraction Analysis of Fibrous Patch

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D/Max-BR diffractometer (RigaKu, Tokyo, Japan) with Cu Kα radiation was used to analyze structure and crystalline forms of the fibrous patch contents. Analyses were performed at 40 mV and 30 mA over 2θ range of 5-60° at a rate of 2°/min. OriginPro 7.0 software (OriginLab Corporation, MA, USA) was used to convert the obtained data to diffractrograms and for their evaluation.
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7

Structural and Thermal Characterization of Materials

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X-ray diffraction (XRD) analysis was performed on a D/Max-BR diffractometer (Rigaku, Tokyo, Japan) with Cu Kα radiation in the 2θ range of 5°–60° at 40 mV and 300 mA. Differential scanning calorimetry (DSC) was performed using an MDSC 2910 differential scanning calorimeter (TA Instruments, New Castle, DE, USA). Sealed samples were heated at a rate of 10°C · minute−1 from ambient temperature (21°C) to 300°C. The nitrogen gas flow rate was set to 40 mL · minute−1. Attenuated total reflectance–Fourier-transform infrared (ATR–FTIR) analysis was performed on a Nicolet-Nexus 670 FTIR spectrometer (Nicolet Instrument, Madison, WI, USA) over the range of 500–4,000 cm−1 and a resolution of 2 cm−1.
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8

PXRD Characterization of Drug Powders

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Powder X‐ray diffraction (PXRD) studies of drug powders were conducted on a D/Max‐BR diffractometer (RigaKu, Tokyo Japan) with Cu‐Kα radiation operating at 40 mV and 30 mA over the suitable 2θ range for each API, a step size of 0.02° at 2°/min. Diffractograms produced were analysed using OriginPro 9.0.0.
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9

Characterizing Electrospun Fiber Hydrophobicity

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Fourier transform infrared (FT-IR) spectra were obtained on a Nicolet-Nexus 670 FT-IR spectrometer (Nicolet Instrument Corporation) over the range 500-4000 cm -1 and with a resolution of 2 cm -1 . X-Ray diffraction (XRD) patterns were collected over 5-60°on a D/Max-BR diffractometer (Rigaku) supplied with Cu Kα radiation (40 kV/30 mA, λ = 1.5418 Å).
Water contact angles were used to quantify the hydrophilic-hydrophobic properties of the fibers. 15 circular cover slips (diameter ca. 14 mm) were placed on the aluminum foil covered collector plate, and fibers electrospun onto them for approximately 7 h. After drying in a vacuum drying oven, the fiber coated cover slips were used to determine contact angles using a 322W instrument (Thermo Cahn). A water droplet (ca. 2 µL) was placed onto the surface of the fibers at room temperature, and digital images recorded. At least three samples of each formulation were assessed, and three measurements made for each sample. Contact angles were quantified immediately after the water droplet had come into contact with the fibers.
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10

Morphological and Structural Analysis of Coaxial Fibers

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After plating the coating with an ion sputter, the fibers morphological features were analyzed by scanning electron microscopy (SEM; JSM-5600 LV microscope, JEOL, Tokyo, Japan). The mean fiber diameter for each sample was calculated by measuring approximately 50 fibers in SEM images using the Image J software (National Institutes of Health, Bethesda, MD, USA). In addition, the coaxial fibers were also observed by a transmission electron microscope (TEM, H-800 instrument, Hitachi, Tokyo, Japan).
Fourier transform infrared spectroscopy (FT-IR) was conducted using a Nicolet-Nexus 670 spectrometer (Nicolet Instrument Corporation) over the range 4000-500 cm -1 and with a resolution of 2 cm -1 . X-ray diffraction (XRD) was undertaken on a D/max-BR diffractometer (Rigaku, Japan) with CuKα radiation (40 kV/20 mA) over the 2θ range 5º to 60º.
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