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Nexion 300q

Manufactured by PerkinElmer
Sourced in United States

The NexION 300Q is an inductively coupled plasma mass spectrometry (ICP-MS) system manufactured by PerkinElmer. It is designed to provide precise and accurate elemental analysis of a wide range of samples. The core function of the NexION 300Q is to detect and quantify trace elements in complex matrices.

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9 protocols using nexion 300q

1

Microscopic Characterization of Pd Catalysts

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Transmission electron microscopy (TEM)
images were taken using a Hitachi H-7500 transmission electron microscope
operated at 75 kV. Scanning electron microscopy (SEM) images were
captured with a Zeiss Ultra-60 Field Emission SEM. The concentrations
of Pd catalysts were determined using an inductively coupled plasma
mass spectrometer (ICP-MS, NexION 300Q, PerkinElmer).
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2

Dual Drug-Loaded Polymer Micelles

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DACHPt was first converted into DACHPt aqueous complex using previously reported procedure [18 ]. The aqueous dispersion of SN38/m micelles (1 mg/mL) was mixed with obtained aqueous solution of DACHPt at pH 8.0 at different molar ratio of DACHPt to the Glu units of micelles (0.25 or 0.15) followed by incubation at r.t. for 24h. Unbound DACHPt was removed by ultrafiltration using Centricon Plus-20 centrifugal filter units (MWCO 30kDa, Millipore, Billerica, MA, USA). Pt content in dual drug-loaded micelles (further denoted as (SN38 +DACHPt)/m) was measured by Pt (Pt194 / Pt195) assay using inductively coupled plasma mass spectrometry (ICP-MS, NexION 300Q, PerkinElmer, Waltham, MA, USA) calibrated with Pt (0.8 to 500 ng/mL). Effective hydrodynamic diameters (Deff), polydispersity indices (PDI) and ζ-potential of the micelles were determined by dynamic light scattering (DLS) using a Zetasizer Nano ZS (Malvern Instruments Ltd., Malvern, UK).
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3

Multimodal Characterization of Catalysts

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Transmission electron
microscopy
(TEM) images were acquired on an HT7700 microscope (Hitachi, Japan)
operated at 120 kV. Inductively coupled plasma–mass spectrometry
(ICP–MS, PerkinElmer, NexION 300Q) was used to quantify the
metal contents in the catalysts. A PANalytical X’Pert PRO Alpha-1
diffractometer was employed to obtain X-ray diffraction (XRD) patterns
using a 1.8 kW ceramic copper tube source. A KAlpha spectrometer (Thermo
Scientific) was used for X-ray photoelectron spectroscopy (XPS) measurements
with Al Kα X-ray (1486.6 eV) as the source.
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4

Soil Physicochemical Characterization

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Soil physicochemical parameters, including temperature, moisture, and electrical conductivity were measured on site with a handheld Thermometer (DT-847U; OneTemp Pty Ltd, Adelaide, SA, Australia) and a HydroSense II Soil Moisture Measurement System (Campbell Scientific Pty Ltd, Garbutt, QND, Australia). Soil pH was determined in deionized water by a pH/EC meter (900-P; TPS Pty Ltd, Brisbane, QND, Australia). Element composition of the soils was analyzed by inductively coupled plasma mass spectrometry (ICP-MS) (Nexion 300Q; Perkin Elmer, Waltham, MA, USA) at LabWest Mineral Analysis Pty Ltd. in Perth, Australia. Detection limits for all elements were at the ng g−1 level. Gold concentrations in soil samples were determined by the aqua regia method23 (link). Briefly, soil samples were ground to 200 μm, mixed with 100% aqua regia (HCl:HNO3 = 3:1), and digested at room temperature for 24 h. The supernatant obtained by centrifugation was analyzed by ICP-MS. Total carbon and nitrogen were analyzed by CSBP Lab (CSBP Fertilizers, Kwinana, WA, Australia) using the Dumas high temperature combustion method50 (link).
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5

Quantifying Manganese in Brain Regions

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Known weights of thawed brain regions (cortex, thalamus, olfactory bulb), collected from the animals were decomposed by wet-ashing in vials with six volumes of concentrated nitric acid followed by microwave (MARS, CEM Corp., Matthews, NC) heating at 200 °C. Total manganese concentrations were determined by ICP-MS (NexION 300Q, PerkinElmer, MA, USA).
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6

Nanomaterial Characterization via Electron Microscopy

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TEM images were taken using a Hitachi HT7700 microscope operated at 120 kV by drop casting the nanoparticle dispersions on carbon-coated Cu grids and drying under ambient conditions. High-angle annular dark-field imaging were performed on an aberration-corrected FEI TitanS 80–300 TEM/STEM operated at 300 kV, with a probe convergence angle of 30 mrad and a large inner collection angle of 65 mrad, and a JEOL JEM 2200FS STEM/TEM microscope equipped with a CEOS probe corrector (Heidelberg, Germany) to provide a nominal image resolution of 0.07 nm. The heating experiments were carried out on the FEI microscope using a Protochips Aduro heating stage. To minimize beam irradiation to the sample, a low beam current of 30 pA was used for imaging during heating. The energy-dispersive X-ray spectroscopy analyses were performed in STEM mode using an aberration-corrected JEOL 2200FS electron microscope equipped with a Bruker-AXS silicon drift detector (SDD) detector. The metal contents were measured using ICP-MS (NexION 300Q, PerkinElmer).
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7

Fabrication of S-CoO and P-CoO Nanorods

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S-CoO NRs were fabricated directly on CFP using the cation exchange methodology in the gas phase43 (link). In this work, CoO NRs were fabricated on both sides of CFP, and the loading of the as-synthesized S-CoO NRs was ~ 0.48 mg cm−2. The synthetic procedure of S-CoO NRs on a carbon nanotube film and stainless-steel mesh (Supplementary Fig. 10) is the same as on CFP. P-CoO NRs were grown on CFP using a hydrothermal method as detailed elsewhere62 (link). The loading of P-CoO NRs on CFP was ~ 0.46 mg cm−2. A commercial 20 wt% Pt/C catalyst (purchased from the Fuel Cell Store), was dispersed in ethanol for at least 30 min with sonication to obtain a homogeneous ink, and ~0.4 mg of Pt/C was loaded per 1 cm2 of CFP. The loading of S-CoO NRs, P-CoO NRs, and Pt/C was determined using inductively coupled plasma mass spectrometry (ICP-MS, Perkin-Elmer, NexION 300Q).
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8

Comprehensive Nanostructural Characterization by TEM

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Transmission electron microscopy (TEM)
analysis was conducted using a Hitachi HT7700 (Tokyo, Japan) operated
at 120 kV. High-resolution high-angle annular dark-field scanning
transmission electron microscopy (HAADF-STEM) and tomography images
were taken on a JEOL JEM 2200FS STEM/TEM microscope equipped with
a CEOS probe corrector (Heidelberg, Germany) to provide a nominal
image resolution of 0.07 nm. Energy dispersive X-ray (EDX) analysis
was performed in STEM mode using an aberration-corrected JEOL 2200FS
electron microscope equipped with a Bruker-AXS SDD detector. The metal
contents were determined using an inductively coupled plasma mass
spectrometer (ICP-MS, NexION 300Q, PerkinElmer). UV–vis-NIR
extinction spectra were recorded on a Lambda 750 spectrometer (PerkinElmer).
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9

Nanomaterial Morphological Characterization

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SEM and TEM characterizations were carried out using a Hitachi S-4800 SEM and a JEOL 2100 TEM, respectively. HAADF-STEM imaging was performed on a JEOL ARM200F microscope with a STEM aberration corrector operated at 200 kV. The BET surface area was determined from nitrogen adsorption data measured at 77 K on an ASAP 2020 physisorption analyzer (Micromeritics Inc., USA). The loading masses of ZnxCo1−xO and P-CoO NRs on CFP substrates were measured using inductively coupled plasma mass spectrometry (NexION 300Q, PerkinElmer).
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