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Em 30ax plus

Manufactured by Coxem
Sourced in United States

The EM-30AX PLUS is a Scanning Electron Microscope (SEM) manufactured by Coxem. It is designed to provide high-quality imaging and analysis of samples at the nanoscale level. The core function of the EM-30AX PLUS is to generate and focus a beam of electrons that interacts with the sample, producing various signals that can be detected and used to create detailed images of the sample's surface and composition.

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7 protocols using em 30ax plus

1

Optical and Photoluminescence Characterization

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Optical and photoluminescence (PL) imaging was taken on a Jiangnan MV3000 digital microscope and a Nib400 fluorescence microscope (Jiangnan Novel Optics Co., Ltd.), respectively. Scanning electron microscopy (SEM) was conducted on a desktop scanning electron microscope (COXEM EM-30 AX Plus). PL and Raman spectra were acquired on a home-built Raman system, consisting of an inverted microscope (Ti eclipse, Nikon), a Raman spectrometer (iHR320, Horiba) with a CCD camera (Syncerity, Horiba) and a semiconductor laser at 532 nm.
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2

Scanning Electron Microscopy Analysis of Dentin Microstructure

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The hemiroots per irrigation group were randomly selected and fixed in holders with carbon adhesive for gold sputtering under vacuum (SPT-20, COXEM BRAND (South Korea, TARGET: Au)). Two-thirds of the cervical and apical roots were selected from each hemiroot. Once the samples were stabilized, they were introduced in the scanning electron microscopy (SEM) equipment (EM-30AX PLUS, COXEM, South Korea) to be observed at 1000×, 2000×, and 5000× magnification.
A qualitative analysis identified the presence of pulp components, dome-shaped calcospherites, areas of visible collagen, shapes of the dentinal tubules, and surface characteristics such as ripples or flattened surfaces [20 (link)].
For a quantitative analysis, the images were analyzed at 2000x on an image of size 1,280 µm × 960 µm, using the ImageJ software. The count recorded the number of tubules per field for every third in each hemiroot. Later, two 20 × 20 µm areas were randomly selected from each sample in order to calculate the area of each tubule, with the formula π∗a∗b in µm, where a is the height and b is the width of the tubule [21 (link)].
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3

Surface Profiling of Disc Material

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Surface profiles of the discs of the material were analyzed by a non-contact surface profiler (Contour Elite K; Bruker, Billerica, MA, USA) and an SEM (EM-30AX plus; COXEM, Deajeon, Korea). The test was repeated at each group before and after soaking in water (n = 8).
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4

SEM Analysis of CEACB Microstructure

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The microstructural morphology of each CEACB was examined by the scanning electron microscopy (SEM) apparatus (EM30-AX Plus, COXEM, Daejeon, Korea) at curing time of 1 day and 7 days. Each CEACB was broken into small pieces with a hammer, and small pieces at least 5 mm from the surface were soaked in anhydrous ethanol to terminate hydration. The specimens were then placed in vacuum oven until dry at a temperature of 25 °C. Three kinds of CEACB samples with a dimension of 25 mm × 35 mm were plated with a thin protective palladium layer utilizing low vacuum sputtering before the SEM observation. Electrons were emitted on the surface of sample with magnifications of 500, 2000, 5000 and 10,000 at a voltage of 20 kV. Three replicates were performed at each experimental condition and a representative result was chosen for detailed description.
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5

Characterization of Semiconductor Nanostructures

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The crystal phases of CdS, CuS, and CdS/CuS were measured by powder X-ray diffraction (PXRD, D8-Focus, Bruker AXS) with Ni-filtered and Cu Kα radiation (λ = 1.5406 Å). The morphologies of the as-prepared samples were characterized by field emission scanning electron microscopy (FESEM, SU8010, HITACHI). A scanning electron microscope (SEM, Coxem EM-30AX PLUS+) equipped with an energy dispersive spectrometer (EDS, Bruker Nano Xflash610-H) was used to analyze the chemical composition at the sample surface. The optical absorption and room temperature photoluminescence spectra (PL) of the samples were obtained on an ultraviolet-visible spectrophotometer (UV-Vis, UV-2600, Shimadzu) and a fluorescence spectrophotometer (F-4500, HITACHI) equipped with a Xe lamp (excitation wavelength is 338 nm).
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6

Scanning Electron Microscopy of Asphalt Fillers

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The scanning electron microscopy (SEM) apparatus (COXEM EM30-AX Plus, Daejeon, Korea) was employed to observe the micromorphology of the mineral fillers and the interfacial morphology of the asphalt filler. SEM samples with a dimension of 25 mm × 35 mm were coated with a thin layer of palladium using low vacuum sputtering. Three surface locations of each sample were scanned at 20 kV with various magnifications of 2000×, 2500×, 3000×, and 5000×. Three replicates were scanned in each test and a representative sample was selected for the analysis.
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7

Characterization of Functionalized MnGC

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Raman spectra were registered on a Jasco NRS-2000C spectrometer equipped with a microscope with 100× magnification. The spectra were recorded under backscattering conditions with 4 cm−1 spectral resolution using the 532 nm line (DPSS laser driver, LGBlase LLC, Fremont, CA, USA) with a power of about 20 mW. The detector was a liquid nitrogen cooled CCD (Spec-10: 100B, Roper Scientific, Inc., Tucson, AZ, USA). Each spectrum was the average of 16 measurements.
IR spectra were recorded with a Bruker ALPHA series FT-IR spectrometer (Bruker, Ettlingen, Germany) equipped with an attenuated total reflectance (diamond crystal) apparatus and a Deuterated Lanthanum α-Alanine doped TriGlycine Sulfate (DLaTGS) detector. The spectra were averaged over 100 scans at a resolution of 4 cm−1.
The morphology of both MnGC and BMP-MnGC has been investigated by a Scanning Electron Microscopy (SEM). The machine employed is a COXEM EM 30AX plus equipped with a Tungsten Filament (W), a SE Detector, and BSE Detector (Solid type 4 Channel).
The success of the functionalization process has been tested through an elemental analysis with SEM-EDX, i.e., the aforementioned SEM equipped with an energy dispersive X-ray detector (EDX, model EDAX Element-C2B).
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