Em 30ax plus
The EM-30AX PLUS is a Scanning Electron Microscope (SEM) manufactured by Coxem. It is designed to provide high-quality imaging and analysis of samples at the nanoscale level. The core function of the EM-30AX PLUS is to generate and focus a beam of electrons that interacts with the sample, producing various signals that can be detected and used to create detailed images of the sample's surface and composition.
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7 protocols using em 30ax plus
Optical and Photoluminescence Characterization
Scanning Electron Microscopy Analysis of Dentin Microstructure
A qualitative analysis identified the presence of pulp components, dome-shaped calcospherites, areas of visible collagen, shapes of the dentinal tubules, and surface characteristics such as ripples or flattened surfaces [20 (link)].
For a quantitative analysis, the images were analyzed at 2000x on an image of size 1,280 µm × 960 µm, using the ImageJ software. The count recorded the number of tubules per field for every third in each hemiroot. Later, two 20 × 20 µm areas were randomly selected from each sample in order to calculate the area of each tubule, with the formula π∗a∗b in µm, where a is the height and b is the width of the tubule [21 (link)].
Surface Profiling of Disc Material
SEM Analysis of CEACB Microstructure
Characterization of Semiconductor Nanostructures
Scanning Electron Microscopy of Asphalt Fillers
Characterization of Functionalized MnGC
IR spectra were recorded with a Bruker ALPHA series FT-IR spectrometer (Bruker, Ettlingen, Germany) equipped with an attenuated total reflectance (diamond crystal) apparatus and a Deuterated Lanthanum α-Alanine doped TriGlycine Sulfate (DLaTGS) detector. The spectra were averaged over 100 scans at a resolution of 4 cm−1.
The morphology of both MnGC and BMP-MnGC has been investigated by a Scanning Electron Microscopy (SEM). The machine employed is a COXEM EM 30AX plus equipped with a Tungsten Filament (W), a SE Detector, and BSE Detector (Solid type 4 Channel).
The success of the functionalization process has been tested through an elemental analysis with SEM-EDX, i.e., the aforementioned SEM equipped with an energy dispersive X-ray detector (EDX, model EDAX Element-C2B).
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