Tecnai g2 f20
The Tecnai G2 F20 is a high-performance transmission electron microscope (TEM) designed for advanced materials research and life science applications. It features a field emission gun (FEG) electron source, providing high-brightness and high-resolution imaging capabilities. The Tecnai G2 F20 can operate in both TEM and scanning TEM (STEM) modes, allowing for a wide range of imaging and analytical techniques.
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5 protocols using tecnai g2 f20
Advanced Materials Characterization
Characterization and Aptamer Encapsulation of Nanoparticles
Single Atom Catalysts Characterization
The XAFS spectra were measured at 1W1B station in Beijing Synchrotron Radiation Facility. XAFS measurements at the Au L3-edge, Co K-edge, and Cu K-edge were conducted in fluorescence mode using a Lytle detector. The energy was calibrated using corresponding metal foil as references. The acquired EXAFS data were processed according to the standard procedures using the Athena program.
Characterization of Ti3C2 MXenes and Rapa@Ti3C2
Comprehensive Characterization of N-Doped Carbon Dots
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