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5 protocols using tecnai g2 f20

1

Advanced Materials Characterization

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The materials were characterized using a scanning electron microscope (SEM, Quanta 200F), transmission electron microscopy (TEM, FEI Tecnai G2 F20), and X-ray diffraction (XRD, Bruker D8 Advance with Cu Kα radiation) operated at 40 kV and 40 mA; Raman spectra (Renishaw RM-1000) were recorded using a plus laser Raman spectrometer with an excitation laser beam wavelength of 514.5 nm; FTIR analysis was carried out using pressed KBr disks in the range of 4,000–400 cm−1 using a PerkinElmer spectrometer.
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2

Characterization and Aptamer Encapsulation of Nanoparticles

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Mean size and zeta potential of the obtain product was determined by dynamic light scattering (DLS, Malvern panalytical, Nano-S90, Malvern, UK) to study the size distribution of nanoparticles. The morphology of nanoparticles were characterized by scanning electron microscope (SEM, FEI, Verios G4 UC, Hillsborough, Oregon, USA), transmission electron microscopic (TEM, Tecnai G2F20) and atomic force microscopy (AFM, Bruker, Nano Surface Division, Madison, Wisconsin, USA) in order to investigate physical characteristics of the synthesized nanoparticles. Sample preparation methods were similar to the previous reports. To testify whether Apt was successfully attached to UE NPs, a 12% polyacrylamide gel electrophoresis (PAGE) was employed accompanied by SYBR green as a fluorescent indicator, and the image was captured via bio-Rad Imager System (Bio-rad, GelDoc XR+, Berkeley, California, USA). The Apt encapsulation efficiency was evaluated by measuring the amount of unloaded free Apt in the supernatant of the solution as in Eq. (1): where WT is the total weight of Apt and WF is the weight of free Apt.
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Single Atom Catalysts Characterization

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The as-prepared samples were characterized by TEM (HITACHI H-7700), high-resolution TEM (HRTEM, FEI Tecnai G2 F20), XRD (Bruker D8-advance), and XPS (PHI Quantera SXM), respectively. The BEs were corrected by the C1s peak at 284.8 eV. All the single atom catalysts were performed on HAADF-STEM (Titan 80–300). Metal loading was measured by ICP-OES (IRIS Intrepid II XSP, ThermoFisher). UV-vis diffuse reflectance spectra were obtained using a UV-vis spectrophotometer (UV-3600, Shimadzu). The PL spectra were carried out on a Varian Cary Eclipse Fluorescence spectrophotometer in a range of 420–850 nm. The CO and HCOOH produced from the 13CO2 labeling experiments were analyzed by GC-mass spectrometer (GC/MS-QP2010, Shimadzu) and 1H NMR, respectively.
The XAFS spectra were measured at 1W1B station in Beijing Synchrotron Radiation Facility. XAFS measurements at the Au L3-edge, Co K-edge, and Cu K-edge were conducted in fluorescence mode using a Lytle detector. The energy was calibrated using corresponding metal foil as references. The acquired EXAFS data were processed according to the standard procedures using the Athena program.
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Characterization of Ti3C2 MXenes and Rapa@Ti3C2

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Ti3C2 MXenes and Rapa@Ti3C2 were characterized by Scanning Electron Microscopy (SEM, Sigma300), Transmission Electron Microscope (TEM, FEI Tecnai G2 F20) and Atomic Force Microscope (AFM, Bruker Dimension Icon). The formation of Ti3C2 was also confirmed by X-ray diffraction (XRD, Panalytical X'Pert'3 Powder). Size and zeta potential were acquired by Malvern Zetasizer Nano ZS90 (Britain). UV–vis absorption spectra were captured by a SHIMADZU UV3600 spectrometer.
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5

Comprehensive Characterization of N-Doped Carbon Dots

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The UV-vis absorption spectra were measured using a Shimadzu UV3600 UV-vis absorption spectrophotometer and the corresponding optical band gaps (Eg) of CDs were estimated through the Tauc plot [the curve of (αhν)2versus hν converted from the UV-vis spectrum].66 The photoluminescence spectra were characterized using a fluorescence spectrophotometer (LUMINA, Thermo Scientific). The morphology of the N-CDs was observed by transmission electron microscope (TEM, FEI Tecnai G2 F20) and atomic force microscope (AFM, Bruker Dimension Icon), and the particle size was calculated using the Nano Measurer software. The XRD spectra were measured by Rigaku SmartLab SE (2θ = 10°–90°). The structure and composition of the N-CDs were examined by X-ray photoelectron spectrometer (XPS, Thermo Scientific ESCALAB 250Xi) and Fourier transform infrared spectrophotometer (FT-IR). The zeta potentials of the N-CDs were determined by nanoparticle size analyzer (Zetasizer nano ZS90, Malvern) under different pH conditions.
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