Nanoparticles ZnO (nano-ZnO), TiO2 (nano-TiO2), Ni (nano-Ni) and their bulk counterparts (bulk-ZnO, bulk-TiO2 and bulk-Ni) were purchased from Sigma–Aldrich (St. Louis, USA). The primary particle size of nanoparticles and Zeta potential was as follows: nano-ZnO <100 nm and 1.53 mV; nano-TiO2 < 21 nm and −7.30 mV; nano-Ni <100 nm and 15.53 mV. Surface area of nano-ZnO, nano-TiO2 and nano-Ni was 15–25, 35–65 and 8–12 m2/g, respectively (data from Sigma–Aldrich). The size of nanoparticles was determined by transmission electron microscope (JEM-3010 TEM JEOL, Ltd., Tokyo, Japan). The TEM pictures of nanoparticles used in the experiment are presented elsewhere (Jośko and Oleszczuk 2013a (link), b ).
Jem 3010 tem
Manufactured by JEOL
Sourced in Japan
The JEM-3010 TEM is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of samples at the nanoscale level. The JEM-3010 TEM is capable of achieving a resolution of up to 0.17 nanometers, enabling users to observe and study the fine details of materials and structures.
Automatically generated - may contain errors
Lab products found in correlation
Nano ni, by Merck Group (2 mentions)
Nano tio2, by Merck Group (1 mentions)
Nano zno, by Merck Group (1 mentions)
Bulktio2, by Merck Group (1 mentions)
Digital micrograph, by Ametek (1 mentions)
Orius sc1000 ccd camera, by Ametek (1 mentions)
S 4800 sem, by Hitachi (1 mentions)
Tecnai g2 f20 s twin, by Thermo Fisher Scientific (1 mentions)
Chi660e electrochemical workstation, by Chenhua (1 mentions)
Sputter coater, by Edwards Lifesciences (1 mentions)
Zen5600, by Malvern Panalytical (1 mentions)
Jem 2100 electron microscope, by JEOL (1 mentions)
Plasma cleaner, by Harrick (1 mentions)
Escalab 250 xi xps system, by Thermo Fisher Scientific (1 mentions)
Jsm 7400f sem, by JEOL (1 mentions)
D8 discovery, by Bruker (1 mentions)
Hexadecyltrimethylammonium bromide ctab, by Merck Group (1 mentions)
Triton x 100 tx 100, by Merck Group (1 mentions)
Cf300 cu, by Electron Microscopy Sciences (1 mentions)
Vwr signature forced air safety ovens, by Avantor (1 mentions)
9 protocols using jem 3010 tem
1
Characterization of Nano-Metal Oxides
2
Imaging Electrospun Membrane Morphology
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The surface morphology of the electrospun membrane was observed using HITACHI S-4800 SEM. The samples were mounted on metal stubs and sputter coated with palladium-platinum-gold for 60 s. Images were taken at an accelerating voltage of 5 kV. The fibers diameters and pore sizes were measured using Image-Pro Plus software (n = 100).
The samples were placed on the copper meshes directly obtained during coaxial electrospinning process and observed using a JEM-3010 TEM (JEOL Co., Japan), with an accelerating voltage of 300 kV. Bright field images were collected with an 11-megapixel SC1000 Orius CCD camera (Gatan, Inc.). Image analysis was performed using Digital Micrograph (Gatan, Inc.).
The samples were placed on the copper meshes directly obtained during coaxial electrospinning process and observed using a JEM-3010 TEM (JEOL Co., Japan), with an accelerating voltage of 300 kV. Bright field images were collected with an 11-megapixel SC1000 Orius CCD camera (Gatan, Inc.). Image analysis was performed using Digital Micrograph (Gatan, Inc.).
3
Synthesis and Electrochemical Characterization of CoNi2S4@CFs
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
XRD patterns were
recorded by a Rigaku XRD-6000 diffractometer, using Cu Kα radiation
(0.15418 nm) at 40 kV, 30 mA. A Zeiss SUPRA 55 SEM and a JEOL JEM-3010
TEM were used for morphological observation. HR-TEM was collected
on an FEI Tecnai G2 F20 S-Twin (200 kV). Al Kα radiation used
in XPS measurements were conducted on an ESCALAB 250 instrument (Thermo
Electron). Nitrogen adsorption/desorption isotherms were measured
on a Quantachrome Autosorb-1CVP analyzer. The specific surface area
was calculated using the BET method. All electrochemical measurements
were carried on a CHI 660E electrochemical workstation (Shanghai Chenhua
Instrument Co., China). The electrochemical tests on the CoNi2S4@CFs electrode were performed in a three-electrode
system by using a saturated Hg/HgCl2 (SCE) electrode and
a platinum plate as the reference and counter electrode, respectively,
in 3 M KOH aqueous solution. At the open-circuit voltage, an alternating
current voltage with 5 mV amplitude was employed in the EIS measurement,
while the frequency ranged from 0.01 to 100 kHz in 1.0 M KOH solution.
The electrochemical performance of CoNi2S4@CFs//AC@CF
all-solid-state devices was measured in a two-electrode system.
recorded by a Rigaku XRD-6000 diffractometer, using Cu Kα radiation
(0.15418 nm) at 40 kV, 30 mA. A Zeiss SUPRA 55 SEM and a JEOL JEM-3010
TEM were used for morphological observation. HR-TEM was collected
on an FEI Tecnai G2 F20 S-Twin (200 kV). Al Kα radiation used
in XPS measurements were conducted on an ESCALAB 250 instrument (Thermo
Electron). Nitrogen adsorption/desorption isotherms were measured
on a Quantachrome Autosorb-1CVP analyzer. The specific surface area
was calculated using the BET method. All electrochemical measurements
were carried on a CHI 660E electrochemical workstation (Shanghai Chenhua
Instrument Co., China). The electrochemical tests on the CoNi2S4@CFs electrode were performed in a three-electrode
system by using a saturated Hg/HgCl2 (SCE) electrode and
a platinum plate as the reference and counter electrode, respectively,
in 3 M KOH aqueous solution. At the open-circuit voltage, an alternating
current voltage with 5 mV amplitude was employed in the EIS measurement,
while the frequency ranged from 0.01 to 100 kHz in 1.0 M KOH solution.
The electrochemical performance of CoNi2S4@CFs//AC@CF
all-solid-state devices was measured in a two-electrode system.
4
TEM Analysis of SiO2-g-PMMA-b-P(PEGMA) Hybrids
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of obtained SiO2-g-PMMA-b-P(PEGMA) hybrids in THF solution were observed by transmission electron microscopy (TEM) with a JEM-3010 TEM (JEOL, Tokyo, Japan) at an acceleration voltage of 100 kV.
5
Characterization of Nanostructured Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
TEM images were obtained using a JEOL JEM-2100 electron microscope at an accelerating voltage of 100 kV. SEM images were obtained using a field-emission scanning electron microscopy (model JEOL 7600F) at an acceleration voltage of 5 kV. Prior to analysis, the samples were coated with gold layer using an Edwards Sputter Coater to enhance their conductivity. To prepare the sample, 0.4 mL of the sample solution was taken and centrifuged at the speed of 12g for 8 min (for bowls, bottles, and cucurbits), or 1.5g for 12 min (for more complex interconnected structures). The supernatant was removed, and the precipitate solution was dropped on a copper grid, which was pre-treated by a Harrick Plasma cleaner for 30 s to remove oxidations. For DLS measurement, 1 mL of the sample solution was injected to a four sides transparent glass cuvette, and then capped to avoid volatilize of solvent. A model ZEN 5600 from Malvern, and a back-scattering mode with an angle of 173° was used for all the measurements. SAED and HR-TEM were performed on a JEOL JEM-3010 TEM at 300 kV. HAADF-STEM imaging and EELs spectrum were carried out on a FEI-Titan ST electron microscope operated at 300 kV.
6
Comprehensive Nanomaterial Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The SEM was performed on a JEOL JSM-7400F SEM working at an acceleration voltage of 3 kV. The TEM, HRTEM and EDS were performed on a JEOL JEM-3010 TEM operating at 300 kV equipped with EDS system. The X-ray diffraction patterns were collected on a Bruker D8 Discovery diffractometer with Cu Kα radiation (λ=0.15418, nm) operating at 40 kV and 40 mA. The TGA was performed on a Mettler Toledo TGA/DSA 1 STARe System under air flow (60 ml min−1) with a heating rate of 5 °C min−1. The XPS spectra were recorded on Thermo Fisher ESCALAB 250Xi XPS system with a monochromatic Al Kα X-ray source. The survey scans were conducted at a pass energy of 100 eV using a step size of 1 eV, and the high-revolution scans were conducted at a pass energy of 50 eV using a step size of 0.05 eV.
7
Synthesis and Characterization of Metal and Metal Oxide Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Nanoparticles ZnO (nano-ZnO), TiO2 (nano-TiO2, mainly anatase form) and Ni (nano-Ni) were purchased from Sigma-Aldrich (USA). CAS numbers of used metal and metal oxide nanoparticles were: 1314-13-2 (nano-ZnO), 13463-67-7 (nano-TiO2), 7440-02-0 (nano-Ni). The ENPs (the purity was around 99.5 %) were used as powder. The primary particle size of ENPs was as follows: nano-ZnO < 100 nm; nano-TiO2 < 21 nm; nano-Ni < 100 nm. The size of ENPs was determined by transmission electron microscope (JEM-3010 TEM JEOL, Ltd., Japan). Surfactants (4-dodecylbenzenesulfonic acid—SDBS, hexadecyltrimethylammonium bromide—CTAB, triton X-100—TX-100) were purchased from Sigma-Aldrich (USA). All solutions were prepared using analytical grade reagents and HPLC grade water (POCH, Gliwice, Poland).
8
Vesicle Morphology Characterization by TEM
9
Comprehensive Characterization of Engineered Gold Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
UV-visible spectra were acquired on a Shimadzu UV-2600 using a quartz cuvette (Shimadzu Corporation, Kyoto, Japan). Hydrodynamic size measurements by dynamic light scattering were performed using a NanoBrook 90Plus Zeta (Brookhaven Instruments Corporation, Holtsville, NY, USA). A JEOL JEM-3010 TEM operating at an accelerating voltage of 300 kV was used to acquire high-resolution transmission electron microscopy (HR-TEM) images (JEOL Ltd., Tokyo, Japan). The nanoparticle solution was pipetted onto a carbon-coated copper grid (carbon type B, 300 mesh, Ted Pella Inc., Redding, CA, USA), and the sample-loaded grid was dried for 12 h at room temperature prior to HR-TEM analysis. The crystalline nature of the AuNPs was analyzed using high-resolution X-ray diffraction (HR-XRD) with a Bruker D8 Discover high-resolution X-ray diffractometer in the range of 20° to 90° (2θ scale). HR-XRD was equipped with a Cu-Kα radiation source (λ = 0.154056 nm) (Bruker, Germany). The powdered sample was prepared using a FD8518 freeze-dryer (IlShinBioBase Co. Ltd., Gyeonggi-do, Republic of Korea). A Varian 500 MHz spectrometer was used to acquire 1H-NMR spectra (Palo Alto, CA, USA).
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!