Roughness (Mean Roughness (Sa) and Root Mean Square (Sq) of bulk and etched polymeric surfaces were determined using
an Agilent 5600LS AFM.
an Agilent 5600LS AFM.
Afm 5600ls
Manufactured by Agilent Technologies
Sourced in United States
The AFM 5600LS is an atomic force microscope (AFM) from Agilent Technologies. It is designed to provide high-resolution imaging and analysis of surface topography at the nanoscale level. The core function of the AFM 5600LS is to measure the forces between a sharp tip and the sample surface, enabling the creation of detailed 3D images of the sample's surface features.
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6 protocols using afm 5600ls
1
Assessing Polymeric Surface Roughness
2
Surface Roughness Characterization by AFM
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Thirty specimens were analyzed using AFM (Agilent 5600LS AFM, USA). AFM was operating in tapping mode. The used probes had spring constant and resonance frequency values of approximately 10 N/m and 250 kHz, respectively. Five standardized profilometric measurements of scanned area equal to 20 × 20 μm2 were performed on each specimen and mean average Ra values were utilized for the statistical analysis.
The instrument was calibrated before the measurements using polyethylene spheres of known diameter. Five images were collected for each specimen. The scan processes were performed by one operator, who was blind towards the specimens and the processing method.[25 ]
AFM images [Figure 1 ] were analyzed using WSxM software to calculate the root mean square (RMS) of the average height of every specimen, which can be assumed as a reliable index of SR.[26 (link)]
The instrument was calibrated before the measurements using polyethylene spheres of known diameter. Five images were collected for each specimen. The scan processes were performed by one operator, who was blind towards the specimens and the processing method.[25 ]
AFM images [
3
Characterization of Silver Nanoparticles
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The surface topography of silver nanoparticles was determined using a 2D and 3D Atomic Force Microscope (AFM) (AFM 5600LS, Agilent, Santa Clara, CA, USA). To begin, the samples were treated with ultrasonic waves for 15 min at a frequency of 50 kHz, with an amplitude of 44 percent and 0.45 of a cycle (UP400S manufactured by Hielscher, Teltow, Germany). Finally, a thin layer was formed using a spin coater instrument, model Laurell-650 Sz, under vacuum at 700 rpm. Contact mode, Al tap, 0.71 In/S speed, I. gain 2, and P. gain 4 were used to create AFM pictures and data profiles at 200 nm × 200 nm and its zoom 100 nm × 100 nm. The surface morphology of selenium nanoparticles was studied using a scanning electron microscope (SEM) (JEOL, Akishima, Tokyo 196-8558, Japan). The silver nanoparticles were introduced to deionized water and sonicated for 15 min using an ultrasonic pump, with a 60 kHz amplitude of 41 percent and 0.41 of a cycle (UP400S manufactured by Hielscher, Teltow, Germany). TEM experiments were carried out using a TEM-2100 high-resolution electron microscope (JEOL, Akishima, Tokyo 196-8558, Japan).
4
Characterization of Ag, MNPs, and Ag@Fe3O4 Nanoparticles
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The crystalline nature and grain size of the obtained Ag-NPs, MNPs, and Ag@Fe3O4 -NPs were investigated using XRD patterns at 25–28°C with a D8 Advance X-ray diffractometer (Bruker, Germany). The hydrodynamic size was determined by dynamic light scattering (DLS) and zeta potential measurements (Zetasizer Nano-ZS, Malvern Instruments, United Kingdom). Transmission electron microscopy (TEM, JSM-2100F, JEOL Inc., Tokyo, Japan) and an Atomic Force Microscope (AFM 5600LS, Agilent, United States).
5
Nanomaterial Surface Topography Analysis
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The investigation of the surface topography of the prepared nanoparticles was achieved using a 2D and 3D Atomic Force Microscope at Faculty of Nanotechnology for Postgraduate Studies, Sheikh Zayed, Cairo University, Giza, Egypt. The technical information of AFM equipment are: AFM 5600LS, Agilent, Santa Clara, CA, USA. The sample preparation for AFM investigation was performed according to Elfaky et al.50 (link).
6
Atomic Force Microscopy of OSCS and ACF
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An AFM system (AFM
5600LS, Agilent, Santa Clara, California) was utilized to get insights
into the morphology and obtain 2D and 3D AFM images of OSCS and ACF-loaded
PM samples. The samples were first exposed to ultrasonic waves for
1 h at a frequency of 60 kHz with an amplitude of 85% and 0.6 cycles
(UP400S manufactured by Hielscher, Teltow, Germany); finally, a thin
film was created using a coater instrument model Laurell-650Sz from
Spain at a speed of 700 rpm under vacuum. Using contact mode, Al tap,
0.71 In/S speed, I. gain 2 and P. gain 4, AFM pictures and data pro
30 le for 200 nm × 200 nm and its zoom 100 nm × 100 nm were
obtained.
5600LS, Agilent, Santa Clara, California) was utilized to get insights
into the morphology and obtain 2D and 3D AFM images of OSCS and ACF-loaded
PM samples. The samples were first exposed to ultrasonic waves for
1 h at a frequency of 60 kHz with an amplitude of 85% and 0.6 cycles
(UP400S manufactured by Hielscher, Teltow, Germany); finally, a thin
film was created using a coater instrument model Laurell-650Sz from
Spain at a speed of 700 rpm under vacuum. Using contact mode, Al tap,
0.71 In/S speed, I. gain 2 and P. gain 4, AFM pictures and data pro
30 le for 200 nm × 200 nm and its zoom 100 nm × 100 nm were
obtained.
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