The morphology of as-synthesized AgNPs@AC was determined by scanning electron microscope (SEM, JSM-7800F, Jeol Ltd.; Tokyo, Japan) and transmission electron microscopy (TEM, Hitachi-HT7700, Hitachinaka, Japan). The crystalline structure of the sample was investigated using X-ray diffraction (XRD) on a Burker AXS D8 (Karlsruhe, Germany) diffractometer. The surface groups were identified by Fourier transform infrared (FTIR) spectrometer (Nicolet IS10, Thermo Fisher Scientific, USA). The specific surface area was calculated by the Brunauer–Emmett–Teller (BET) method (TriStar II 3020, Micromeritics, USA). Dynamic light scattering (DLS, SZ-100Z2, Horiba, Japan) measurements were used to examine the particle size distribution. The PerkinElmer NexIon 300D (Waltham, MA, US) was used to measure the concentration of AgNPs using inductively coupled plasma-mass spectrometry (ICP-MS).
Sz 100z2
Manufactured by Horiba
Sourced in Japan
The SZ-100Z2 is a particle size and zeta potential analyzer manufactured by Horiba. It utilizes dynamic light scattering (DLS) technology to measure the size and distribution of particles suspended in a liquid medium. The instrument can also measure the zeta potential, which is an indicator of the stability of the particle dispersion.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using sz 100z2
1
Comprehensive Characterization of Silver Nanoparticles
2
Optical Characterization of SiO2@Au Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The extinction spectra of the synthesized SiO2@Au nanoparticles were determined using a UV-Vis spectrometer V630 (V630, Jasco, Japan). This instrument operates with high speeds of up to 8000 nm/min and can measure wavelength ranges from 190 to 1100 nm. The images of surface morphologies of SiO2, SiO2@PEI, and SiO2@Au microspheres were observed and evaluated by a scanning electron microscope (S-4800 SEM, Hitachi, Japan) with an accelerating voltage range the electron beam in the range of 0.5 to 30kV. A DLS analytical instrument (Horiba, SZ-100Z2, Kyoto, Japan) was used to determine the size of SiO2 and SiO2@Au by measuring the intensity of the dynamic light scattering of these particles. The Raman scattering intensity was measured on a Raman spectrometer (Horiba Ihr 550, Kyoto, Japan) using a laser source with an excitation light wavelength of 532 nm and methylene blue analyte.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!