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Model inspect f50

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Thermo Fisher Scientific Inspect F50 is a high-performance field emission scanning electron microscope (FE-SEM) designed for materials analysis and characterization. It provides a versatile platform for imaging and analyzing a wide range of samples at nanoscale resolution. The Inspect F50 features advanced electron optics, high-resolution imaging capabilities, and user-friendly software to enable comprehensive material investigations.

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5 protocols using model inspect f50

1

Morphological Characterization of Irradiated Pellets

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In order to investigate the morphological characteristics of the prepared irradiated pellets and as a function of the total electron dose, it was used a field emission scanning electron microscope (FE-SEM), FEI (Model Inspect F50) operating at 5 kV. In this work the samples were cut mechanically for the cross-section measurements using FE-SEM images and the support image processing and analysis software (Image J). Mechanical cutting to perform cross-section measurements of the metallic layer was used, since cutting the relative Ag thick layer by more advanced techniques, such as the Focused Ion Beam (FIB), would induce silver growth, amorphization and deposition of gallium ions during the milling process, modifying the structure of the material.70–74 (link)
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2

Microcrystalline Powder Characterization

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The microcrystalline powders were characterized using XRD with a D/Max-2500PC diffractometer (Rigaku, Japan) involving CuK α radiation (λ = 1.54056 Å) in the 10–70° 2θ range at a scan rate of 0.01° min−1. Micro-Raman spectroscopy was carried out using an iHR550 spectrometer (Horiba Jobin-Yvon, Japan) coupled to a charge-coupled device (CCD) detector and an argon-ion laser (MellesGriot, USA) operating at 633 nm with a maximum power of 200 mW. The spectra were measured in the 50–1000 cm−1 range. The SEM images were analyzed using field emission gun scanning electron microscopy (FEG-SEM) on an FEI instrument (Model Inspect F50) operating at 5 kV.
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3

Structural and Morphological Characterization of Microcrystals

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The structural characterization of the materials was performed at long-range, a D/Max-2500 PC diffractometer (Rigaku, Japan) with Cu Kα radiation (λ = 1.54056 Å) in the 2θ range of 10°–80° at a scan rate of 0.01°min−1. To analyze the morphologies, a scanning electron microscope with a field emission gun (FEG-SEM) FEI Model Inspect F50, operating at 5 kV was used. Particle count analysis was performed using ImageJ software, with a minimum count of 100 particles. The silver content present in the microcrystals suffers oxidation during the synthesis process. To calculate the amount of oxidized silver [Ag+] in the microcrystals structure, first, the microcrystal concentration was converted from µg/mL to µmol/mL using the following equation: silver content in each microcrystal concentration = microcrystal concentration (µmol/mL) × 10–6/Molecular Weight of the microcrystal. Then, the amount of silver was calculated based on the number of mols released by each microcrystal.
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4

Anchote Starch Microscopy Protocol

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The picture of anchote starch was generated using a SEM (FEI INSPECT F50 model). Molecules and atoms in the samples interact to generate a multitude of signals, containing information about the exterior morphology of the sample. It was talked about the SEM image in result and discussion section.
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5

Microscopic Analysis of Laser-Irradiated Samples

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The morphology of fs laser-irradiated and non-irradiated samples was observed using a field-emission scanning electron microscope (FE-SEM) (Inspect F50 model; FEI Company, USA) working at 5 kV. Transmission electron microscopy (TEM) images are obtained using a high-resolution (HR) JEM-2100 LaB6 (Jeol) microscope with an acceleration voltage of 200 kV coupled with INCA Energy TEM 200 (Oxford Instruments) to perform energy-dispersive X-ray spectroscopy (EDS). For both the non-laser irradiated powder and the laser irradiated powder, in the case of FE-SEM, the samples were prepared by depositing a small amount of powder directly onto the FE-SEM sample holder, and for the TEM the powder was suspended in water and a droplet of the mixture was deposited onto the carbon-coated Cu grid (TEM grid). After the evaporation of water, it was submitted to high vacuum and analyzed via TEM.
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