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Tem cm100 microscope

Manufactured by Philips

The Philips TEM-CM100 is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of small-scale structures. The TEM-CM100 utilizes an electron beam to magnify and focus images, providing detailed information about the internal structure and composition of samples at the nanoscale level. The core function of this instrument is to enable advanced microscopic examination and characterization of a wide range of materials and specimens.

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3 protocols using tem cm100 microscope

1

Synthesis and Characterization of Silica-Hematite Ellipsoidal Particles

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Silica/hematite
core/shell ellipsoidal particles of two different aspect ratios were
synthesized. Hematite ellipsoids were initially synthesized in water
following the approach described by Ocana et al.46 (link) They were then coated with silica layer(s) in ethanol using
the method described by Graf et al.47 (link) The
aspect ratio of the particles was controlled by tuning the thickness
of the silica shell. Particles were purified by repeated centrifugation/redispersion
cycles in water and were kept in water as a stock dispersion. Details
of the synthesis and characterization of similar particles can be
found elsewhere.38 (link)A transmission
electron microscope (TEM) (TEM-CM100 microscope from Philips operating
at 100 keV) was used to characterize both the size and shape of the
particles. Particle size distributions were calculated by measuring
at least 100 particles from TEM micrographs using the software ImageJ.
For the batch of particles that we have named E1,
we find the long and short axes to be L1 = 316 ± 26.3 nm and D1 = 108 ±
7 nm respectively, leading to an aspect ratio of ρ1 = 2.9, while for another batch, named E2, L2 = 266 ± 19 nm and D2 = 72 ± 6 nm, corresponding to ρ2 =
3.69. Figure 1a,b shows
representative TEM images for the ellipsoids.
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2

Characterization of Ellipsoidal Particles

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A TEM-CM100 microscope from Philips operating at 80 keV was used to visualize the coronal sections of the ellipsoidal particles deposited on a carbon coated, 300 mesh, grid. Lengths L and diameters d were measured for a set of 440 particles and then analyzed statistically.
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3

Ellipsoidal Colloid Characterization

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The size and shape characterization of the ellipsoidal colloids were carried out using TEM (TEM-CM100 microscope from Philips operating at 100 keV). Particle size distributions were calculated by measuring at least 100 particles from TEM images using ImageJ. The average particle semi-long, a, and semi-short, b, axes are found to be a = 148.5 nm and b = 39.5 nm, leading to an aspect ratio of ρ = 3.76.
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