Nanoparticle size and zeta potential were measured by a dynamic light scattering (DLS) system with a Litesizer 500 particle analyzer (Anton Paar, Austria) at room temperature. The images of morphology were acquired by transmission electron microscopy (FEI Tecnai G2 F30, Philips-FEI) at a 120 kV accelerating voltage. Freshly prepared samples were dropped onto the 200-mesh carbon-coated copper grid. The excess solvent was dried off after 10 min, and then 5 μL of phosphotungstic acid was applied for negative staining.
Tecnai g2 f30
Manufactured by Philips
The Tecnai G2 F30 is a transmission electron microscope (TEM) designed and manufactured by Philips. It is a high-performance imaging and analytical instrument capable of providing detailed information about the structural and chemical properties of materials at the nanoscale level.
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2 protocols using tecnai g2 f30
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Nanoparticle Characterization by DLS and TEM
2
Acid Etching of Halloysite Nanotubes
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HCl solution was selected to dissolve alumina sheets from HNTs. The etching process of HNTs was carried out as follows: 2.5 g of dry HNTs powder was dispersed into 250 ml of 3 M (mol l−1) HCl solution and stirred at 80 °C for 8 h. Next, the products were centrifuged and washed by deionized water until supernatant becomes neutral. Finally, the acid-etched HNTs were dried in vacuum oven at 60 °C and then milled to a fine powder, marked as E-HNT.
The surface morphology and microstructure of raw HNTs and acid-etched HNTs were characterized by SEM (FEG-XL30, FEI Company, USA) at a 10 kV accelerating voltage and TEM (TECNAI G2 F30, Philips-FEI, Holland) at 120 kV, respectively. The elemental composition was confirmed by energy-dispersive X-ray spectroscopy (EDXS). The surface areas and pore-size distribution of the HNTs were determined by N2 absorption/desorption measurements (ASAP 2010, Micromeritics Instrument Corp., USA).
The surface morphology and microstructure of raw HNTs and acid-etched HNTs were characterized by SEM (FEG-XL30, FEI Company, USA) at a 10 kV accelerating voltage and TEM (TECNAI G2 F30, Philips-FEI, Holland) at 120 kV, respectively. The elemental composition was confirmed by energy-dispersive X-ray spectroscopy (EDXS). The surface areas and pore-size distribution of the HNTs were determined by N2 absorption/desorption measurements (ASAP 2010, Micromeritics Instrument Corp., USA).
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