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X maxn 80 detector

Manufactured by Oxford Instruments

The X-MaxN 80 detector is a silicon drift detector (SDD) designed for energy dispersive X-ray spectroscopy (EDS) applications. It features an 80 square millimeter active area and provides high-resolution X-ray detection capabilities for materials analysis.

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8 protocols using x maxn 80 detector

1

Nanocomposite Membrane Characterization

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Cross-section of the membrane was imaged using transmission electron microscopy (TEM, Talos F200X) coupled with energy dispersive spectroscopy (EDS, Oxford Instrument X-MaxN 80 detector). A TEM sample of the nanocomposite rGO layer cross-section was prepared using a focused ion beam (Helios FEI). X-ray photoelectron microscopy (XPS, Thermo Scientific K-Alpha) was used to determine the elemental composition across the membrane depth. The crystal structure and the specific surface area of the Fe-based nanoparticles synthesized in the solution phase were determined using X-Ray Diffraction (XRD, Siemens D500, Cu Kα 1.5418 Å) and a Brunauer–Emmett–Teller (BET, Micromeritics TriStar 300) analyzer. Functional groups of rGO were characterized by Fourier Transform Infrared Spectroscopy (FTIR, Varian 7000e). Contact angles were measured using a Drop shape analyzer (DSA 100 Kruss), and C 1s binding energy spectra were obtained using XPS.
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2

Nanoscale Analysis of Fe/Pd Nanoparticles in Membranes

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The size and distribution of the Fe/Pd nanoparticles were studied both on the surface and inside the membrane pores after preparation of a lamella using FIB-SEM (FEI Helios Nanolab 660) analysis. Following surface imaging of the region of interest, a lamella was lifted out of the membrane sample and its thickness gradually reduced using FIB until it was transparent. The specimen was then imaged via scanning transmission electron microscopy (STEM) in the FIB-SEM. Following this treatment, the Fe/Pd nanoparticles inside the membrane pores could then be directly observed in transmission.
The elemental composition of the particles was determined by energy dispersive X-ray spectroscopy (EDX, Oxford Instruments X-MaxN 80 detector) on the lamella. Their reduced thickness decreased scattering of the beam and optimized EDX lateral resolution. Although individual nanoparticles could not be distinguished during EDX elemental mapping, regions where particles agglomerated were identified. Elemental composition of this agglomerate was possible, and only Fe and Pd were considered during this analysis. Other observed elements such as the C, H, F, O (membrane elements), Pt (coating), Ga (beam) and Cu (holder) were ignored to clearly analyze Fe and Pd composition.
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3

Characterization of Nanomaterials by TEM-EDX

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Transmission electron microscopy (TEM) was
performed on a JEOL JEM-2100 operating at 200 kV. Energy dispersive
X-ray analysis (EDX) was done using an Oxford Instruments X-MaxN 80
detector, and the data were analyzed using the Aztec software. Samples
were prepared by dispersion in ethanol by sonication and deposited
on 300-mesh copper grids coated with a holey carbon film. High angle
annular dark-field (HAADF) scanning transmission electron microscopy
(STEM) imaging was done using a JEOL ARM200CF operating at 200 kV.
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4

Scanning Electron Microscopy Elemental Analysis

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The
EDX measurements were performed on a JEOL 7800F Prime scanning electron
microscope equipped with an X-Max N 80 detector from Oxford Instruments.
The instrument was operated at 10 kV, and a working distance of a
maximum of 10 mm was used. The spectra were acquired for 80 s with
an aperture of 110 μm. The spectra were corrected and analyzed
with Aztec software, version 5.0.
The elemental EDS mapping
and STEM images were acquired with an FEI Titan 80-300 (300 kV) equipped
with an INCA X-sight detector (Oxford Instruments). The sample holder
was tilted about 20° toward the detector. The X-ray spectra were
background corrected, and peaks fit in mixed mode (standard peaks
were used for elemental peaks in the standards list and theoretical
Gaussians for any, if present, peaks not in the standards list) using
FEI TIA version 5.12.
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5

Nanocomposite Membrane Characterization

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Cross-section of the membrane was imaged using transmission electron microscopy (TEM, Talos F200X) coupled with energy dispersive spectroscopy (EDS, Oxford Instrument X-MaxN 80 detector). A TEM sample of the nanocomposite rGO layer cross-section was prepared using a focused ion beam (Helios FEI). X-ray photoelectron microscopy (XPS, Thermo Scientific K-Alpha) was used to determine the elemental composition across the membrane depth. The crystal structure and the specific surface area of the Fe-based nanoparticles synthesized in the solution phase were determined using X-Ray Diffraction (XRD, Siemens D500, Cu Kα 1.5418 Å) and a Brunauer–Emmett–Teller (BET, Micromeritics TriStar 300) analyzer. Functional groups of rGO were characterized by Fourier Transform Infrared Spectroscopy (FTIR, Varian 7000e). Contact angles were measured using a Drop shape analyzer (DSA 100 Kruss), and C 1s binding energy spectra were obtained using XPS.
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6

Characterization of MnO2 Nanorods and rGO/MnO2 Heterostructure

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The MnO2 nanorods and rGO/MnO2 nano-heterostructure were characterized by various complementary experimental methods. The XRD patterns were obtained with a Bruker D8 Advance X-ray diffractometer using the Cu Kα line (λ = 1.54 Å) at 1° grazing angle. The HR-TEM micrographs and selected area electron diffraction (SAED) patterns were obtained with JEOL-JEM 2100 microscope operating at 200 kV. The samples were dry dispersed over 300 mesh copper grids coated with holey carbon film. A Field Emission Scanning Electron Microscope (FEG-SEM Model – Tescan MAIA3) was used to examine the morphology and surface topography of the MnO2 nanorods and rGOs/MnO2 composite. The accelerating voltage was 15 kV. X-ray spectroscopy (EDS) measurements were done using Oxford Instruments X-MaxN 80 detector and analyzed using Aztec software. X-ray Photoelectron Spectroscopy (XPS) was carried on the samples using a Kratos Axis Ultra DLD photoelectron spectrometer utilizing monochromatic AlKα radiation operating at an energy of 120 W (10 × 12 kV). Data were analyzed using Casa XPS and modified Wagner sensitivity factors as supplied by the instrument manufacturer after subtraction of a Shirley background. All spectra were calibrated to the C(1s) line taken to be 284.8 eV.
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7

Membrane Cross-Section Analysis by FIB-SEM

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Particle size and distribution were determined across the entire depth of membranes by directly imaging the cross-section plane of the membrane in the SEM. To maintain the structures of particles and membrane pores, an advanced cross-sectioning method using focused ion beam (FIB, FEI Helios Nanolab 660) was developed. A cross-sectional plane was first created by fracturing a small piece of the membrane following immersion in liquid nitrogen. The FIB was then performed to expose an undamaged region of the membrane. For gallium ion-based FIB systems, typical cross-sectioning processes only expose the first few tens of micrometers below the surface [52 ,59 ]. The advanced FIB preparation method allows exposure of the entire membrane cross-section (170 μm), creating a flat and smooth surface suitable for SEM imaging and elemental analysis using energy dispersive x-ray spectroscopy (EDS, Oxford Instruments X-MaxN 80 detector). The details of FIB preparation are described in SI section 3. Particle composition was also analyzed using X-ray diffractometer (Siemens D500, Cu Kα 1.5418 Å).
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8

Quantifying PFOA Adsorption in PNIPAm Hydrogels

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After PFOA adsorption, PNIPAm hydrogel samples were dried and analyzed using energy dispersive X-ray spectroscopy (EDS, Oxford Instruments X-MaxN 80 detector). Hydrogel samples were freeze dried and mounted on the holder inside the scanning electron microscope chamber (FEI Helios Nanolab 660) and EDS analysis was performed in order to find the relative ratios of carbon, nitrogen, oxygen, and fluorine. Using the atomic ratios of fluorine, which only exists in PFOA, versus nitrogen, which only exists in PNIPAm, the adsorbed amount can be loosely predicted and compared to the equilibrium adsorption data.
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