X maxn 80 detector
The X-MaxN 80 detector is a silicon drift detector (SDD) designed for energy dispersive X-ray spectroscopy (EDS) applications. It features an 80 square millimeter active area and provides high-resolution X-ray detection capabilities for materials analysis.
Lab products found in correlation
8 protocols using x maxn 80 detector
Nanocomposite Membrane Characterization
Nanoscale Analysis of Fe/Pd Nanoparticles in Membranes
Characterization of Nanomaterials by TEM-EDX
performed on a JEOL JEM-2100 operating at 200 kV. Energy dispersive
X-ray analysis (EDX) was done using an Oxford Instruments X-MaxN 80
detector, and the data were analyzed using the Aztec software. Samples
were prepared by dispersion in ethanol by sonication and deposited
on 300-mesh copper grids coated with a holey carbon film. High angle
annular dark-field (HAADF) scanning transmission electron microscopy
(STEM) imaging was done using a JEOL ARM200CF operating at 200 kV.
Scanning Electron Microscopy Elemental Analysis
EDX measurements were performed on a JEOL 7800F Prime scanning electron
microscope equipped with an X-Max N 80 detector from Oxford Instruments.
The instrument was operated at 10 kV, and a working distance of a
maximum of 10 mm was used. The spectra were acquired for 80 s with
an aperture of 110 μm. The spectra were corrected and analyzed
with Aztec software, version 5.0.
The elemental EDS mapping
and STEM images were acquired with an FEI Titan 80-300 (300 kV) equipped
with an INCA X-sight detector (Oxford Instruments). The sample holder
was tilted about 20° toward the detector. The X-ray spectra were
background corrected, and peaks fit in mixed mode (standard peaks
were used for elemental peaks in the standards list and theoretical
Gaussians for any, if present, peaks not in the standards list) using
FEI TIA version 5.12.
Nanocomposite Membrane Characterization
Characterization of MnO2 Nanorods and rGO/MnO2 Heterostructure
Membrane Cross-Section Analysis by FIB-SEM
Quantifying PFOA Adsorption in PNIPAm Hydrogels
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