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Pylon

Manufactured by Teledyne

The PyLoN is a high-performance spectroscopy camera designed for scientific and industrial applications. It offers a range of features, including high sensitivity, low noise, and fast frame rates. The core function of the PyLoN is to capture and analyze spectroscopic data with precision and accuracy.

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8 protocols using pylon

1

Optical Characterization of Coupled PhC Cavities

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A 980-nm pulsed laser diode (10-ns pulses with 1% duty cycle) was used to optically pump the coupled PhC cavities at room temperature. The light emitted from the cavities was collected by a × 40 microscope objective lens with a numerical aperture of 0.55 and focused onto either an IR 1D array detector (PyLoN, Princeton Instruments) or an InGaAs IR camera (C10633, Hamamatsu). To control the pump position in the scanning PL measurement, the motorized single-axis translation stage was used to move the PhC samples with a scanning step of 0.2 μm, while a fixed pump laser with a spot size of ∼3.0 μm illuminated the samples. The pump positions were accurately determined using a reference position near the coupled PhC cavities. In Fig. 5, a gate voltage was applied with ion gel using a DC voltage source (R6142, Advantest).
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2

Micro-PL Characterization of Plasmonic Nanoantennas

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All PL spectra are acquired at room temperature in a micro-PL set-up with samples placed in vacuum. A 685-nm diode laser coupled to a single mode fibre is used as the excitation source. After passing through a 700-nm short-pass filter, the laser is focussed onto the sample through an infinity corrected objective (Mitutoyo × 100 NA = 0.7). For the data reported in Fig. 2, the average power entering the objective is 30  μW for monolayer PL and 120  μW for bilayer PL. The resulting laser spot has a radius of 3.5μ m, which is large enough to illuminate entire individual dimers, and kept constant for a uniform excitation of all the different nano-antennas sizes when determining the reported enhancement factor in Eq. (1). The dimers are separated by 10 μm, which allows optical measurement of an individual dimer. The emitted light is collected by the same objective and filtered with a 700-nm long-pass filter before coupling into a spectrometer (Princeton Instruments SP2750) and detection with a high-sensitivity liquid nitrogen cooled charge-coupled device (CCD; Princeton Instruments PyLoN). For polarisation measurements, a Glan–Thompson linear polarizer, followed by a half-wave plate mounted onto a motorised rotation stage, are inserted in the excitation path in order to control the linear polarisation angle of the laser source. No polarisation optics is used in the collection path.
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3

Flexible PDMS Samples Characterization

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The flexible PDMS samples with PhC laser devices were mounted and fixed to a customized digital controller that consisted of a micrometre and a single-axis translation stage. The controller was used to stretch or compress the flexible samples (Supplementary Fig. 1). In Figs 2 and 3, a 980-nm pulsed laser diode (10-ns pulses with 1% duty cycle) was used to optically pump the PhC laser devices at room temperature. The light emitted from the laser devices was collected by a × 40 microscope objective lens with a numerical aperture of 0.55 and focused onto either an infrared one-dimensional array detector (PyLoN, Princeton Instruments) or an InGaAs infrared camera (C10633, Hamamatsu).
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4

Topological Cavity Optical Characterization

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A 980-nm pulsed laser diode (1.6% duty cycle; 1 MHz period) was used to optically pump the fabricated topological cavities at room temperature. The light emitted from the cavities was collected by a 50× long-focal objective lens with a numerical aperture of 0.42 (M Plan Apo NIR B, Mitutoyo) and focused onto a spectrometer (SP 2300i, Princeton Instruments). The grating with 300 grooves mm−1 blazed at 1.2 μm was used to spectrally disperse the PL emission from the cavities. The light was sent to either an IR array detector (PyLoN, Princeton Instruments) or an InGaAs IR camera (C10633, Hamamatsu) using a flip mirror in the spectrometer. For conventional mode imaging (not spectral imaging), a mirror was placed instead of the grating.
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5

Micro-spectroscopy Setup for Samples

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The employed micro-spectroscopy setup has been described elsewhere60 (link). Briefly, solid-state laser beams of 457.8 and 514.3 nm (Cobolt, Twist, and Fandango) were focused onto samples within a spot size of ~1 μm using a microscope objective (×40, NA = 0.60). The signals were collected using a CCD camera (Princeton Instruments, PyLon) with a spectrometer (Princeton Instruments, SP2300). All measurements were performed in the ambient conditions unless noted otherwise. The average power was maintained below 2 μW to avoid unwanted photoinduced degradation.
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6

Cryogenic Nanophotonics Characterization Setup

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PL experiments were performed in a lab-built cryogenic setup. The sample was mounted on piezo-stepping units (attocube systems ANPxy101 and ANPz102) for positioning with respect to a low-temperature objective (attocube systems LT-APO/NIR/0.81) or the cavity mode. The microscope was placed in a dewar with an inert helium atmosphere at a pressure of 20 mbar and immersed in liquid helium at 4.2 K. Excitation around 635–705 nm was performed with a wavelength-tunable supercontinuum laser (NKT SuperK Extreme and SuperK Varia) with repetition rates down to 2 MHz. In continuous-wave measurements, the PL was spectrally dispersed by a monochromator (Princeton Instruments Acton SP 2500) and recorded with a nitrogen-cooled silicon CCD (Princeton Instruments PyLoN). Time-resolved PL was detected with avalanche photodiodes (Excelitas SPCM-AQRH or PicoQuant τSPAD).
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7

Multimodal Characterization of Nanostructures

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The STM and AFM measurements
were performed with a home-built combined STM/AFM setup operating
at ultrahigh-vacuum (UHV) conditions (p
1 × 10–10 mbar) and low temperatures (T ≈ 5 K). The microscope is equipped with a qPlus
force sensor63 (link) operated in the frequency
modulation mode64 (link) (resonance frequency f0 ≈ 30 kHz, quality factor Q ≈ 100 000, spring constant k
1800 N m–1, oscillation amplitude A ≈ 0.5 Å). The bias voltage is applied to the sample.
All STM images were acquired in constant-current mode, AFM images
were taken in constant-height mode at 0 V bias voltage. For optical
detection, we used a spectrograph (Acton SP-300i, Princeton Instruments)
coupled to a liquid nitrogen cooled CCD camera (PyLoN, Princeton Instruments)
with a spectral resolution of about 0.2 nm and a solid angle for the
detection of Ω ≈ 0.03. STM-LE spectra were recorded in
an energy range of 1.28–3.07 eV (404–969 nm) and 1.18–2.53
eV (491–1054 nm) and by averaging over several frames, where
each frame typically lasted 3 to 4 min, yielding total acquisition
times per spectrum between 8 and 60 min. The shown spectra are background
corrected.
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8

SFG Measurements of Second-Order Nonlinear Susceptibility

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HD-SFG71 (link) measurements were performed in a collinear beam geometry using a Ti:sapphire regenerative amplifier (centred at 800 nm, ∼40-fs pulse duration, 5-µJ pulse energy, 1-kHz repetition rate, Spitfire Ace, Spectra Physics). Part of the output was used to generate a broadband IR pulse in an OPA (TOPAS-C, Light Conversion) with a DFG crystal. The other part of the output was directed through a pulse shaper consisting of a grating-cylindrical mirror system to generate a narrowband visible pulse with a bandwidth of ∼10 cm−1. The IR and visible beam were first focused into a 20-μm y-cut quartz plate as the local oscillator (LO). These beams were collinearly passed through a 2-mm SrTiO2 plate for phase modulation and focused on the sample surface at an angle of incidence of 45°. The SFG signal from the sample interfered with the SFG signal from the LO, generating the SFG interferogram. The SFG interferogram was dispersed in a spectrometer (HRS-300, Princeton Instrument) and detected by a liquid nitrogen-cooled CCD camera (PyLoN, Princeton Instruments). The data were analysed using a previously described procedure79 (link). Briefly, the complex spectra of the second-order nonlinear susceptibility χeff(2) were obtained via Fourier analysis of the interferogram and normalization by a z-cut quartz crystal. All measurements were performed using the ssp polarization combination.
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