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Ultra 55 electron microscope

Manufactured by Zeiss
Sourced in France, Germany

The Ultra 55 electron microscope is a high-performance imaging tool designed for advanced materials analysis. It features a high-resolution electron beam that allows for detailed examination of nanoscale structures. The Ultra 55 provides reliable and consistent imaging capabilities for a variety of research and industrial applications.

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4 protocols using ultra 55 electron microscope

1

Scanning Electron Microscopy of Msm Strains

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Scanning electron microscopy was performed as described previously (Dahl, 2004 (link)). Msm strains were grown to stationary phase. Culture aliquots were concentrated by centrifugation, resuspended, and fixed with 2.5% glutaraldehyde. Then, sequential ethanol dehydrations were performed. After permutation with isopentylosacetate, critical point drying was determined using a Hitachi HCP-2 Critical Point Dryer (Hitachi High-Technologies Corp., Tokyo, Japan). Samples were gold sputter coated (Technics Hummer V; Anatech), and ultrastructure examination was performed using a Zeiss Ultra 55 electron microscope.
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2

Multi-Technique Surface Characterization

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Scanning
electron microscopy (SEM) images were obtained using an ULTRA 55 electron
microscope (Zeiss, France).
X-ray photoelectron spectroscopy
(XPS) was carried out on a PHl 5000 VersaProbe-Scanning ESCA Microprobe
(ULVAC-PHI, Japan/USA) instrument at a base pressure below 5 ×
10–9 mbar with 90° between the X-ray source.
The spectra were decomposed into their components with mixed Gaussian–Lorentzian
(30:70) shape lines using CasaXPS software.
ζ-Potential
measurements were carried out with a Zeta-sizer
Nano-ZS (Malvern Instruments Inc. Worcestershire, UK) at a sample
concentration of 10 μg mL–1 and measured in
Milli-Q water at pH 7.0.
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3

Characterization of Alginate Nanoparticles using SEM

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The SEM analysis of alginate nanoparticles was performed using an ULTRA 55 electron microscope (Zeiss, München, Germany), equipped with a thermal field emission transmitter and three different detectors (EsB detector with filtering grid, high-efficiency integrated lens SE detector, Everhart–Thornley secondary electronic detector). The parameters of the microscope were fixed as follows: Electron acceleration voltage: 200 V–20 KV; working distance: 1 mm; sub-nanometric resolution at 15 kV; beam current up to 100 nA. Several drops of the aqueous solution of alginate nanoparticles (500 μg/mL) were deposited on a silicon substrate previously cleaned in successive baths of acetone and isopropanol under ultrasonication across 10 min, and rinsed thoroughly with ultrapure water. Then the substrate was dried at 100 °C for 1 h before observation.
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4

Electron Microscopy Sample Preparation

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Material from 5-day-old cultures was collected by centrifugation, fixed in Karnovsky solution and then washed three times with 0.025 M cacodylate. Post-fixation in 1% OsO4 solution (60 min., RT) was performed one day before imaging, followed by three washes in distilled H2O. The samples were then dehydrated in a progressive ethanol series and stored overnight in absolute ethanol. The next day the samples were transferred twice to absolute ethanol for 60 min. each. Critical point drying was performed according to Robards and Wilson (1993 ). Imaging was performed using a Zeiss Ultra 55 electron microscope.
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