Ultra 55 electron microscope
The Ultra 55 electron microscope is a high-performance imaging tool designed for advanced materials analysis. It features a high-resolution electron beam that allows for detailed examination of nanoscale structures. The Ultra 55 provides reliable and consistent imaging capabilities for a variety of research and industrial applications.
Lab products found in correlation
4 protocols using ultra 55 electron microscope
Scanning Electron Microscopy of Msm Strains
Multi-Technique Surface Characterization
electron microscopy (SEM) images were obtained using an ULTRA 55 electron
microscope (Zeiss, France).
X-ray photoelectron spectroscopy
(XPS) was carried out on a PHl 5000 VersaProbe-Scanning ESCA Microprobe
(ULVAC-PHI, Japan/USA) instrument at a base pressure below 5 ×
10–9 mbar with 90° between the X-ray source.
The spectra were decomposed into their components with mixed Gaussian–Lorentzian
(30:70) shape lines using CasaXPS software.
ζ-Potential
measurements were carried out with a Zeta-sizer
Nano-ZS (Malvern Instruments Inc. Worcestershire, UK) at a sample
concentration of 10 μg mL–1 and measured in
Milli-Q water at pH 7.0.
Characterization of Alginate Nanoparticles using SEM
Electron Microscopy Sample Preparation
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