Tem 2100 high resolution electron microscope

The surface topography of silver nanoparticles was determined using a 2D and 3D Atomic Force Microscope (AFM) (AFM 5600LS, Agilent, Santa Clara, CA, USA). To begin, the samples were treated with ultrasonic waves for 15 min at a frequency of 50 kHz, with an amplitude of 44 percent and 0.45 of a cycle (UP400S manufactured by Hielscher, Teltow, Germany). Finally, a thin layer was formed using a spin coater instrument, model Laurell-650 Sz, under vacuum at 700 rpm. Contact mode, Al tap, 0.71 In/S speed, I. gain 2, and P. gain 4 were used to create AFM pictures and data profiles at 200 nm × 200 nm and its zoom 100 nm × 100 nm. The surface morphology of selenium nanoparticles was studied using a scanning electron microscope (SEM) (JEOL, Akishima, Tokyo 196-8558, Japan). The silver nanoparticles were introduced to deionized water and sonicated for 15 min using an ultrasonic pump, with a 60 kHz amplitude of 41 percent and 0.41 of a cycle (UP400S manufactured by Hielscher, Teltow, Germany). TEM experiments were carried out using a TEM-2100 high-resolution electron microscope (JEOL, Akishima, Tokyo 196-8558, Japan).