K2 direct electron detection camera
The K2 direct electron detection camera is a high-performance imaging device designed for use in electron microscopy applications. It captures direct electron images without the need for scintillators or other conversion layers, enabling high-resolution and low-noise imaging.
Lab products found in correlation
2 protocols using k2 direct electron detection camera
Cryo-EM Sample Preparation and Data Acquisition
Characterizing Aluminum Impurity Deposits
(Zeiss, Germany) scanning electron microscope equipped with an Oxford
SDD 30 EDS detector (Oxford Instruments, United Kingdom) was used.
Transmission electron microscopy (TEM) lamellae were prepared by an
FEI Nova 200 NanoLab (FEI, USA), a dual beam focused ion beam (FIB)/SEM
microscope, and mounted at an Omniprobe Cu grid. Measurements were
performed with an FEI Titan3 (link) G2 60-300
(FEI, USA) equipped with a CS-probe corrector, a Super-X EDS detector
(FEI, NL), and a Gatan Image Filter Quantum ERS (Gatan, USA) as well
as a K2 direct electron detection camera (Gatan, USA). All TEM measurements
were carried out at 300 kV acceleration voltage and in monochromated
STEM mode. Elemental maps and line scans were obtained using GMS 3
(Gatan, USA). The HAADF SE image of the impurity deposit and corresponding
TEM-EDS maps (
acquired and processed using Velox Version 2 (Thermo Fischer Scientific,
USA). As for SNMS and XPS, it was necessary also for TEM to use thin
film samples because the surface of mechanically polished Al is too
rough.
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