1H NMR and 13C NMR spectra were recorded on a Bruker AscendTM-400 spectrometer, with tetramethylsilane as an internal reference. The absorption spectra were measured on a SHIMADZU/UV-2550 model UV-visible spectrophotometer. Cyclic voltammetry was performed on a BAS 100B/W electrochemical analyzer with a three-electrode cell in a 0.1N Bu4NBF4 solution in acetonitrile at a scan rate of 50 mV/s. The polymer film was coated onto a Pt wire electrode by dipping the electrode into a polymer solution in chloroform. All measurements were calibrated against an internal standard of ferrocene (Fc), the ionization potential (IP) value of which is −4.8 eV for the Fc/Fc + redox system. The number- and weight-average molecular weights of the polymers were determined by gel-permeation chromatography (GPC) with a Waters 2690 Associates liquid chromatography instrument equipped with a Waters 2414 differential refractometer. Chloroform was used as the eluent and polystyrene as the standard. The surface morphology of polymer films was measured by atomic force microscopy (AFM) using tapping mode, and the AFM scan images (2 μm × 2 μm) were acquired in tapping mode on a Nanoscope instrument (Bruker).
Nanoscope instrument
Manufactured by Bruker
The Nanoscope instrument is a high-resolution microscope designed for advanced materials characterization. It utilizes scanning probe microscopy techniques to provide detailed information about the surface topography and properties of a wide range of samples at the nanoscale level. The Nanoscope instrument is a versatile tool for researchers and scientists working in various fields, including nanotechnology, materials science, and biological applications.
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2 protocols using nanoscope instrument
1
Characterization of Polymeric Materials
2
Comprehensive Material Characterization Protocol
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Conductivity was calculated from the IV curves that were collected using a Keithley 4200 source meter unit (SMU). The samples were scanned from À1 V to 1 V at a rate of 5 mV s À1 . For the temperature dependent conductivity measurements, a Biologic SP-200 potentiostat was used and the temperature was controlled using an Omron E5AN cryostat. For the AFM images, a Bruker NanoScope instrument was used in a tapping mode. X-ray diffraction (XRD) patterns were obtained using a Bruker D2 Phaser, absorption spectra were recorded using a Shimadzu UV-3600 Plus UV-Vis-NIR spectrophotometer, and photoluminescence spectra were recorder using a Photon Technology International setup, model: P21LRXS-LNN-NS-17. SEM images were made using a SEM-FEG HR (JEOL 6700F), ToF SIMS profiles were obtained using TOF.SIMS 5 ION-TOF and argon clusters were used for in-depth sputtering. XPS spectra were recorded using a K-Alpha ThermoFisher Scientific spectrometer and the in-depth profiles were obtained by etching the surface with argon ions. The work function was measured using a Kelvin probe station. UPS was performed using a PHOIBOS 100 hemispherical energy analyzer, equipped with the SPECS UVS 10/35 light source. All the characterization procedures were performed in a controlled atmosphere or on the encapsulated samples.
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