Xe 100e psia

The size and morphology of the synthesized nanoparticles were analyzed using transmission electron microscopy (TEM, FEI 120 kV), field emission scanning electron microscopy (FESEM, FEI Quanta 200FEG), as well as atomic force microscopy (AFM, XE‐ 100E PSIA). Energy dispersive X-ray spectrometry (EDX) was used to determine the elemental composition of nanoformulations. EDX spectra were analyzed using a vector-based algorithm to determine the relative abundance of carbon (C), iron (Fe), oxygen (O), nitrogen (N) and gold (Au) elements. FTIR spectra were recorded with an infrared microscope (Bruker, Tensor 27, USA). UV–Vis absorption spectra were recorded using a UV–Vis spectrophotometer (T80 double beam spectrophotometer, PG Instruments Limited). In addition, X-ray diffraction (XRD) analysis was performed using a powder X-ray diffractometer system (Malvern, PANalytical) to study the crystallographic structure of nanoparticles. Dynamic light scattering (DLS) (Malvern Instruments, Worcestershire, UK, ZEN 3600 model Nano ZS) was used for the size distribution and surface charge. Monitoring the particle size for 30 was used of physical stability.

Transmission electron microscopy (TEM, FEI 120 kV), field emission scanning electron microscopy (FESEM, FEI Quanta 200FEG) and atomic force microscopy (AFM, XE‐100E PSIA) were used to identify the size and morphology of the nanoparticles. For energy dispersive X-ray (EDX) mapping, a Supra 35VP Leo EDX instrument was used. The hydrodynamic size distribution and surface charge were characterized by a Nano/zetasizer (Malvern Instruments, Nano ZS). FI-IR spectra were obtained on an infrared microscope (Bruker, Tensor 27). Thermal stability was determined by thermogravimetric analysis (TGA) (Linseis STA PT 1000). UV–vis absorption spectra was acquired on a UV/Vis spectrophotometer (T80 double beam spectrophotometer, PG Instruments Limited). A powder X-ray diffractometer system (Malvern, PANalytical) was used for determining XRD patterns. X-ray photoelectron experiments were performed using a mono-chromatized Al K α X-ray source (Thermo Scientific).