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47 protocols using jem 2100f

1

Characterization of MoS2/RGO Nanocomposite

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The crystal structure of MoS2/RGO was characterized by X-ray diffraction (XRD) (Bruker D8 Advance, with Cu-Kα radiation). The morphology of MoS2/RGO was observed by transmission electron microscopy (TEM, JEM-2100F, Japan) and field emission scanning electron microscopy (FE-SEM, S-4800, Hitachi, Japan). The surface properties of MoS2/RGO were recorded using a Fourier Transform Infrared (FT-IR) spectrometer (Bruker-V Vertex 70, Karlsruhe, Germany). Raman Detection of samples was with a Raman Spectrometer (Raman spectrometer, Horiba Company, iHR550, Shanghai, China). The chemical composition of the main elements was studied by X-ray photoelectron spectroscopy (XPS K-Alpha+, Thermo Fisher Scientific, Waltham, MA, USA). The I–V curves of the sensors were tested by an electrochemical workstation (CIMPS-2, ZAHER ENNIUM) at room temperature.
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2

Comprehensive Characterization of Porous Carbon Nanofibers

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Morphology and elemental distribution of the samples were examined by SEM (Hitachi S-4800) and TEM (JEM-2100F). Crystal structure characterization was investigated using Bruker XRD with Cu Kα radiation between 10° and 90°. The graphitization degrees and the defect characteristics of the PCNFs were checked by Raman spectrometer with an excitation wavelength of 532 nm. The molecular chain structures were analyzed by FTIR (Nicolet iS10). The surface areas, pore volumes, and pore size distribution of the PCNFs were measured with Brunauer–Emmett–Teller analyzer (ASAP 2460, Micromeritics, Co. USA). The thermal decomposition process were determined by TGA (SDT Q600) in N2 atmosphere at the heating rate of 5 °C min−1 from room temperature to 800 °C and the CO2 adsorption properties of the samples were examined at 25 °C in CO2 atmosphere. The conductivity of the PCNF films was tested by a four-probe tester (ST-2258C) according to the standard of JJG508-87. The porosity was determined with a weighing method by infiltrating the film in tert- butanol solution. The UV-Vis absorption spectra was performed by U-3900 Hitachi spectrophotometer.
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3

Structural and Magnetic Characterization of Fe3O4@Chl/Fe Nanomaterials

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Transmission electron microscopy (Hitachi 7500 and JEM-2100F) was used to determine the structures of the nanomaterials. The Fe3O4@Chl/Fe CNPs solution on a grid coated with a hole-containing carbon support film was blotted dry with filter paper to leave a thin film of particle suspension in the wells. Immerse the grid in liquid ethane cooled by liquid N2. Fluorescence spectrum (Biotek Synergy H1) and UV–Visible Spectrophotometer (JASCO V-730, Japan) were used to measure the fluorescence and absorption of the Fe3O4@Chl/Fe-related samples. The particle sizes and zeta potentials (Horiba SZ-100, Japan) measured the samples dispersed in an aqueous solution. Thermogravimetric analysis (TGA, TA-Q50, USA) and AAS (SensAA GBC, Australia) were utilized for measuring the organic and metal composites of Fe3O4@Chl/Fe nanoparticles. FT-IR spectrometer (JASCO FT/IR-4700), X-ray diffractometer (XRD, Bruker D8 Discover, Karlsruhe, Germany), and Raman spectra were performed to analyze the surface and crystal structures of samples. Micro-Raman spectroscopy equipped with a 785 nm laser (DPSSL Driver II, 10 mW) and an MRS-iHR320 modular Raman system was integrated into an Olympus BX53 microscope. A superconducting quantum interference device vibrating sample magnetometer (SQUID, MPMS 3 Quantum Design, USA) was used for measuring the magnetism of Fe3O4@Chl/Fe nanoparticles.
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4

Comprehensive Nanofiber Characterization Techniques

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X-ray diffraction (XRD) data were collected on a Bruker D8 X-ray diffractor using Cu Kα radiation (λ = 1.5406 Å). The morphologies of the prepared nanofibers were characterized by scanning electron microscopy (SEM, SU8010, Hitachi, Japan) and transmission electron microscopy (TEM, JEM-2100F, Japan). X-ray photoelectron spectroscopy (XPS) was employed on a Multilab 2000 to investigate the valence states of the surface atoms. Nitrogen adsorption–desorption isotherms (BET) were obtained on a Micromeritics ASAP 2460 instrument. Thermo-gravimetric measurement (TGA) was conducted on a STA 449 F3 Jupiter thermogravimetric analyzer (Netzsch, German).
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5

Nanoparticle Characterization Protocol

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The particle size and morphology of the PDA NPs were characterized by transmission electron microscopy (TEM, JEM‐2100F, Japan) and scanning electron microscopy (SEM, SU8020, Hitachi, Japan). The hydrodynamic size was measured using dynamic light scattering (DLS, Zeta Plus, Brookhaven, USA). Ultraviolet‐visible (UV–vis) absorption spectra were recorded on a UV–Vis–NIR spectrophotometer (UV‐3600, Shimadzu, Japan). Electron spin resonance (ESR) spectroscopy was carried out using an ESR spectrometer (Bruker EMX, USA).
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6

Comprehensive Structural Characterization

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The structures of the samples were measured by X-ray diffraction (XRD) on a Philips X’ Pert Super diffractometer with Cu Kα (λ = 1.54182 Å), and Raman spectroscopy was performed by a JYLABRAM-HR Confocal Laser Micro-Raman spectrometer at 532 nm. The morphologies of the samples were characterized on scanning electron microscopy (SEM, JEOL-JSM-6700F), transmission electron microscopy (TEM, Hitachi H7650) and high-resolution transmission electron microscopy (HRTEM, JEM-2100F). The surface areas and pore size distribution of the samples were obtained by BEL SORP-max machine (BEL, Japan). Thermogravimetric analysis (TGA) was carried out on Shimadzu TGA-50H. The FTIR spectra is tested on Fourier transformed infrared spectrometer (Hyperion 3000). X-ray photoelectron spectroscopy (XPS) was collected on an ESCALAB 250 X-ray photoelectron spectrometer (PerkinElmer).
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7

Comprehensive Materials Characterization

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The morphology and composition of the materials are characterized by scan electron microscopy (SEM, Hitachi S-4800), transmission electron microscopy (TEM, JEM-2100F) equipped with energy-dispersive X-ray spectroscope (EDS) detectors and high-resolution TEM (HRTEM). X-ray diffraction (XRD, Bruker D2 phaser) with Cu-Kα radiation measurements are carried out to examine the crystal phase of the samples. X-ray photoelectron spectrometer (XPS, PHI5600) is used to obtain the photoelectrically spectroscopy. Thermogravimetric analysis (TGA, Pyris Diamond) is carried out to verify the temperature of calcination. Nitrogen adsorption–desorption measurements are implemented on a Quadrachrome adsorption instrument (Autosorb-iQ3; Quantachrome, America) at 77 K. The pore-size distribution is calculated based on the Barrentt–Joyner–Halenda (BIH) method.
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8

Comprehensive Characterization of Novel Nanomaterials

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The morphology was studied by the scanning electron microscopy (SEM, Hitachi S-4800) and the transmission electron microscopy (TEM, JEM-2100F, Japan) techniques. X-ray diffraction (XRD) measurements were performed on a Philips diffractometer, which was composed of a quartz monochromator, a Cu Kα radiation source at a scan rate of 5° min−1 and a goniometric plate. Fourier transform infrared (FT-IR) spectroscopy data were obtained in the range from 1500 to 800 cm−1 using a Bruker Vector 22 spectrometer. Raman spectrum was recorded on a Raman spectrometer (DXR Microscope, Thermo Electron) using laser excitation at 532 nm. X-ray photoelectron spectroscopy (XPS) spectra were recorded on PERKINELMZR PHI 3056 using a polychromatic Al Kα X-ray source, wherein the binding energy was calibrated taking C 1s at 285.0 eV.
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9

Electron Microscopy of Cell Ultrastructure

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The cells were fixed in 2.5% glutaraldehyde and embedded with epoxy resin (Sigma-Aldrich, USA). The sample sections were stained with lead citrate (Sigma-Aldrich, USA) and assessed under the electron microscope (JEM-2100F, Hitachi, Japan).
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10

Nanoparticle Characterization by TEM and Spectroscopy

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The size, morphology, and structure of NOPs were studied by using JEOL JEM-2100F and Hitachi H800 transmission electron microscope (TEM) with an accelerating voltage of 200 and 175 kV, respectively. The UV-Vis-NIR extinction spectra were recorded using a Lambda 950 (PerkinElmer) Spectrometer. The purification of NOPs was performed by using Eppendorf Centrifuge 5430R at 25°C. X-Ray diffraction (XRD) measurements of NOPs solutions drop-coated onto glass substrates were done on Empyrean (PANalytical B. V.) operating at a voltage of 40 kV.
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