Jem 2100f
The JEM-2100F is a field-emission scanning electron microscope (FE-SEM) produced by Hitachi. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials and applications. The JEM-2100F features a field-emission electron gun, which produces a stable, high-brightness electron beam, allowing for detailed observation and characterization of samples at the nanometer scale.
Lab products found in correlation
47 protocols using jem 2100f
Characterization of MoS2/RGO Nanocomposite
Comprehensive Characterization of Porous Carbon Nanofibers
Structural and Magnetic Characterization of Fe3O4@Chl/Fe Nanomaterials
Comprehensive Nanofiber Characterization Techniques
Nanoparticle Characterization Protocol
Comprehensive Structural Characterization
Comprehensive Materials Characterization
Comprehensive Characterization of Novel Nanomaterials
Electron Microscopy of Cell Ultrastructure
Nanoparticle Characterization by TEM and Spectroscopy
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