Samples were mixed with deionized water to achieve ~60% of total moisture content and equilibrated at ambient temperature (~25 °C) for 24 h. A small-angle X-ray scattering diffractometer (NanoSTAR, Bruker AXS Inc., Madison, WI, USA), equipped with a Vantec 2000 detector (Bruker, Berlin, Germany) and pinhole collimation for point focus geometry, were used for sample lamellar structure analysis, as described elsewhere [19 (link)]. The average repeat distance (i.e., thickness of the semicrystalline lamellae) of the amorphous and crystalline lamellar of each sample was calculated as d = 2π/q, where d (nm) is the lamellar repeat distance and q (nm−1) is the scattering vector, with q = (4π sinθ)/λ, where λ (nm) is the X-ray wavelength and 2θ is the scattering angle.
Vantec 2000 detector
Manufactured by Bruker
Sourced in United States, Germany
The Vantec 2000 is a high-performance X-ray detector developed by Bruker. It is designed for demanding X-ray diffraction applications, providing fast data acquisition and high signal-to-noise ratio.
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Lab products found in correlation
2 protocols using vantec 2000 detector
1
Analyzing Lamellar Structure of Materials
2
SAXS Characterization of Nanomaterials
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SAXS measurements were conducted on a NanoSTAR system (Bruker, Germany) equipped with a Vantec-2000 detector (active area 140 140 mm 2 and pixel size 68 68 μm 2 ) and a pinhole collimator for point focus geometry, operated at 50 kV and 30 W, using Cu-Kα radiation with a wavelength of 0.1542 nm as the X-ray source. The scattering vector (q) was defined as q = 4π sin θ/λ (where 2θ is the scattering angle and λ is the wavelength of the X-ray source) [28] . The data in the region of 0.014 < q < 0.20 Å -1 was used as the SAXS patterns, and was background-subtracted and normalized using the integrated Bruker software. The data analysis was done using DIFFRAC plus NanoFit software.
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