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34 protocols using scanasyst air cantilever

1

Characterization of PEI-coated SPIONs

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PEI-coated
SPIONs were prepared by a ligand exchange method as explained in our
previous work.26 (link) This sample was directly
used for DLS (dynamic light scattering) and zeta potential measurements.
Atomic force microscopy (AFM) analysis was performed on a Bruker Dimension
Icon in the ScanAsyst mode in air with ScanAsyst-Air cantilever (Bruker,
U.S.A., k = 0.4 N/m, frequency = 70 kHz). The samples
were diluted with ethanol, sonicated, and drop-cast on a silicon wafer
for analysis. Eighty percent of the total product mass (PEI-SPION)
was determined as PEI by thermogravimetric analysis performed on dried
samples.
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2

Atomic Force Microscopy of Mica-Deposited Samples

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30 μL of a sample solution was deposited onto a V-1 quality muscovite mica disc (Electron Microscopy Sciences) freshly cleaved using adhesive tape. The mica was incubated in a Petri dish for 30 min, rinsed with 1 mL of deionized water, and then dried initially with compressed air. The mica was further dried overnight at room temperature and protected from dust contamination. The prepared sample was measured in air using a Multimode 8 atomic force microscope equipped with a SCANASYST-AIR cantilever (Bruker Instruments) operated in soft tapping mode.
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3

Topographical Analysis of Dried Membranes

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Dried freestanding membranes were imaged using a MultiMode STM microscope controlled by the NanoScope III from Digital Instruments system (Bruker, France) operating in intermittent contact mode. A ScanAsyst-Air cantilever (Bruker, France) with a resonance frequency of 320 kHz and a spring constant of 2 N/m was used. Substrate topographies were imaged with 512 × 512 pixels2 at line rates of 1 Hz. For surface roughness analysis, 5 × 5 μm2 AFM images were obtained and the root means squared roughness (RRMS) and average height value (Hav) from the principal x−y plane was calculated. The analysis of the images was performed using Gwydion. At least three measurements were performed in different specimens.
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4

Atomic Force Microscopy of Mica-Deposited Samples

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30 μL of a sample solution was deposited onto a V-1 quality muscovite mica disc (Electron Microscopy Sciences) freshly cleaved using adhesive tape. The mica was incubated in a Petri dish for 30 min, rinsed with 1 mL of deionized water, and then dried initially with compressed air. The mica was further dried overnight at room temperature and protected from dust contamination. The prepared sample was measured in air using a Multimode 8 atomic force microscope equipped with a SCANASYST-AIR cantilever (Bruker Instruments) operated in soft tapping mode.
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5

Quantitative 3D Cellular Topography Analysis

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AFM technology offers a useful tool for direct measurements of cell 3-D surface topography and elastic property.42 (link),51 (link)-53 For the purpose of 3-D topography, several glass coverslips were put into the culture petri dish before adding the synchronization agents, so that the synchronized HeLa cells would grow on these glass coverslips. Immediately prior to imaging, 10 mL of 1% glutaraldehyde was added for 10 minutes to fix HeLa cells on the glass substrate. Then, cells were washed twice with PBS, and imaged by an AFM (Nanowizard II, JPK, Berlin, Germany) in a PBS environment. An optical transmission microscope (IX81, Olympus, Japan) was used with the AFM to conveniently select the cell of interest and accurately position the cantilever tip above the cell surface. The 3-D topography images were acquired in tapping mode using a ScanAsyst-Air cantilever (a spring constant of ~0.4 N/m; Bruker Nano Inc., Camarillo, CA, USA) with a scanning size of 50 × 50 um2 and a scanning rate of 0.5 Hz.51 (link) All measurements were performed at room temperature, and at least 8 images were obtained for HeLa cells synchronized at each phase.
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6

Topographical Analysis of Platelets

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The surface topography has been determined by atomic force microscopic measurements. The images were acquired with a Dimension Icon (Bruker Nano Inc.) in PeakForce tapping mode in air. ScanAsyst Air cantilever (Bruker Nano Inc.) with a typical spring constant of 0.4 N/m and a resonant frequency of 70 kHz has been used. The PeakForce amplitude has been 60 nm and the PeakForce frequency has been 2 kHz. The AFM images were processed with NanoScope Analysis 1.80 (Bruker Nano Inc.). The topography was flattened by subtracting a first-order polynomial background using a threshold to exclude platelets from flattening. Platelet heights were determined by means of “step tool” in NanoScope Analysis software. The samples were prepared by slow evaporation of a few drops of a diluted suspension (0.02 g/liter) on a Si wafer under ambient conditions.
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7

Biofilm Topography: DNase I Impact

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The topography of the bio lms with and without DNase I treatment (12 h) was investigated using a MultiMode 8 AFM with a NanoScope V controller (Bruker). The scanning modes used were as follows: 1) ScanAsyst mode using ScanAsyst-Air cantilevers with 0.4 N m -1 nominal spring constant (Bruker) and 2) tapping mode using RTESP cantilevers with 40 N m -1 nominal spring constant (Bruker) [39] . A scan size of 10×10 μm was used. Images were processed and analysed using NanoScope Analysis (Bruker).
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8

Atomic Force Microscopy of Nanoparticles

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10 μL nanoparticle aliquots were spotted on mica substrates at a concentration of 100 μg/mL (AGG250-1, Agar Scientific, Stansted, UK) and dried at RT. Sample topography was obtained in air using a Bruker BioScope Catalyst (Bruker Instruments, Santa Barbara, CA, USA) AFM. Bruker ScanAsyst-Air cantilevers were used, with a nominal spring constant of 0.4 N/m and a nominal resonant frequency of 70 kHz. All imaging was conducted using Peak Force Tapping (PFT) in ScanAsyst Mode. Images were processed with first-order flattening and planefit using Bruker Nanoscope Analysis 1.5, the height of the particles was calculated using freeware AFM software WsXM 5.0 [65 (link)].
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9

Characterization of Fabricated Films

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The 3D topography and thickness of both films were analyzed using a Dimension Edge atomic force microscopy (Bruker Corporation, Billerica, MA, USA) coupled with ScanAsyst-Air cantilevers (Bruker Corporation, Billerica, MA, USA) at a 0.4 N/m nominal spring constant. The measurement of the film’s surface roughness was calculated using NanoScope Analysis 1.7 software (Bruker Corporation, Billerica, MA, USA). The functional groups of the fabricated films were examined using Fourier-transform infrared (FTIR) spectroscopy (Model: Spectrum 100, Perkin Elmer, Waltham, MA, USA). The surface morphology and composition of both films were measured using an energy dispersive X-ray (EDX) spectroscopy on a scanning electron microscope (SEM) (Model: S-3400N, Hitachi, Tokio, Japan).
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10

Mapping Flat PDMS Stamp Topography

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A Bruker Dimension Icon scanning probe microscope (Bruker Nano, Santa Barbara, CA, USA) was used to map the topography and mechanical properties of flat PDMS stamps patterned with Au–alkanethiolate monolayers. The AFM images of the PDMS stamps (flat and patterned) were measured using the peak force quantitative nanomechanical property mapping mode. ScanAsyst-Air cantilevers (Bruker, spring constant = 0.4 ± 0.1 N/m) were calibrated with a clean piece of silicon before each measurement. A peak-force set-point between 200 and 400 pN was maintained, except where otherwise indicated. These conditions enabled sufficient contact between tips and samples for imaging, while minimizing the load from the cantilever applied to the PDMS.
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