1H NMR was recorded on an Agilent 400 MHz NMR spectrometer. The mass spectrum was obtained with an Agilent-1100 LC/MSD mass spectrometer. The morphology of exfoliated montmorillonite 2D nanosheets was observed by a FEI JEM-1200EX transmission electron microscope (TEM). The thickness of 2D nanosheets was measured using Bruker Dimension Icon atomic force microscope (AFM). The surface and cross-sectional morphology of the stacked layered films were observed using a FEI Quanta FEG 250 environmental scanning electron microscope (SEM). An Ultima IV X-ray diffraction meter (Rigaku Corporation, Japan) was used to determine the interlayer spacing of layered film. The UV-visible absorption and diffuse reflection spectra were recorded using a UV-3600 spectrometer (Shimadzu, Japan). The Fourier transform infrared (FTIR) spectra were measured on a Nicolet 6700 spectrometer (Thermo).
Ultima 4 x ray diffraction meter
The Ultima IV X-ray diffraction meter is a versatile laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to provide detailed information about the atomic and molecular structure of a wide range of samples. The core function of the Ultima IV is to measure and analyze the diffraction patterns produced when a sample is exposed to X-rays, enabling researchers to identify and characterize the crystalline phases present in their materials.
Lab products found in correlation
2 protocols using ultima 4 x ray diffraction meter
Characterization of 2D Montmorillonite Nanosheets
1H NMR was recorded on an Agilent 400 MHz NMR spectrometer. The mass spectrum was obtained with an Agilent-1100 LC/MSD mass spectrometer. The morphology of exfoliated montmorillonite 2D nanosheets was observed by a FEI JEM-1200EX transmission electron microscope (TEM). The thickness of 2D nanosheets was measured using Bruker Dimension Icon atomic force microscope (AFM). The surface and cross-sectional morphology of the stacked layered films were observed using a FEI Quanta FEG 250 environmental scanning electron microscope (SEM). An Ultima IV X-ray diffraction meter (Rigaku Corporation, Japan) was used to determine the interlayer spacing of layered film. The UV-visible absorption and diffuse reflection spectra were recorded using a UV-3600 spectrometer (Shimadzu, Japan). The Fourier transform infrared (FTIR) spectra were measured on a Nicolet 6700 spectrometer (Thermo).
Comprehensive Characterization of GO Nanosheets
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