The crystalline phases were identified by X-ray powder diffraction using a Bruker D8 Advance X-ray diffractometer (θ-θ equipped with a LINXEYE detector (Bruker, Karlsruhe, Germany), using Cu Kα radiation. Patterns were recorded in the 15° ≤ 2θ ≤ 80° range with 2.4°/min scanning rate.
The microstructure of the sintered samples was investigated by scanning electron microscopy (SEM-FEG, Carl Zeiss Sigma NTS GmbH, Oberkochen, Germany), embedding the cross sections in epoxy resin and then polishing them down to 0.25 µm finish. The grain size distributions of the sintered samples were calculated via image analysis of the SEM micrographs using ImageJ software (Java, ORACLE, Redwood City, CA, USA).