PXRD patterns were obtained using a Rigaku MiniFlex diffractometer (Neu-Isenburg, Germany; 30 kV, 15 mA, scan speed: 2° min−1, step size: 0.02°). FTIR spectra were measured on a Nicolet iS10 FTIR spectrometer with KBr pellets (Thermo Fisher Scientific, Waltham, Massachusetts, USA). DSC and TGA was performed using DSC (DSC 214 polyma, NETZSCH, Burlington, MA, USA), and TGA (TG 209 F3 Tarsus®, NETZSCH, Burlington, MA, USA), respectively. The surface morphology and elemental composition of PUFs were characterized using SEM-EDS (FE-SEM, JEOL JSM-5800F, Peabody, MA, USA) and TEM (JEOL JEM-2100F, Peabody, MA, USA). Degradation of PU@Cu-BTC was tested by inductively coupled plasma mass spectrometry (NexION 350D, Perkin-Elmer SCIEX, Waltham, MA, USA). The fluorescence intensity was read with a microplate reader (Synergy H1, BioTek, Winooski, VT, USA) and the stained cells were imaged by a fluorescent microscope (IX83, Olympus, Center Valley, PA, USA).
Jsm 5800f
Manufactured by JEOL
Sourced in United States
The JSM-5800F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials and applications. The JSM-5800F features a high-performance electron optical system, advanced image processing and analysis software, and a user-friendly interface.
Automatically generated - may contain errors
Lab products found in correlation
Miniflex diffractometer, by Rigaku (3 mentions)
Kbr pellets, by Thermo Fisher Scientific (2 mentions)
Nicolet is10 ft ir spectrometer, by Thermo Fisher Scientific (2 mentions)
Synergy h1, by Agilent Technologies (2 mentions)
Dsc 214 polyma, by Netzsch (2 mentions)
Tg 209 f3 tarsus instrument, by Netzsch (2 mentions)
Marker 7700, by Agilent Technologies (2 mentions)
Jem 2100f, by JEOL (1 mentions)
Tg 209 f3 tarsus, by Netzsch (1 mentions)
Microplate reader, by Agilent Technologies (1 mentions)
Invenio r, by Bruker (1 mentions)
Eclipse ni u, by Nikon (1 mentions)
Fts 135 spectrometer, by Bio-Rad (1 mentions)
4 protocols using jsm 5800f
1
Comprehensive Physicochemical Characterization of PUF
2
Characterization of Cu-BTC Metal-Organic Frameworks
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The PXRD patterns of the Cu-BTCs were recorded using a Rigaku MiniFlex diffractometer (Rigaku Corp., Neu-Isenburg, Germany). FTIR spectra were measured on a Nicolet iS10 FTIR spectrometer with KBr pellets (Thermo Fisher Scientific, Waltham, MA, USA). TGA was performed using a TG 209 F3 Tarsus® instrument (NETZSCH, Burlington, MA, USA). The surface morphology and elemental composition of Cu-BTC were characterized using SEM-EDS (FE-SEM, JEOL JSM-5800F, Peabody, MA, USA). N2 adsorption isotherms were obtained by using a BELSORP-mini II instrument (BEL Japan, Inc., Tokyo, Japan). High-purity (99.999%) gases were used throughout the adsorption experiments. All samples were activated by rinsing them thoroughly, followed by drying under vacuum for 24 h prior to the gas sorption measurements.
3
Characterization of Metal-Organic Frameworks
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The PXRD patterns of the MOFs were recorded using a Rigaku MiniFlex diffractometer (Rigaku Corp., Neu-Isenburg, Germany). FT–IR spectroscopy was performed using an INVENIO-R (Bruker, Billerica, MA, USA). The surface morphologies of the MOFs were characterized by SEM (JSM-5800F, JEOL, Tokyo, Japan). Inductively coupled plasma mass spectrometry (ICP–MS, Agilent Marker 7700, RF Generator Power 1550W, Tokyo, Japan) measurements were performed in the Seoul Center of the Korea Basic Science Institute. The fluorescence intensity was read with a microplate reader (BioTek, Winooski, VT, USA), and the stained cells were imaged by a fluorescence microscope (ECLIPSE Ni-U, Nikon Co., Tokyo, Japan).
4
Comprehensive Materials Characterization of Cu-MOF Scaffolds
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PXRD patterns of Cu-MOF, PS, and PS@Cu-MOF were recorded using a Rigaku MiniFlex diffractometer (Rigaku Corp, Neu-Isenburg, Germany). The FT-IR spectrum was measured on a Bio-Rad FTS 135 spectrometer (Hercules, CA, USA). DSC runs were carried out using a DSC 214 Polyma (NETZSCH, Burlington, MA, USA). TGA was performed using a TG 209 F3 Tarsus® instrument (NETZSCH, Burlington, MA, USA). The surface morphology and elemental composition of PS and the PS@Cu-MOF scaffolds were characterized using SEM-EDS (FE-SEM, JEOL JSM-5800F, Peabody, MA, USA). The mechanical properties of PS and PS@Cu-MOF were evaluated using a TA rheometer (Discovery HR 10, New Castle, DE, USA). The degradation of PS@Cu-MOF was carried out by ICP-MS (Agilent Marker 7700, RF Generator Power 1550 W, Tokyo, Japan). The colorimetric absorbance was determined using a microplate reader (Synergy H1, BioTek, Winooski, VT, USA), and the live/dead double-stained cells were imaged by fluorescence microscopy (IX83, Olympus, Center Valley, PA, USA).
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