2000fx electron microscope

Transmission electron microscopy (TEM) observations were performed on a JEOL 2000FX electron microscope at an acceleration voltage of 200 kV. All TEM samples were prepared on graphene oxide (GO)-coated carbon grids (lacey carbon or Quantifoil R2/2) which allows high contrast TEM images to be acquired without staining.^{42 (link)} Generally, a drop of sample (20 μL) was pipetted on a grid, blotted immediately and left to air dry.
Cryogenic transmission electron microscopy (cryo-TEM) was performed on a Tecnai G2 12 Twin TEM equipped with a Gatan CCD camera at an acceleration voltage of 120 kV. The temperature of the cryo stage was maintained below –170 °C during imaging. For sample preparation, 5 μL of the sample was deposited onto a lacey carbon grid, blotted immediately and vitrified by plunging into liquid ethane.

TEM images were performed using a JEOL 2000-FX electron microscope, operating at 200 kV accelerating voltage. The samples were prepared by drop-casting the respective n/p-nanohybrids (1.5 × 10⁻⁴ M) on a carbon film 200 square mesh copper grid (CF200-Cu). TEM images were obtained after drying the sample by air for 24 hours.