Flame spectrometer

p- and s-polarization
reflectance measurements have been carried out over an ellipsometric
setup (M2000 from Woollam), using a Xe lamp as a source. We then carried
out a reflectance spectroscopic investigation using the LED flash
lamp of a smartphone as a light source and collected the unpolarized
reflectance spectrum at many angles (in the main paper we show only
the most significant of them) using an Ocean Optics Flame spectrometer.

Organic semiconductor films and devices were fabricated by vacuum-deposition processing (<6 × 10^‒7 torr) using an Angstrom Engineering EvoVac 700 system. Current density, voltage and electroluminescence characteristics were measured using a Keithley 2400 sourcemeter, Keithley 2000 multimeter and calibrated silicon photodiode. The EL spectra were recorded by an Ocean Optics Flame spectrometer. Magneto-EL measurements were performed with Andor spectrometer (Shamrock 303i and iDus camera) for modulation of EL in presence of magnetic field applied by GMW 3470 electromagnet.

The PeLEDs were driven by a Keithley 2450 source-meter as a voltage source in ambient air without encapsulation. The luminance, CE and EQE were collected with an Ocean Optics Flame spectrometer and an integrating sphere. Calibration of the spectrometer was done as reported in our previous work^{50 (link)}. The luminance was cross-checked using a luminance meter (Konica Minolta, CS-200).

The SEM analysis was undertaken with
a Hitachi SU-70 scanning electron microscope. The transmission electron
microscopy images of the as-synthesized NRs and device cross-section
were characterized using a JEOL JEM-2100F transmission electron microscope
(TEM) with 200 keV electron beam energy; the device cross sections
were characterized by an FEI Helios G4 CX microscope operated at 5–10
kV. The absorption spectra of the nanocrystals were measured using
a Cary Series UV–vis–NIR spectrophotometer. The room
temperature PL spectrum of the NRs in toluene was collected by an
Ocean Optics 2000+ spectrometer under an excitation wavelength of
405 nm. The absolute photoluminescence quantum yield of the NR film
was measured by using an integrating sphere coupled with an Ocean
Optics Flame spectrometer.
The current–voltage–luminance
characteristics were measured using a Keithley 2602B source, Thorlabs
4P3 integrating sphere, and an HMO3004 oscilloscope coupled to a calibrated
PDA200C photodiode amplifier from Thorlabs. The EQE was calculated
as the ratio of the photon flux and driving current of the device.
The electroluminescence (EL) spectra of the devices were obtained
by using an Ocean Optics HR4000+ spectrometer. Time-resolved PL (TRPL)
measurements were carried out with a PicoQuant MicroTime 200 STED
system, utilizing a 405 nm excitation light source.

For the fabrication of OLED devices, indium-tin-oxide-coated substrates (~15 Ω cm^–2) were cleaned with acetone and isopropyl alcohol, and then O₂ plasma treatment was applied to align the energy level with a hole-transporting layer. All the layers, including the organic layers and a LiF/aluminium cathode, were thermally deposited in a high vacuum (~10⁻⁷ torr). The performance of the OLED devices was measured by a Keithley 2635 source meter and a calibrated Si photodiode. The EL spectra were recorded by an Ocean Optics Flame spectrometer.

PfCopC was dialysed into 20 mM pH 6.6 phosphate buffer and prepared as 230–500 µM protein samples copper loaded with 0.8 equivalents of CuCl₂. The samples were reduced with 1 mM ascorbate or 2.5 mM DTT at room temperature and loaded into 1 cm quartz cuvettes. Absorption spectra and tryptophan fluorescence spectra were measured every 5 min for at least 2 h on a Cary 50 (Varian) spectrometer. For anaerobic measurements, PfCopC was overlaid with argon for 2 min and transferred to an anaerobic glove box. The remaining oxygen was removed by gas exchange while stirring for 1.5 h. The sample was reduced with 1 mM ascorbate and loaded into 1 cm quartz cuvettes. The absorbance at 600 nm was measured every 5 min for 2 h on a FLAME spectrometer (Ocean Optics).

OLED devices were fabricated by high-vacuum (10⁻⁷ Torr) thermal evaporation on ITO-coated glass substrates with a sheet resistance of 15 Ω/⎕. Substrates were cleaned by sonication in non-ionic detergent, deionised water, acetone and isopropyl alcohol and subjected to an oxygen plasma treatment for 10 min. Layers were deposited at rates of 0.1–2 Ås⁻¹. o-CBP was synthesized according to the literature procedure^{34 (link)}. TAPC, TCP and UGH2 were purchased from Luminescence Technology Corp. TPBi, DPEPO and TSPO1 were purchased from Shine Materials. All purchased materials were used as received. OLED current density–voltage measurements were made using a Keithley 2400 source-meter unit. The luminance was measured on-axis using a 1-cm² calibrated silicon photodiode at a distance of 15 cm from the front face of the OLED. Electroluminescence spectra were measured using a calibrated OceanOptics Flame spectrometer. Lifetime measurements were measured with a Keithley 2400 source-meter unit and a 0.75-cm² silicon photodiode. The devices were held under rough vacuum (~10⁻³ Torr).