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X pert pro mpd system

Manufactured by Malvern Panalytical

The X'pert PRO MPD system is a versatile and high-performance X-ray diffractometer designed for materials analysis. It provides accurate and reliable data on the structural properties of a wide range of materials, including crystalline solids, ceramics, and thin films. The system features advanced optics and detection technologies to deliver precise and detailed diffraction patterns. It is a powerful tool for applications such as phase identification, quantitative analysis, and structural characterization.

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6 protocols using x pert pro mpd system

1

Synthesis and Characterization of Pyridine-based Dye

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(pyridin-3-yl)methyl 4-(2-(4-((pyridin-3-yl)methoxy)phenyl)diazenyl)benzoate (L1) was prepared according to the literature method [55 (link)]. All other chemicals and reagents were obtained from commercial sources and used as received. Infrared (IR) spectra were recorded with a Varian 800 FT-IR spectrometer (Varian, Inc., Palo Alto, USA) (4000–400 cm−1). Powder X-ray diffraction (PXRD) was performed using a PANalytical X’Pert PRO MPD system (PANalytical B.V., Almelo, Holland).) (PW3040/60). Field emission scanning electron micrographs (SEM) were obtained with a JSM 6701F microscope (Japan Electronics Co., Ltd, Tokyo, Japan). Atomic force microscopy (AFM) images were obtained on a dimension edge microscope (Bruker Nano Inc., Santa Barbara, CA, USA) equipped with a tapping mode. Thermal analyses were performed with a Netzsch STA-449F3 thermogravimetric analyzer (Netzsch, Co., Selb, Germany) at a heating rate of 10 °C min−1 and a flow rate of 20 cm3·min−1 (N2). Simultaneous inductively coupled plasma optical emission spectrometry (ICP-OES) on a PerkinElmer Optima 8000 instrument (PerkinElmer Inc., Waltham, USA) was used for simultaneous determination of the target elements.
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2

Characterization of Ribavirin Polymorphs

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Cryogenically ground binary microparticles were characterized using powder X-ray diffraction (PXRD) and DSC to ensure that mechanical sizing of the solid suspensions did not result in transformation of crystalline ribavirin to a metastable solid phase [32 (link)]. An X’Pert Pro MPD system (PANalytical B.V., Almelo, The Netherlands) was used to generate X-rays at a voltage of 45.0 kV and amperage of 40.0 mA. The instrument was equipped with a Cu anode (λ = 1.5406 Å), an auxiliary elliptical mirror, and an X’CeleratorTM detector (PANalytical B.V., Almelo, The Netherlands). Samples were loaded between 2 layers of Kapton® film (ChemPlex, Palm City, FL, USA) and rotated using the vertical transmission stage. The goniometer was set to allow consistent irradiation over 5–50°2θ in 0.017°2θ steps at 135 s/step.
The melting temperatures (Tm) of ribavirin polymorphs were measured using conventional DSC. Hermetically sealed aluminum sample pans containing 5.0 ± 0.5 mg of ribavirin were heated at either 2 °C/min or 40 °C/min to 200 °C [33 (link)]. Milled ribavirin:poloxamer microparticles were also analyzed using DSC, and the Tm for ribavirin in these samples was compared with those of the known polymorphs. All measurements were performed in triplicate and reported as mean values ± SD.
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3

Structural Characterization of MoVO Particles

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The crystal structure of MoVO particles was confirmed by XRD, which was performed using the Panalytical X’pert PRO MPD system. Cu Kα radiation (λ = 1.54 Å) was used, and a 2-theta range of 5° to 60° was scanned with 0.05° step size. Scanning electron microscopy and EDS mapping was conducted on a Carl Zeiss Supra 55 FESEM to examine morphology, size, and elemental distribution. A Carl Zeiss 1540EsB Crossbeam system was used for scanning electron microscopy (5 kV) and focused ion beam work (Ga ion, 30 kV). XPS was accomplished using Al Kα radiation in a PHI 5000 Versa probe system. XPS analysis was performed after Ar+ ion sputtering for ∼15 min to avoid interference from SEI or surface impurities. For ex situ studies, the samples were cycled for five cycles under galvanostatic condition at 100 mA g−1 and then held at a particular potential for 15 to 20 h. Afterward, the cells were opened to extract the electrode, thoroughly washed with deionized water, and dried for ∼2 h in a vacuum oven at ∼80 °C.
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4

Nanoparticle Characterization Techniques

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The synthesized nanoparticles were characterized through X-ray diffraction on an X’Pert PRO MPD system (PANalytical, Almelo, The Netherlands), by Scanning Electron Microscopy (SEM) using a model MIRA3 instrument (Tescan, Czech Republic), a Raman model Takram P50C0R10 (Teksan, Tehran, Iran) at 532 nm leaser wavelength, a model Tensor27 FT-IR instrument (Bruker, Optics GmbH, Ettlingen, Germany) and a model 1800 UV-Vis spectrometer (Shimadzu, Kyoto, Japan).
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5

Characterization of H2L Ligand Synthesis

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The ligand H2L was synthesized according to the literature method.30 All of the other reagents and chemicals were of an analytical grade and obtained from commercial sources. Powder X-ray diffraction (PXRD) data were collected on a PANalytical X’Pert PRO MPD system (PW3040/60). Fourier transform infrared (FT-IR) measurements were conducted on a Thermo Nicolet iS50 spectrometer. Scanning electron microscopy (SEM) images were taken on a Hitachi SU8010 instrument. X-ray photoelectron spectroscopy (XPS) data were obtained with a Thermo Escalab 250 spectrometer with monochromated Al-Kα excitation. The zeta potentials were determined using dynamic light scattering (DLS) on a Malvern Instruments Nanosizer-ZS. Thermogravimetric analysis (TGA) was carried out on a Netzsch STA-449F3 thermogravimetric analyzer under a nitrogen atmosphere at a heating rate of 10 °C min–1. Simultaneous inductively coupled plasma optical emission spectrometry (ICP-OES) on a PerkinElmer Optima 8000 instrument was used to determine the metal ion concentration in aqueous solution.
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6

X-ray Diffraction Analysis of Materials

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The X-ray diffraction (XRD) patterns were measured in a Panalytical X’pert PRO MPD system equipped with an X’celerator detector and a graphite monochromatic (Cu Kα1 radiation, 1.54056 Å). The diffraction patterns were recorded from 20° to 100° (2θ) with an angular step interval of 0.01.
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