The three-dimensional (3D) fluorescence spectra of Cav1 (5.0 × 10−9 mol/L) were recorded at 298 K in the absence and presence of TDD (5.0 × 10−7 mol/L) was measured on the F-4700 fluorescence spectrometer (Hitachi, Japan). The emission wavelength was performed between 300 nm and 420 nm with 5 nm interval. The excitation wavelength was recorded between 200 nm and 300 nm with 5 nm interval.
F 4700 fluorescence spectrometer
The F-4700 fluorescence spectrometer is a high-performance analytical instrument designed for the measurement of fluorescence intensity. It features a high-intensity xenon lamp, a monochromator for wavelength selection, and a photomultiplier tube detector to capture the emitted fluorescence signal. The F-4700 provides accurate and reliable data for a wide range of applications requiring fluorescence analysis.
Lab products found in correlation
5 protocols using f 4700 fluorescence spectrometer
Fluorescence Spectroscopy of Cav1-TDD Interactions
The three-dimensional (3D) fluorescence spectra of Cav1 (5.0 × 10−9 mol/L) were recorded at 298 K in the absence and presence of TDD (5.0 × 10−7 mol/L) was measured on the F-4700 fluorescence spectrometer (Hitachi, Japan). The emission wavelength was performed between 300 nm and 420 nm with 5 nm interval. The excitation wavelength was recorded between 200 nm and 300 nm with 5 nm interval.
Nanoscale Characterization of Quantum Dots
of the powder samples was obtained using a Rigaku Miniflex-600 diffractometer
having a Cu (Kα, λ = 1.5418 Å) source.
TEM images were obtained by a JEOL-2100F electron microscope (operating
voltage 200 KeV) by drop-casting the dispersed sample in toluene on
a carbon-coated copper grid (300 mesh). Raman spectra were obtained
by a Wi-Tec alpha300 RA system having an Ar laser source with wavelength
532 nm. For this measurement, QDs were dispersed in toluene solution
and drop-cast on a glass substrate. EDX analysis was carried out by
SEM, Zeiss EVO40 microscope in which an energy dispersive X-ray analyzer
was attached. UV–vis absorption spectra were observed using
a Hitachi U-3900 UV–vis spectrophotometer. PL and PLE spectra
were obtained by a Hitachi F-4700 fluorescence spectrometer. Fluorescence
decay spectra were acquired by time-correlated single-photon counting
(TCSPC) FL920, Edinburg Instruments, U.K. setup.
Comprehensive Materials Characterization
Characterization of CDs and CDs@Eu–AMP Nanomaterials
Comprehensive Material Characterization Protocol
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