SEM was performed with JEOL JSM 7001F at 10 kV to examine the morphologies of various samples. TEM images were taken with a high‐resolution JEOL 2100F operated at 200 kV. Raman spectra were collected with a Horiba HR800 Raman microscope using a 532 nm laser with a power of 5 mW. XRD characterization was performed on Rigaku D/max 2550. XPS measurements were performed with a Thermo ESCALAB 250XI instrument equipped with the energy standard of C1s = 284.8 eV binding energy for charge correction. Thermogravimetric analysis (TGA) was carried out with a NETZSCH STA 449F3 instrument at 10 °C min−1 under argon atmosphere. Differential scanning calorimetry (DSC) tests were evaluated with TA Q5000IR instrument at a ramping rate of 10 °C min between 40 and 400 °C. Specific surface area was measured with a Quantachrome 2000e BET surface analyzer.
Hr800 raman microscope
Manufactured by Horiba
Sourced in France
The HR800 Raman microscope is a high-resolution analytical instrument designed for Raman spectroscopy analysis. It provides precise measurements of the molecular structure and composition of samples through the detection and analysis of inelastically scattered light. The HR800 is capable of achieving high-quality Raman spectra with a wide range of excitation wavelengths and microscopic spatial resolution.
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Lab products found in correlation
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Jsm 7001f, by JEOL (1 mentions)
Sta449f3, by Netzsch (1 mentions)
Q5000ir, by TA Instruments (1 mentions)
D max 2550, by Rigaku (1 mentions)
Xlescalab 250xi electron spectrometer, by VG Scientific (1 mentions)
Jsm 6700f, by JEOL (1 mentions)
Quanta 600 feg sem, by Thermo Fisher Scientific (1 mentions)
Mos2 nanosheets, by Merck Group (1 mentions)
S 4800, by Hitachi (1 mentions)
Mfp 3d origin, by Oxford Instruments (1 mentions)
Smartlab, by Rigaku (1 mentions)
5 protocols using hr800 raman microscope
1
Comprehensive Characterization of Material Samples
2
Characterization of Crystalline Structures
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The crystalline structures were recorded using a powder X-ray diffractometer (XRD) on a PANalytical X′ Pert high score system (40 kV, 40 mA) with Cu-Kα radiation (λ = 0.15418 nm). The diffraction angles were selected from 5° to 90° with a step size of 0.033° and at a rate of 17° min−1. The morphology was studied using a scanning electron microscope (SEM, JEOL JSM-6700F, Japan, 15 kV, 10 mA). The Raman spectra were recorded on Jobin-Yvon LABRAM HR800 Raman Microscope with a resolution of 2 cm−1 at an excitation of 532 nm laser. The surface analyses were determined via X-ray photoelectron spectroscopy (XPS) on an XLESCALAB 250Xi electron spectrometer from VG Scientific with mono-chromatic Al-Kα radiation. The surface area was characterized by a BET specific surface area and pore size analyser (BJBUILDER SSA-7300, China). The humidity was measured by a humidity sensor (Center 310 RS-233, TES, Taiwan).
3
Nanoparticle Characterization by UV-Vis, SEM, and Raman
4
MoS2 Nanosheets Characterization
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The MoS2 nanosheets used in this study were purchased from Sigma-Aldrich (99.995%, Sigma-Aldrich, St. Louis, USA). According to the method reported previously [26 ], field emission scanning electron microscopy combined with energy dispersive spectrometry (FE-SEM, Hitachi S-4800) was utilized to determine the surface morphology and relative abundance of chemical elements of the MoS2 samples. In addition, the MoS2 samples were analyzed using a HR800 Raman Microscope (Horiba Jobin Yvon, France) and focalized using a 40 × objective with an excitation wavelength of 514 nm, adjusting the exposure time to acquire the correct spectrum.
5
Multimodal Characterization of Crystal Structure and Surface Morphology
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X‐ray diffraction (XRD, Rigaku Smartlab) was used to examine the crystal structure. Atomic force microscopy (AFM, Asylum Research, MFP‐3D Origin+) was used to study the surface morphology. The X‐ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific EscaLab 250) was performed using Al Kα (hv = 1486.6 eV) radiation as the excitation source. Raman spectroscopy was carried out with a HORIBA HR800 Raman microscope with laser excitation at 532 nm.
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