ATR-IR spectra of samples were recorded using a Smiths ChemID diamond attenuated total reflection (DATR) spectrometer (Smiths Detection, Inc., London, United Kingdom), and the powder XRD patterns were collected by Scintag X-ray diffractometer (PAD X) (Cupertino, CA, USA) equipped with Cu Kα photon source (45 kV, 40 mA) at a scanning rate of 3°/min. The SEM images were captured with a JEOL JXA-8900 microscope (JEOL USA, Inc., Peabody, MA, USA).
Jxa 8900 microscope
Manufactured by JEOL
Sourced in United States
The JXA-8900 is an electron probe microanalyzer (EPMA) manufactured by JEOL. It is designed for the elemental analysis and mapping of solid samples at the micro- and nano-scale. The JXA-8900 utilizes a high-energy electron beam to generate characteristic X-rays from the sample, which are then detected and analyzed to determine the elemental composition. The instrument is equipped with multiple wavelength-dispersive X-ray spectrometers for precise quantitative analysis.
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Lab products found in correlation
3 protocols using jxa 8900 microscope
1
Spectroscopic and Microscopic Analysis
2
Materials Characterization by Microscopy
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To acquire FESEM
images, a JEOL JXA-8900 microscope was used, and for TEM images and
EDS, a JEOL 2010 microscope was utilized. To get XPS and XRD patterns,
a PerkinElmer PHI 5600 ci X-ray photoelectron spectrometer and Scintag
X-ray diffractometer (PAD X) fitted with Cu Kα photon source
(45 kV, 40 mA), respectively, were employed. The UV–vis–NIR
electronic absorption and ATR–IR spectra were perceived by
a Varian Cary 50 Bio spectrophotometer and Smiths ChemID diamond ATR
spectrometer, respectively.
images, a JEOL JXA-8900 microscope was used, and for TEM images and
EDS, a JEOL 2010 microscope was utilized. To get XPS and XRD patterns,
a PerkinElmer PHI 5600 ci X-ray photoelectron spectrometer and Scintag
X-ray diffractometer (PAD X) fitted with Cu Kα photon source
(45 kV, 40 mA), respectively, were employed. The UV–vis–NIR
electronic absorption and ATR–IR spectra were perceived by
a Varian Cary 50 Bio spectrophotometer and Smiths ChemID diamond ATR
spectrometer, respectively.
3
Cation Compositional Analysis by EPMA
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Cation compositional analysis was determined by means of EPMA, attached to a JEOL JXA-8900 microscope, analysing around 20 areas of 1-5 mm in size. In addition, the cation ratio was always analysed in each particle, prior to the selected-area electron diffraction (SAED) and high-resolution transmission electron microscopy (HRTEM), by means of EDS.
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