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Sta 449f3 instrument

Manufactured by Netzsch
Sourced in Germany

The STA 449F3 instrument is a simultaneous thermal analyzer (STA) designed for thermal analysis of materials. It is capable of performing thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) measurements simultaneously on a single sample. The instrument provides accurate and reliable data on the thermal properties of a wide range of materials, including polymers, ceramics, and metals.

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6 protocols using sta 449f3 instrument

1

Comprehensive Characterization of Materials

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The obtained materials were characterized by X-ray diffraction (XRD), Fourier transformed infrared (FTIR) spectroscopy, scanning electron microscopy, and differential thermal analysis (DTA). The XRD patterns were obtained using a Miniflex 600 diffractometer with CuKα (λ = 1.5418 Å) radiation (Rigaku, Tokyo, Japan). The patterns of powdered samples were recorded in the range of 2–72°2θ with a 0.05°2θ step. The infrared spectra were collected by KBr pellet method (1 mg sample mixed with 200 mg KBr) with a Nicolet 6700 spectrometer (Thermo Scientific, Waltham, MA, USA). For each measurement, 64 scans were collected in the range of 4000–400 cm−1 and at a 4 cm−1 resolution. The SEM images were obtained using an Quanta 200 FEG microscope under low vacuum (FEI, Hillsboro, OR, USA). The samples were prepared by placing powdered material on a carbon tape. The thermal (DTA/TG) analysis of the samples was carried out using a STA 449F3 instrument coupled with a quadrupole mass spectrometer QMS 403 (Netzsch, Selb, Germany). The measurements were performed using ~20 mg samples in a temperature range of 25–1000 °C (heating rate: 10 °C/min, air atmosphere).
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2

Structural Studies of MWCNTs Using TEM and IR

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Structural studies of MWCNTs were carried out using the method of transmission electron microscopy. A small number of samples were made by contact with microscopic meshes with an adhesive composition. The studies were carried out from different places of the sample samples and on several samples in order to obtain better statistics about the samples under study. TEM and SEM studies were carried out using a Hitachi H-800 electron microscope with an accelerating voltage of up to 200 keV. An IR Fourier spectrophotometer FT 801 (Spectral range 21–1.8 µm) (LLC NPF Simeks, Novosibirsk, Russia) was used for the registration in the near and mid-IR range of the spectra of the original and modified with MWCNT elastomer matrix.
For TG and DSC studies, a NETZSCH STA 449F3 instrument (NETZSCH-Gerätebau GmbH, Selb, Germany) was used. Tests were carried out in the Ar-atmosphere.
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3

Synthesis and Characterization of Ni(II) and Cu(II) Macrocycle Complexes

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The Ni(II) and Cu(II) macrocycle complexes were prepared following the previous report procedure [29 (link)]. All of the chemicals used in this work were commercially available and were used without further purification. Elemental analyses were carried out using an Elementar Micro Cube elemental analyzer. Infrared spectra were recorded in the 4000−400 cm−1 region using KBr pellets and a Bruker EQUINOX 55 spectrometer (Bruker, Germany). Thermogravimetric analyses were performed using a Netzsch STA 449F3 instrument (Netzsch, Germany) in flowing air at a heating rate of 10 °C·min−1. X-ray powder diffraction data were recorded using a Bruker D8 ADVANCE X-ray powder diffractometer (Cu Kα radiation, λ = 1.5418 Å, Bruker, Germany). Magnetic susceptibility measurements were conducted to determine the magnetic behaviors of both complexes at 1000 G in a temperature range of 2–300 K.
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4

Comprehensive Characterization of Materials

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Surface morphology measurements were carried out using a JSM-7500F scanning electron microscope (SEM) (JEOL, Tokyo, Japan). Fourier transform infrared (FT-IR) spectra were recorded on Nicolet Nexus-470 FT-IR spectrometer (Waltham, MA, USA). Thermogravimetric analysis (TGA) was conducted using an STA-449F3 instrument (Netzsch, Selb, Germany). A vibrating sample magnetometer (MPMS3) was used to investigate the magnetic properties of samples. The 1HNMR and 13CNMR spectra were recorded with a Varian 400-MR spectrometer (Palo Alto, CA, USA). All electrochemical experiments were implemented on a CHI660D electrochemical workstation (CHI Instruments Co., Shanghai, China) with a conventional three electrode system comprising of a platinum wire as the auxiliary electrode, a saturated calomel electrode (SCE) as the reference electrode, and a modified GCE (3 mm diameter) as the working electrode.
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5

Characterization of Chitosan Derivatives

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Characterization of chitosan derivative via conductometric titration was performed with a multifunctional measuring apparatus CPC–505 (Conbest, Krakow, Poland) using a platinum indicator electrode. 1H-NMR spectra were recorded on a Bruker Avance III HD 400 MHz in D2O with CD3COOD. Fourier-transform infrared (FTIR) spectra were recorded using an ALPHA FTIR spectrometer (Bruker, Billerica, MA, United States) working in attenuated total reflectance (ATR) mode (on diamond). For thermal analyses, a STA 449F3 instrument (Netzsch, Selb, Germany) was used.
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6

Characterization of Nanocomposite Films

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The cross-sectional scanning electron microscope (SEM) images of the nanocomposite films were captured using the Tescan-MIRA field-emission scanning electron microscopy. The morphology of the Fe3O4 nanoparticles was analysed by transmission electron microscopy (JEOL, model 2100). The tensile behaviours of the (4 mm × 25 mm) composite films were measured by applying a 1 mm/min load using the MTS Tytron 250 Micro-force Tester. The toughness, defined as the ability of a material to absorb energy up to fracture, was calculated using the OriginPro 8.5 software by integrating the area under the tensile stress-strain curves. The NETZSCH STA 449F3 instrument was used to perform the thermogravimetric analysis (TGA), and the samples were heated from 30 °C to 800 °C in N2 atmosphere with a heating rate of 5 °C/min. Fourier transform infrared spectroscopy (FTIR) spectra were obtained using an ATR spectrometer (5700 Nicolet Diamond). The X-ray diffraction (XRD) data were collected using the Bruker D8 with Cu Kα radiation.
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