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5 protocols using picoforce multimode afm

1

Nanomaterial Characterization by TEM and AFM

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The sizes and morphologies of nanomaterials were characterized using transmission electron microscopy (TEM) and atomic force microscopy (AFM). TEM samples of AlbiVax or a mixture of AlbiVax and HSA were prepared by depositing samples (10 µL) onto a carbon-coated copper grid. For AFM, samples (10 µL) were casted on freshly peeled mica substrate, followed by drying, rinsing, and dehumidifying. AFM was carried out in tapping mode in air on a PicoForce Multimode AFM (Bruker, CA) equipped with a Nanoscope® V controller, a type E scanner head, and a sharpened TESP-SS (Bruker, CA) AFM cantilever. AFM images were then analyzed by Nanoscope Software (version 7.3–8.15, Bruker, CA).
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2

Characterizing HSA Nanoparticle Morphology

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The size and morphology of HSA@CySCOOH was investigated by atomic force microscopy (AFM). After suitable sample absorption on freshly peeled mica substrate, rinsing, drying, and dehumidification, biological AFM imaging of the HSA or HSA@CySCOOH samples was carried out in air, using gentle tapping-mode AFM with a PicoForce Multimode AFM (Bruker, CA) consisting of a Nanoscope® V controller, a type E scanner head, and a sharpened TESP-SS (Bruker, CA) or similar AFM cantilever. AFM images were evaluated within the Nanoscope software (ver. 7.3–8.15, Bruker, CA) and exported to Image J (ver. 1.4×, National Institutes of Health, MD) for further analyses and display.
UV/Vis spectra were measured by a Genesys 10S UV-Vis spectrophotometer (Thermo Scientific, Waltham, MA) using quartz cuvettes with an optical path of 1 cm. Fluorescence intensity was monitored with an F-7000 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). Thermal images were captured by a SC300 infrared camera (FLIR, Arlington, VA) and processed with Examin IR image software (FLIR). The excitation source was an 808 nm diode-pumped solid-state laser system (LASERGLOW Technologies, Toronto, Canada).
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Characterization of iDR-NCs using Microscopy

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For SEM, samples were deposited onto conductive glass, dried, and rinsed with diH2O. Dry samples were coated with Au (5 nm of thickness) and observed on an S-4800 SEM. TEM observation of dry iDR-NCs samples was also conducted. Preparation of NC cross section using FIB and the following SEM observation of NC cross section was conducted on a Tescan GAIA FIB/SEM at the Advanced Imaging and Microscopy Laboratory (AIMLAB). AFM samples were casted on mica substrate, dried, and washed with diH2O. AFM samples was observed in tapping-mode in air on a PicoForce Multimode AFM (Bruker, CA) equipped with a Nanoscope® V controller, a type E scanner head, and an OTESPA AFM cantilever. Results were analyzed using Nanoscope Software (ver. 7.3–8.15). The sizes of iDR-NCs suspended were measured using DLS on a Nanoparticle Analyzer (HORIBA Scientific, Tokyo, Japan). Bright field or fluorescence images of fluorophore-labeled iDR-NCs were taken on a Zeiss LSM 780 confocal microscope (Chesterfield, VA).
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Biological AFM Imaging of sSWCNTs

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Biological AFM imaging of the sSWCNTs with CAHA was performed in air using gentle-tapping-mode AFM, mostly with a PicoForce Multimode AFM (Bruker, CA, USA) consisting of a Nanoscope V controller, a type E scanner head, and a sharpened FESP-SS (Bruker) or similar AFM cantilever. For CAHA-sSWCNT visualization, suitable attachment was readily achieved by a 30 min incubation of the sample in deionized water on freshly peeled mica substrates, followed by rinsing with deionized water (4×) and complete drying under an inert N2 gas flow. The sample was then sealed into the instrument compartment dehumidified by Drierite particles. AFM images were evaluated with the Nanoscope software (version 7.3, Bruker) and exported to NIH ImageJ (version 1.41o) for further analyses and display.
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5

Nanomaterial Characterization by SEM, AFM, and DLS

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The sizes and morphologies of nanomaterials were characterized using scanning electron microscopy (SEM) and atomic force microscopy (AFM). SEM samples were prepared by depositing the above-prepared samples onto conductive glass, following by drying, washing with double-distilled H2O (diH2O) and further drying. Samples were coated with Au (5 nm) by spray, and observed on an S-4800 scanning electron microscope. For AFM of hNVs, samples (10 μL) were casted on freshly peeled mica substrate, followed by drying, rinsing, and dehumidifying. AFM was carried out in tapping-mode in air on a PicoForce Multimode AFM (Bruker, CA) equipped with a Nanoscope® V controller, a type E scanner head, and an OTESPA (Bruker, CA) AFM cantilever. AFM images were then analyzed by Nanoscope Software (ver. 7.3–8.15, Bruker, CA). The sizes of hNVs suspended in Dulbecco’s PBS were also characterized using dynamic light scattering (DLS) on a Nanoparticle Analyzer (HORIBA Scientific, Tokyo, Japan). Bright field or fluorescence images of fluorophore-labeled hNVs were taken on a Zeiss LSM 780 confocal microscope (Chesterfield, VA).
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