Xl30 field emission gun scanning electron microscope
The XL30 Field Emission Gun Scanning Electron Microscope is a high-resolution imaging device that uses a field emission gun and scanning electron beam to produce detailed images of microscopic samples. It provides users with the ability to examine and analyze the surface structure and composition of a wide range of materials at the nanoscale level.
Lab products found in correlation
3 protocols using xl30 field emission gun scanning electron microscope
Ultrastructural Analysis of Sinus Tissue
SEM Imaging of Disc Samples
Polymer Characterization by DLS and SEM
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