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Xl30 field emission gun scanning electron microscope

Manufactured by Philips
Sourced in Netherlands

The XL30 Field Emission Gun Scanning Electron Microscope is a high-resolution imaging device that uses a field emission gun and scanning electron beam to produce detailed images of microscopic samples. It provides users with the ability to examine and analyze the surface structure and composition of a wide range of materials at the nanoscale level.

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3 protocols using xl30 field emission gun scanning electron microscope

1

Ultrastructural Analysis of Sinus Tissue

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From each sinus, a sample of 5 × 5 mm tissue was obtained, sonicated in saline, then submerged in SEM fixative (4% paraformaldehyde/1.25% glutaraldehyde in PBS + 4% sucrose, pH 7.2) for at least 24 h. Tissues were washed in a washing buffer (PBS + 4% sucrose) for 5 min then post fixed in 2% OsO4 in water for 1 h. All samples underwent a graded dehydration of 70, 90, and 100% ethanol, then dried using hexamethyldisilazane (HMDS). Following that, all tissues were mounted on stubs and carbon coated. Images were taken using an XL30 Field Emission Gun Scanning Electron Microscope (Phillips, Eindhoven, Netherlands).
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2

SEM Imaging of Disc Samples

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DSB samples were prepared by overnight incubation of each disc in 2¢5 % glutaraldehyde solution, followed by a series of ethanol washes with increasing concentration; 5, 25, 50, 75, 90, and 100 % for 10 minutes each. 21 Prior to imaging, discs with DSB were coated with a thin layer of gold-palladium (20 nm) using a SC500 Bio-rad sputter coater. Images were acquired with a beam energy of 5 kV using an in-lens detector on a Philips XL30 field emission gun-scanning electron microscope at £5,000, £1,0000 and £20,000 magnification and a 5-7 mm working distance.
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3

Polymer Characterization by DLS and SEM

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The hydrodynamic size of the polymers was measured by dynamic light scattering (DLS) using a Zetasizer NanoZS (Malvern Instruments Ltd., Worcestershire, UK) at 25 °C. Scanning electron microscopy (SEM) imaging was carried out on a Philips XL30 Field Emission Gun Scanning Electron Microscope (Amsterdam, Netherlands). Polymer particles were sputter coated with gold prior to measurement.
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