A Lambda 950 UV/vis/NIR spectrometer was used to test optical characteristics in the range of 300 nm to 600 nm (PerkinElmer, USA). At room temperature, an AXS-D8 Advance Cu-K diffractometer was used to investigate the films' structural characteristics (Bruker Corp., USA). XRD patterns examined in a 2θ range, with a step size of 0.02°, which ranged between 10° and 80°, using the Cu-Kα radiation wavelength, λ, of 1.5408 Å. FEI Quanta 400F field emission scanning electron microscope (FESEM) equipped with Oxford-Instruments INCA 400 X-Max detector for energy-dispersive X-ray spectroscopy (EDX) measurement at ×300 magnification (spot size 1 mm × 1 mm) and an accelerating voltage of 20 kV. Finally, the electrical properties of films were measured using the HMS ECOPIA 3000 Hall Effect measuring device with a 0.57 T magnetic field and 45 nA probe current, Fig. 2 , showed the Hall effect device.
Inca 400 x max detector
Manufactured by Oxford Instruments
The INCA 400 X-Max detector is an energy-dispersive X-ray spectrometer (EDS) designed for use in scanning electron microscopes (SEMs). It provides elemental analysis capabilities by detecting and measuring the energy of X-rays emitted from the sample during electron beam excitation. The detector's core function is to collect and analyze these X-rays, allowing the identification and quantification of the chemical elements present in the sample.
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2 protocols using inca 400 x max detector
1
Comprehensive Characterization of Thin Films
2
Optical, Structural, and Electrical Characterization of Films
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With the aid of a Lambda 950 UV /VIS /NIR spectrometer, optical characteristics were determined in the wavelength range of 400 to 700 nm (Perkin-Elmer, USA). At room temperature, the structural characteristics of the films were evaluated using an AXS-D8 Advance Cu-K diffractometer (Bruker Corp., USA). Using the Cu-K radiation wavelength,, of 1.5408, we also examined the XRD patterns in a 2 range with a step size of 0.02°, ranging 10° to 80°. FEI Quanta 400F field emission scanning electron microscope (FESEM) equipped with Oxford- Instruments INCA 400 X-Max detector for energy–dispersive x-ray spectroscopy (EDX) measurements at × 300 magnification (1 mm × 1 mm spot size) and 20 kV accelerating voltage. Finally, the electrical characteristics of films were examined using an HMS ECOPIA 3000 Hall Effect measuring instrument with a 0.57 T magnetic field and 45 nA probe current. We used the Ag paste method to form an ohmic contact by adding Ag dots to each sample's four corners, and then repeated each reading for each sample ten times to improve the reliability of our findings.
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