The morphologies and crystal structures of Au–Pd core–shell NWs were investigated by scanning electron microscopy (SEM, Hitachi S4800) and high-resolution transmission electron microscopy (HRTEM, JEM2100) at an acceleration voltage of 200 kV. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and energy-dispersive X-ray spectroscopy (EDS) were carried out on an FEI TECNAI F30 microscope operating at 300 kV. All TEM samples were prepared by depositing a drop of the diluted solution on a copper grid coated with a carbon film. The crystal phases of the products were determined by powder X-ray diffraction (PXRD) using a Rigaku Ultima IV X-ray diffractometer with Cu Kα radiation. The surface elemental compositions of NWs were identified by X-ray photoelectron spectrometry (XPS, PHI QUANTUM-2000) using a monochromatic magnesium X-ray source. The binding energies were calibrated with respect to the signal of carbon 1s (binding energy of 284.8 eV). All measurements were performed at 25.0 °C (±0.1 °C).
Ultima 4 x
Manufactured by Rigaku
Sourced in Japan
The Ultima IV X is a versatile X-ray diffractometer designed for materials analysis. It is capable of performing a wide range of X-ray diffraction measurements, including phase identification, structure refinement, and quantitative analysis. The Ultima IV X utilizes a high-performance X-ray source and advanced optics to deliver accurate and reliable results.
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Lab products found in correlation
7 protocols using ultima 4 x
1
Morphology and Structure of Au-Pd Core-Shell Nanowires
2
Identifying Coupon Corrosion Scale Phases
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We identified
crystalline phases
in the coupon corrosion scale using X-ray diffraction (XRD). Coupons
were dried and analyzed without removing the scale from the surface.
We used a Rigaku Ultima IV X-ray diffractometer with a copper Kα
radiation source, operated at 35 kV and 30 mA. Scans were acquired
over the range 10–70° (2θ) with a step size of 0.04°
and a scan speed of 0.8° min–1. The powder
diffraction file numbers, corresponding to standards referenced in
the article, are listed inTable S3 .
crystalline phases
in the coupon corrosion scale using X-ray diffraction (XRD). Coupons
were dried and analyzed without removing the scale from the surface.
We used a Rigaku Ultima IV X-ray diffractometer with a copper Kα
radiation source, operated at 35 kV and 30 mA. Scans were acquired
over the range 10–70° (2θ) with a step size of 0.04°
and a scan speed of 0.8° min–1. The powder
diffraction file numbers, corresponding to standards referenced in
the article, are listed in
3
Characterization of Pt-based Catalysts
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The UV–vis spectra
of the compounds were studied using a JASCO/V-650 (190–900
nm) UV–vis spectrophotometer, taking the dimethylformamide
solution of the compounds. Fluorescence studies were done in a JASCO/FP-6300
(190–900 nm) fluorescence spectrometer. Powder XRD was studied
with Rigaku Ultima IV X-ray diffractometer with Cu Kα radiation
(λ = 1.5418 Å). A typical scan was performed at a scan
rate of 1° min–1 with a step size of 0.02°.
High-resolution TEM, EDX analysis, and bright-field imaging and mapping
of Pt–PTP and Pt–TiO2–PTP were performed
on a UHR-FEG-TEM (JEOL, JEM 2100) instrument at 200 kV. Water dispersions
of the samples were casted on a 200-mesh Cu-grid for TEM. FESEM imaging
and EDX analysis were performed by FEI, Apreo S with a 20 kV operating
voltage by taking a small amount of methanol-dispersed sample drop
casted on a silicon wafer. The loading of Pt in the synthesized catalysts
was monitored by energy-dispersive XRF (Epsilon 1; PANalytical). The
Raman spectra were recorded by a UniRAM 3300 Raman microscope with
a laser wavelength of 532 nm.
of the compounds were studied using a JASCO/V-650 (190–900
nm) UV–vis spectrophotometer, taking the dimethylformamide
solution of the compounds. Fluorescence studies were done in a JASCO/FP-6300
(190–900 nm) fluorescence spectrometer. Powder XRD was studied
with Rigaku Ultima IV X-ray diffractometer with Cu Kα radiation
(λ = 1.5418 Å). A typical scan was performed at a scan
rate of 1° min–1 with a step size of 0.02°.
High-resolution TEM, EDX analysis, and bright-field imaging and mapping
of Pt–PTP and Pt–TiO2–PTP were performed
on a UHR-FEG-TEM (JEOL, JEM 2100) instrument at 200 kV. Water dispersions
of the samples were casted on a 200-mesh Cu-grid for TEM. FESEM imaging
and EDX analysis were performed by FEI, Apreo S with a 20 kV operating
voltage by taking a small amount of methanol-dispersed sample drop
casted on a silicon wafer. The loading of Pt in the synthesized catalysts
was monitored by energy-dispersive XRF (Epsilon 1; PANalytical). The
Raman spectra were recorded by a UniRAM 3300 Raman microscope with
a laser wavelength of 532 nm.
4
Freeze-Dried Sample Analysis by X-ray Diffraction
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The samples prepared in Section 2.2 . were freeze-dried (2 mg) and analyzed using a X-ray diffractometer (Ultima IV X, Rigaku, Japan) at 2θ values ranging from 5° to 45° at a rate of 2°/min. The voltage was 40 kV, and electric current was 40 mA.
5
Comprehensive Material Characterization Protocol
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PXRD was tested on Rigaku Ultima-IV X with a Cu Kα source (1.54056 Å) at 40 kV and 30 mA. All nitrogen adsorption measurements were performed on an ASAP 2020 HD88 instrument. XPS measurements were tested by Quantum 2000XPS with an Omicron hemispherical energy analyzer. SEM characterizations were performed on ZEISS Sigma. STEM images were collected by TECNAI F30, and corresponding STEM-EDX spectroscopy was performed. MALDI-TOF-MS analysis was performed using autoflex maX MALDI-TOF MS. FTIR spectra were collected using Nicolet iS50. The Raman data were collected using a Renishaw Invia instrument. The thermogravimetric analysis curve was obtained using TGA 449F5.
6
Starch Crystalline Structure Analysis
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The RS and RS/QBG mixtures used in this experiment were the same as those described in Section “RS and RS/QBG paste preparation”. The mixtures were stored at −80 °C overnight and then transferred to a vacuum freeze-dryer for freeze-drying. After freeze-drying, the dried samples were milled and passed through a 100-mesh sieve. To ascertain the crystalline structure of the starch, we used an X-ray diffractometer (XRD) (Rigaku Ultima IV X, Japan) fitted with Cu-K radiation (λ = 0.15406 nm). The samples were scanned within the 4° < 2θ < 50° range using a scanning speed of 5°/min and 10 s for each step, with a tube pressure and flow of 40 kV and 40 mA, respectively.
7
Characterization of Lead Iodide Materials
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The X-ray diffraction (XRD) patterns of samples were obtained using the Rigaku Ultima IV X-ray diffractometer with Cu Kα radiation (λ = 1.5406 Å). Raman spectrum was measured by drop-casting PbI2 precursor solution on a pre-cleaned silicon substrate with a 532 nm wavelength laser. Scanning electron microscopy (SEM) images were acquired using the ZEISS Sigma 500 field-emission scanning electron microscope operated at an accelerating voltage of up to 30 kV. The optical UV-absorption spectra were measured with a spectrometer (Perkin Elmer, Lambda 750). The current-voltage (I-V) characteristics of the devices were measured using a Keithley 4200 SCS unit. A 405 nm laser diode was used as the light source for the photocurrent measurements, whereas the power of the incident radiation was tuned and measured using a power meter.
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