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16 protocols using jem 2011 transmission electron microscope

1

Cryo-EM Analysis of EV Characteristics

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Selected SEC fractions showing the highest MFI for CD9 marker were examined for EV size and morphology by cryo-electron microscopy (cryo-EM). A total of 3 preparations from each group were analyzed. Vitrified specimens were prepared by placing 3 μl of a sample on a Quantifoil® 1.2/1.3 TEM grid, which was blotted to a thin film and plunged into liquid ethane-N2(l) in the Leica EM CPC cryoworkstation (Leica, Wetzlar, Germany). The grids were transferred to a 626 Gatan cryoholder and kept at -179°C. Samples were analyzed with a Jeol JEM 2011 transmission electron microscope (Jeol, Tokyo, Japan) operating at 200 kV. Images were recorded on a Gatan Ultrascan 2000 cooled charge-coupled (CCD) camera with the Digital Micrograph software package (Gatan, Pleasanton, CA). Aliquots of 10 µL of samples were laid on formvar-Carbon EM grids, frozen, and immediately analyzed with a Jeol JEM 2011 transmission electron microscope operating at 200 kV. Samples were kept at -182°C during imaging (626 Gatan cryoholder). Images were recorded on a Gatan Ultrascan CCD camera under low electron dose conditions to minimize electron beam radiation.
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2

Microstructural Characterization of PMB

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The microstructure of PMB was detected by JEOL JEM-2011 transmission electron microscope (TEM, JEOL Co., Tokyo, Japan). PMB solution was first diluted by approximately 100 times, 10 nanoparticle solution was then deposited on 400-mesh carbon-coated copper grids, and the sample was completely air-dried prior to TEM observation. Scanning electron microscopy (SEM) images showing surface morphology of the prepared SiO2 PCFs with ordered hexagonal-close-packed structures were observed by VEGA3 TESCAN, imaging up to 80,000×, and the micro-images of the PSPs coated patterns with disordered surfaces were performed by JSM-6490 SEM (JEOL Co., Tokyo, Japan). Prior to SEM observation, the non-conductive samples were sputter-coated with a thin gold film to reduce charge effects under micro imaging. The elemental analysis of the prepared samples was achieved by JSM-6490 SEM with an energy-dispersive X-ray spectroscopy (EDS) detector. The scanning probe characterization upon the morphological changes in the surface of SiO2 PCFs was analyzed by means of atomic force microscope (AFM) technique (Park systems, XE-100). The scan sizes X and Y were 2 μm with 1.5 Z servo grain at 0.8~1 Hz scan rate.
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3

Platinum Catalyst Characterization Techniques

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The platinum loading
was measured
with an inductively coupled plasma optical emission spectrometer (Varian
VISTA-MPX). Powder X-ray diffraction (PXRD) data was obtained on a
Rigaku D/maxr B diffractometer using Cu Kα radiation. N2 adsorption–desorption isotherms were analyzed at 77
K with a Micromeritics TriStar II 3020 analyzer. The platinum electronic
states were analyzed using an X-ray photoelectron spectroscope (XPS,
Perkin-Elmer PHI 5000C ESCA using Al Kα as the excitation source
with a base pressure of 10–9 Torr). All of the binding
energy values were calibrated using C 1s = 284.6 eV as a reference.
TEM images were obtained on a JEOL JEM-2011 transmission electron
microscope.
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4

Cryo-EM Analysis of EV Size and Morphology

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SEC fractions were examined for EV size and morphology by cryo-electron microscopy (cryo-EM). Vitrified specimens were prepared by placing 3 μl of a sample on a Quantifoil® 1.2/1.3 TEM grid, blotted to a thin film and plunged into liquid ethane-N2(l) in the Leica EM CPC cryoworkstation (Leica, Wetzlar, Germany). The grids were transferred to a 626 Gatan cryoholder and maintained at -179ºC. Samples were analyzed with a Jeol JEM 2011 transmission electron microscope (Jeol, Tokyo, Japan) operating at an accelerating voltage of 200 kV. Images were recorded on a Gatan Ultrascan 2000 cooled charge-coupled device (CCD) camera with the Digital Micrograph software package (Gatan, Pleasanton, CA).
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5

Aβ1-42 Oligomers Formation Assay via TEM

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Assay of Aβ1-42 oligomers formation using Transmission electron microscopy (TEM) images was performed as previously described5 (link). Briefly, synthetic Aβ1-42 was dissolved in HFIP to 1 mg/ml, evaporated under vacuum, and reconstituted in DMSO to 5 mM. Then Aβ1-42 was diluted to 20 μM by using 10 mM sodium phosphate (pH = 7.4), and incubated with 1 μM bis(heptyl)-cognitin. The TEM samples were prepared by placing 2 μl of the pre-incubated solution on a carbon-coated grid. The samples were stained with 1% uranylacetate and then placed on a clean paper for removing excess staining solution. The grids were thoroughly examined using JEM-2011transmission electron microscope (JEOL, Tokyo, Japan).
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6

Comprehensive Structural and Compositional Analysis

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The transmission electron microscopy (TEM) was adopted for the morphology and element analysis on a JEOL JEM-2011 transmission electron microscope with an energy-dispersive X-ray spectroscopy (EDS) detector operated with an accelerating voltage of 200 kV. The scanning electron microscope (SEM) images and EDS mapping images were determined by a Hitachi S4800 scanning electron microscope with a working voltage of 3 kV. The low-angle X-ray diffraction (XRD) patterns were recorded on a D/max2550VB3+/PC X-ray diffractometer with Cu Kα radiation (λ = 0.15418 nm). The Fourier transform infrared (FT-IR) spectra were obtained on a Nicolet 6700 FT-IR spectrometric analyzer using KBr discs in the region of 4000-500 cm-1. Zeta potential and dynamic light scattering (DLS) particle size distributions were obtained using a Malvern Zetasizer Nano-ZS90 with the samples dispersed into ethanol. The nitrogen (N2) adsorption-desorption isothermal curve and the corresponding pore-size distribution measured by the Micromeritics Tristar 3000 system were used to detect porous structures at 77 K. The surface area (SBET) and pore volume (Vpore) were determined by Brunauer-Emmett-Teller (BET) and Barrett-Joyner-Halenda (BJH) analysis, respectively. The pore-size distribution curves were obtained by BJH analysis.
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7

TEM-based EDX Spectroscopy Analysis

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Grids prepared
for TEM visualization were used for EDX spectroscopy analysis. The
EDX spectrum for each sample was acquired in a JEM-2011 transmission
electron microscope (JEOL Ltd., Japan) operating at 200 kV, equipped
with an EDS X-max detector (Oxford Instruments, UK). Spectra were
analyzed using INCA Software (ETAS group, Germany) and represented
with GraphPad Prism 5.0 (GraphPad Software, USA).
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8

Physicochemical Characterization of Nanoparticles

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Transmission electron microscopy (TEM) images were obtained by using a JEM 2011 transmission electron microscope (JEOL, Akishima, Tokyo, Japan). The size, polydispersity index (PDI), and ζ potential were measured by dynamic light scattering (DLS) using NanoBrook 90Plus PALS (Brookhaven Instruments Co., Holtsville, NY, USA). The UV-Vis spectra were recorded by using a UV–Vis spectrometer (Cary60; Agilent Technologies, Santa Clara, CA, USA).
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9

Cryogenic TEM Analysis of DELOS Nanovesicles

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The morphology of the distinct types of produced DELOS nanovesicles was assessed by cryogenic transmission electron microscopy using a JEOL JEM-2011 transmission electron microscope (JEOL Ltd., Tokyo, Japan) operating at 200 kV. In the case of the DELOS nanovesicle dispersions, a small drop of the sample was directly placed on a copper grid coated with a perforated polymer film. Conversely, in the case of DELOS nanovesicles-based hydrogels, they were diluted 1:100 in water for an adequate fixation and preservation of the hydrogel sample in the grid. Afterward, the excess of the sample was removed by blotting with filter paper. Immediately after film preparation, the grid was plunged into liquid ethane held at a temperature just above its freezing point (−179.15 °C). The vitrified sample was then transferred to the microscope for analysis. To prevent sample perturbation and the formation of ice crystals, the specimens were kept cold (−196.15 °C) during both the transfer and viewing procedures. Images were recorded on a Gatan 724 CCD camera under low-dose conditions using Digital Micrograph 3.9.2. (Gatan Inc., Pleasanton, CA, USA).
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10

TEM Imaging of Poly(St-MMA-AA) Nanoparticles

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Transmission electron microscopy (TEM) morphologies of Poly(St-MMA-AA) nanoparticles were detected by JEOL JEM-2011 Transmission Electron Microscope. Prior to conducting TEM measurement, Poly(St-MMA-AA) nanoparticles were first pre-dispersed and diluted in aqueous solution to approximately 100 ppm, 10 μL nanoparticle solution were then deposited on 400-mesh carbon-coated copper (Cu) grids, and the sample was completely air-dried prior to TEM observation.
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