Jem 2011 transmission electron microscope
The JEM 2011 is a transmission electron microscope manufactured by JEOL. It is designed to produce high-resolution images of microscopic samples by transmitting a beam of electrons through the specimen. The JEM 2011 can magnify and focus the electron beam to create detailed visualizations of the internal structure and composition of materials at the nanoscale level.
Lab products found in correlation
16 protocols using jem 2011 transmission electron microscope
Cryo-EM Analysis of EV Characteristics
Microstructural Characterization of PMB
Platinum Catalyst Characterization Techniques
was measured
with an inductively coupled plasma optical emission spectrometer (Varian
VISTA-MPX). Powder X-ray diffraction (PXRD) data was obtained on a
Rigaku D/maxr B diffractometer using Cu Kα radiation. N2 adsorption–desorption isotherms were analyzed at 77
K with a Micromeritics TriStar II 3020 analyzer. The platinum electronic
states were analyzed using an X-ray photoelectron spectroscope (XPS,
Perkin-Elmer PHI 5000C ESCA using Al Kα as the excitation source
with a base pressure of 10–9 Torr). All of the binding
energy values were calibrated using C 1s = 284.6 eV as a reference.
TEM images were obtained on a JEOL JEM-2011 transmission electron
microscope.
Cryo-EM Analysis of EV Size and Morphology
Aβ1-42 Oligomers Formation Assay via TEM
Comprehensive Structural and Compositional Analysis
TEM-based EDX Spectroscopy Analysis
for TEM visualization were used for EDX spectroscopy analysis. The
EDX spectrum for each sample was acquired in a JEM-2011 transmission
electron microscope (JEOL Ltd., Japan) operating at 200 kV, equipped
with an EDS X-max detector (Oxford Instruments, UK). Spectra were
analyzed using INCA Software (ETAS group, Germany) and represented
with GraphPad Prism 5.0 (GraphPad Software, USA).
Physicochemical Characterization of Nanoparticles
Cryogenic TEM Analysis of DELOS Nanovesicles
TEM Imaging of Poly(St-MMA-AA) Nanoparticles
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