The microstructure and composition of the material were observed with scanning electron microscope (SEM, HITACHI SU-5000, Japan and Zeiss AURIGA, Germany) and energy-dispersive X-ray spectroscopy (EDS). The surface was photographed and analysed at a working voltage of 20 KV and a magnification of 500×. The phase composition and residual stress were analyzed by a Bruker D8 X-ray diffractometer, the compound phase composition was analyzed by the working voltage of 50 KV, and the residual stress was analyzed by the sin2ϴ method. The roughness was measured using a 3D laser confocal microscope (
Su 5000
The SU-5000 is a high-performance scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The SU-5000 features advanced electron optics and a state-of-the-art digital imaging system, enabling users to investigate surface topography, composition, and other characteristics of their samples with exceptional detail and precision.
Lab products found in correlation
2 protocols using su 5000
Microstructure and Surface Characterization of Cermet and Tool Steel
The microstructure and composition of the material were observed with scanning electron microscope (SEM, HITACHI SU-5000, Japan and Zeiss AURIGA, Germany) and energy-dispersive X-ray spectroscopy (EDS). The surface was photographed and analysed at a working voltage of 20 KV and a magnification of 500×. The phase composition and residual stress were analyzed by a Bruker D8 X-ray diffractometer, the compound phase composition was analyzed by the working voltage of 50 KV, and the residual stress was analyzed by the sin2ϴ method. The roughness was measured using a 3D laser confocal microscope (
Characterizing Mn-MOFs and Mn-MOFs@Zn
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