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Su 5000

Manufactured by Zeiss
Sourced in Japan

The SU-5000 is a high-performance scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The SU-5000 features advanced electron optics and a state-of-the-art digital imaging system, enabling users to investigate surface topography, composition, and other characteristics of their samples with exceptional detail and precision.

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2 protocols using su 5000

1

Microstructure and Surface Characterization of Cermet and Tool Steel

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The test materials were high hardness T130A cermet and SKD11 tool steel. The microstructure and chemical composition of SKD 11 steel is shown in Figure 2 and Table 1. The workpiece was machined by a wire electro-discharge machining (Wire EDM). The dimension of the specimen was around 10 mm × 5 mm × 10 mm. The parameter of micro particle bombarding (MPB) included air pressure (lower condition A and higher condition B) and bombarding time, such as 15, 20, 25, and 30 sec, respectively. Figure 3 and Figure 4 show the particle data of micro particle bombarding (MPB).
The microstructure and composition of the material were observed with scanning electron microscope (SEM, HITACHI SU-5000, Japan and Zeiss AURIGA, Germany) and energy-dispersive X-ray spectroscopy (EDS). The surface was photographed and analysed at a working voltage of 20 KV and a magnification of 500×. The phase composition and residual stress were analyzed by a Bruker D8 X-ray diffractometer, the compound phase composition was analyzed by the working voltage of 50 KV, and the residual stress was analyzed by the sin2ϴ method. The roughness was measured using a 3D laser confocal microscope (Figure 5, VK-X200 series, Keyence, Japan). The vickers hardness (HV) was used to identify the hardness after micro particle bombarding (MPB).
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2

Characterizing Mn-MOFs and Mn-MOFs@Zn

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X'Pert3 Powder type multifunctional X-ray diffractometer (Cu target, λ = 1.54056 Å) was used to collect X-ray diffraction data of Mn-MOFs; field emission scanning electron microscope (Zeiss Sigma 300) was used to characterize the microstructure of Mn-MOFs and Mn-MOFs@Zn; the field emission scanning electron microscope (SU 5000) was used to observe the surface morphology of the coating and the dispersion of the Mn-MOFs@Zn in the coating.
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