analysis was performed
using a Quanta 450 FEG SEM commonly without prior metal deposition.
TEM was carried out on an FEI Tecnai F20 microscope, operating at
200 kV, and equipped with a Schottky field emission gun and a twin-blade
anticontaminator. All images were recorded using a Gatan 4K Ultra
Scan charge-coupled device camera. Since these organic material films
are sensitive to the electron beam irradiation, the films were normally
previewed rapidly at a dose of 20 e– nm–2. Selected areas were then imaged at a dose level of 200 e– nm–2, which did not cause radiation damage. A
drop of a solution of each compound in an organic solvent such as
CH2Cl2 or n-hexane was placed
on either ITO substrates for SEM or carbon-coated Cu grids for TEM.
After complete evaporation of the solvent in vacuum, the sample was
heated and cooled as described for the POM experiments.