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Jsm 7500f transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The JSM-7500F is a high-resolution field emission scanning transmission electron microscope (FE-STEM) manufactured by JEOL. It is designed to provide high-quality images and analytical data for a wide range of materials and applications. The JSM-7500F features a field emission electron gun, advanced optics, and sophisticated control systems to deliver exceptional performance and resolution.

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3 protocols using jsm 7500f transmission electron microscope

1

Ultrastructural Analysis of DTMUV Infection

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DEF cells grown to 70%–80% confluence in 6-well plates were infected with PBS or DTMUV FX2010 or transfected with pCMV-HA and pCMV-HA-NS3, respectively, and treated by RAPA as the positive control. The DEF cells of different treatments in each group were collected and centrifuged for 5 min at 800–1,000 r/min, then the supernatant was discarded, cell sediment at the bottom of the centrifuge tube was collected, and the buffer was added. After being centrifuged for 5 min at 5,000 r/min, the dense adherent cell pellet was collected. Then, we discard the supernatant and inject 2% to 4% glutaraldehyde (or a mixture of paraformaldehyde and glutaraldehyde), which was sent to Shandong Weiya Technology Co., Ltd., for transmission electron microscopy (TEM) observation. Images were obtained with a JSM-7500F transmission electron microscope (JEOL, Tokyo, Japan).
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2

Transmission Electron Microscopy Analysis of PEDV

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The purified PEDV viruses were sent to Analytical & Testing Center, Sichuan University for TEM observation. Images were obtained with a JSM-7500F transmission electron microscope (JEOL).
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3

Transmission Electron Microscopy of Samples

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Samples were fixed in 3% glutaraldehyde and then sent to the Analytical and Testing Center, Sichuan University for TEM observation. Images were obtained with a JSM-7500F transmission electron microscope (JEOL, Tokyo, Japan).
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