Jsm 7600 f field

Manufactured by JEOL

The JSM 7600-F is a field-emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials at the nanoscale level. The core function of the JSM 7600-F is to provide advanced imaging and analytical capabilities through the use of field-emission electron sources, which enable the generation of a narrow, high-brightness electron beam.

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Lab products found in correlation

Discovery hybrid rheometer hr 3, by TA Instruments (1 mentions) Spectrum gx ftir spectrometer, by PerkinElmer (1 mentions) Discovery dsc, by TA Instruments (1 mentions) Axis supra, by Shimadzu (1 mentions) Q500 thermogravimetric analyzer, by TA Instruments (1 mentions) X maxn 150 silicon drift detector, by Oxford Instruments (1 mentions)

3 protocols using jsm 7600 f field

Thermal Characterization of Alumina-Filled Phthalonitrile

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Thermal gravimetric analysis (TGA)
was carried out using a Thermogravimetric Analyzer Q500, TA Instruments.
Dynamic heating at a heating rate of 10 °C/min to 600 °C
was performed to study the thermal stability of PN samples in air
(60 mL/min). A JEOL JSM 7600-F field-emission scanning electron microscope
(FESEM) was used for morphology examination. Fourier transform infrared
(FTIR) spectra from 400 to 4000 cm^–1 with spectral
resolution of 4 cm^–1 were collected using a PerkinElmer
Instruments Spectrum GX FTIR spectrometer to study the chemical interaction
between alumina and phthalonitrile. X-ray photoelectron spectroscopy
(XPS) measurements were conducted using Kratos AXIS Supra to investigate
the chemical bonding present in the samples. TA Instrument Discovery
Hybrid Rheometer (HR-3) was used to determine the time taken for cross-linked
networks to form in alumina-filled PN without APB. Differential scanning
calorimetry (DSC) was used for curing studies of the filler-containing
PN systems. Samples were weighed and sealed in hermetic pans. Dynamic
heating scans were carried out using Discovery DSC, TA Instruments,
from 40 to 380 °C at a heating rate of 10 °C/min under flowing
N₂ (40 mL/min).

Tay Y.S., Phua E.J., Chen Z, & Gan C.L. (2022). Simultaneous Enhancement of Polymerization Kinetics and Properties of Phthalonitrile Using Alumina Fillers. ACS Omega, 7(37), 32996-33003.

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Characterization of C-nPd Film Morphology

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The topography and morphology of the films were studied with scanning electron microscopy (SEM) with energy dispersive X-ray (EDX) composition analysis. These investigations were performed with the JEOL JSM-7600F field emission scanning electron microscope. For this purpose, the film samples were prepared on an alumina tape substrate. Observations of the surface topography were carried out at 5 keV incident electron beam energy. The microscope was equipped with an energy dispersive X-ray (EDX) spectrometer using X-MaxN 150 Silicon Drift Detector (Oxford Instruments). Due to the small thickness of the C-nPd layer, the quantitative analysis was carried out at a 5 kV accelerating voltage.
X-ray diffraction (XRD) studies were performed with a Rigaku SmartLab 3 kW diffractometer at room temperature in the θ/2θ scanning mode with CuKα radiation and Si:Li semiconductor detector. Diffraction measurements were performed in grazing incidence primary beam geometry (GIXD).

Terpilowska S., Gluszek S., Czerwosz E., Wronka H., Firek P., Szmidt J., Suchanska M., Keczkowska J., Kaczmarska B., Kozlowski M, & Diduszko R. (2022). Nano-Ag Particles Embedded in C-Matrix: Preparation, Properties and Application in Cell Metabolism. Materials, 15(17), 5826.

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Scanning Electron Microscopy Reflectance Spectroscopy

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Scanning electron microscopy (SEM) images were taken with a JEOL JSM 7600F field emission scanning electron microscope with an acceleration voltage of 5 kV. The experimental reflectance spectra were collected with a microspectrometer system (CRAIC QDI2010, CRAIC Technologies) with an aperture of 2 µm.

Jalali M., Yu Y., Xu K., Ng R.J., Dong Z., Wang L., Safari Dinachali S., Hong M, & Yang J.K. (2016). Stacking of colors in exfoliable plasmonic superlattices. Nanoscale, 8(42).

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