Nanoscope analysis software v 1
NanoScope Analysis software v.1.40 is a data analysis tool designed for use with Veeco's atomic force microscopy (AFM) instruments. The software provides advanced capabilities for processing and analyzing AFM data, enabling users to extract key information from their measurements.
Lab products found in correlation
3 protocols using nanoscope analysis software v 1
Atomic Force Microscopy of Escherichia coli
Binding Dynamics of CXC Chemokine
Bacterial Surface Roughness Measurement
with N
fields on each mica disc were imaged. Three-dimensional images and section
profiles were prepared using WS
measured over the entire bacterial cell surface on 3 × 3
µm2 areas. The average surface root mean square (RMS)
roughness was calculated from 25 fields (300 × 300 nm2). The
data were analysed using S
USA). Statistical significance was determined by ANOVA (Tukey's honestly
significant difference test).
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