Xflash 6160

Microstructural observation and analysis of the test samples with interference (P1a to P1e) were carried out with a high-resolution scanning electron microscope of the Center for Nanoscale Materials (CNM) at Argonne National Laboratory. The equipment utilized was a Hitachi S-4700-II (Hitachi, Krefeld, Germany), with an electron dispersive spectroscopic (EDS) detector, Bruker XFlash 6160 (Bruker, Billerica, MA, USA).
P1a to P1e samples were microstructurally characterized because damage was observed but fracture did not occur. This approach allows one to assess the formability of this multi-material sample prepared with interference, so more useful information was obtained from the defects found in the microstructural characterization.
The results obtained from these observations were compared with the finite element predictions of accumulated ductile damage. Further validation of the finite element computations was performed by comparing the numerical and experimental force-displacement evolutions. This is displayed in the following section.

A polarizing microscope (DM4P, Leica, Germany) was used to determine whether crystals could be produced by S. cerevisiae in different conditions. The minerals produced were then analyzed using a scanning electron microscope (SEM, Quattro S, Thermo Fisher, United States) with an energy-dispersive spectroscopy (EDS, XFlash 6160, Bruker, Germany) probe. The powder samples were analyzed in low-vacuum mode using an accelerating voltage of 15 kV for SEM and EDS.
Minerals precipitated by S. cerevisiae were further detected using an X-ray polycrystal diffractometer (XRD, D8 Advance, Bruker, Germany). The samples were analyzed over the range 10–70° 2θ at a scan rate of 1°/min in 0.02° increments. Fourier transform infrared spectroscopy (FTIR, Nicolet iN 10, Thermo Fisher, United States) was also used to analyze the minerals. The samples were mixed with potassium bromide (KBr, IR grade), and they were analyzed in the 4000–400 cm^–1 range (36 scans with a spectral resolution of 0.48 cm^–1).

For the S- and F-containing ND samples, corresponding SEM-EDX elemental analysis was performed using a Hitachi S-4700 SEM equipped with a Bruker X-Flash 6160 EDX detector. An accelerating voltage of 20 kV was used; all samples were Au-coated.

Initial viewings and analysis was done through an environmental scanning electron microscope (LEO 1455VP, Carl Zeiss) operating at 20 kV, equipped with an EDS detector (Vantage LN₂ type). To obtain higher resolution SEM images we used a field emission SEM (FE-SEM, Merlin, Carl Zeiss) operating at 0.02 kV to 30 kV. Chemical analysis was performed with an EDS system (XFlash 6160; a software of Espirit 1.9.4, Bruker) which was attached to the FE-SEM. We conducted EDS mapping on the following elements: F, Na, Mg, Al, Si, P, K, Ca, and Fe.

The morphologies and element mapping images were measured by scanning electron microscopy (SEM, SU8000, Hitachi) equipped with an energy dispersive X-ray spectroscopy (EDS, XFlash6160, Bruker). All samples were washed many times with 1,2-dimethoxyethane (DME, Sigma-Aldrich) solvent to remove residual electrolyte before tested.
The powder X-ray diffraction (XRD) data of pristine LATP and reduced LATP were obtained by a Phillips X'pert Pro MPD diffractometer with Cu-Kα (λ = 0.15418 nm). LATP powders were directly dropped on Li metal foil, and certain organic solvent was added to promote the reduction reaction between Li and LATP. After sufficient reaction, the reduced LATP powders was characterized with XRD.
The element valence states of the pristine LATP and reduced LATP were characterized by X-ray photoelectron spectroscopy (XPS, VG Scientific Ltd, UK). The sample preparation method of reduced LATP was the same as that of XRD sample. The spectra were calibrated by C1s (284.8 eV) to eliminate surface charge effects.

Surface and cross-section images of the s-HCs with AgNW interconnects were captured using optical microscopy (DSX510, Olympus). The real-time heat transfer of our s-HCs was examined using an infrared thermal imaging camera (T420, FLIR Systems). The distribution images of Ag–Ni particles in the PDMS layers with and without magnetic self-assembly were captured using SEM (Sigma 300, ZEISS) and analyzed by EDS (XFlash6160, Bruker).

The morphology and distribution of the materials were observed using a field emission scanning electron microscope (Hitachi, SU8010, Scanning Electron Microscope, SEM, Kyoto, Japan). X-ray diffraction analysis of the samples was performed using an X-ray diffractometer (RIKEN, Mini Flex 600, Diffraction of X-rays, XRD, Osaka, Japan) to determine the crystalline structure and orientation distribution of the samples. Point surface analysis was performed using an X-ray energy spectrometer (Bruker X Flash 6160, Energy Dispersive Spectroscopy, EDS, Karlsruhe, Germany) for qualitative analysis of all elements. The contact angle measuring instrument (SDC-350, Dongguan Shengding Precision Instrument Co., Ltd., Dongguan, China) was used to drop 2 μL of deionized water to measure the water contact angle on the surface of the material and take digital photos. Bacterial concentration was tested using a bacterial cell concentration meter (OD600, IMPLEN, Wetzlar, Germany). In this study, samples were tested at room temperature with an average power of around 100 mW by an in situ Raman spectrometer (HORIBA, LabRAM Odyssey, Kyoto, Japan) using a laser with a wavelength of 532 nm.