Fluorescence spectroscopy was performed to investigate the incorporation of organic compounds into the porous calcium carbonate. An RF-5300 PC fluorescent spectrometer (Shimadzu, Kyoto, Japan) was used to measure the fluorescence spectra of the powder samples, which were placed in a solid sample holder attached to the instrument. The excitation wavelength was fixed at 330 nm. The widths of the excitation and emission slits were fixed at 5 and 10 nm, respectively.
Multiflex
The MultiFlex is a multipurpose X-ray diffractometer designed for versatile laboratory applications. It is capable of performing a wide range of X-ray diffraction measurements, including phase identification, quantitative analysis, and structural characterization of various materials. The MultiFlex offers high-performance components and advanced features to provide reliable and accurate results.
Lab products found in correlation
19 protocols using multiflex
Characterization of Porous Calcium Carbonate
Fluorescence spectroscopy was performed to investigate the incorporation of organic compounds into the porous calcium carbonate. An RF-5300 PC fluorescent spectrometer (Shimadzu, Kyoto, Japan) was used to measure the fluorescence spectra of the powder samples, which were placed in a solid sample holder attached to the instrument. The excitation wavelength was fixed at 330 nm. The widths of the excitation and emission slits were fixed at 5 and 10 nm, respectively.
Soil Characterization and Contamination Assessment
Four indices—geo-accumulation index (Igeo), contamination factor (CF), pollution load index (PLI), and contamination degree (CD)—were determined to evaluate the extent of contamination in the study area due to ASGM activities (Adewumi and Laniyan, 2020 (link)). Descriptions and details of how these indices were determined are provided as supplementary information.
Characterizing Calcite Formation in Flow Paths
Comprehensive Soil Characterization Protocol
Layered Oxides with Controlled Iron Content
The X-ray diffraction (XRD) patterns were obtained using an X-ray powder diffractometer (MultiFlex, Rigaku, Tokyo, Japan) with the Bragg–Brentano (θ–2θ) geometry. The X-ray source was the Cu Kα line (λ = 1.54 Å) operated at 40 kV and 40 mA. The observed diffraction peaks can be indexed with O3-type structure (R m; Z = 3) without detectable impurities such as defect-spinel phases (Fig.
Comprehensive Characterization of Thin Film Materials
Characterization of Microporous Carbon Materials
Characterization of Catalytic Materials
were used without further drying or purification. The UV–visible
spectra were observed by a UV–visible spectrophotometer, (Shimadzu
Corporation, UV-2550). The XRD patterns were measured with the help
of a Rigaku MultiFlex instrument using a nickel-filtered Cu Kα
(0.15418 nm) radiation source. The SEM analyses were recorded on using
a “JEOL (JSM model 6390 LV”) scanning electron microscope,
operating at an accelerating voltage of 15 kV. The elemental composition
of the catalyst was confirmed through EDX analyses (the same instrument
attached with a scanning electron microscope). The particle size distribution
was characterized by a TEM instrument (model: JEOL JEM-2010).66 (link) The surface area and pore size distribution
were analyzed by BET analysis. 1H and 13C spectra
were recorded in CDCl3 using tetramethylsilane as an internal
standard on a JEOL, JNM ECS NMR spectrometer operating at 400 MHz.
Reaction products were confirmed by comparing the 1H and 13C NMR spectra (in the
Characterization of Ca-carbonate Mineralization
Preparation and Characterization of Arsenopyrite
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