Quantax edx

Reacted powders were ground and characterised by powder X-ray diffraction with a Bruker D2 Phaser X-ray diffractometer using Cu Kα radiation. Cu Kβ radiation was filtered using a Ni foil. XRD data were processed using the Bruker DiffracEva software package.
Sintered pellets were characterised by scanning electron microscopy and energy dispersive X-ray spectroscopy (SEM-EDX) using a Hitachi TM3030 SEM equipped with a Bruker Quantax EDX. An accelerating voltage of 15 kV was used for imaging. EDX data were analysed using Bruker Quantax software. Sintered pellets were prepared for SEM analysis by mounting in cold setting resin and polishing with SiC paper and progressively finer diamond pastes to an optical finish (1 μm). Samples were sputter coated with carbon to reduce surface charging effects.

UV–visible–NIR spectra were recorded using a PerkinElmer Lambda 750 spectrophotometer. For this, rGO-Os NP films were collected on quartz plates or dispersed in Milli-Q water by sonication. Field emission scanning electron microscopy (FESEM) images and energy dispersive X-ray spectroscopy (EDS) spectra were obtained using TESCAN MIRA3 LM (Czech Republic) and QUANTAX EDX (Bruker) instruments. X-ray diffraction studies of as-synthesized composites were done using a Rigaku SmartLab diffractometer equipped with parallel beam optics, and Cu Kα radiation (kα = 1.54 Å, 40 kV, 30 mA) was incident at a grazing angle of 0.3°.