Tecnai g2 f30 microscope

Transmission electron microscopy (TEM) images of the obtained samples were taken using a HITACHI HT-7700 microscope operated at 100 kV. High-resolution transmission electron microscopy (HRTEM) was performed using a FEI Tecnai F30 G2 microscope operated at 300 kV. High-angle annular dark-field scanning TEM (HAADF-STEM) and Energy Dispersive X-ray (EDX) mapping analyses were taken on a FEI Titan ChemiSTEM equipped with a probe-corrector and a Super-X EDX detector system. This microscope was operated at 200 kV with a probe current of 50 pA and a convergent angle of 21.4 mrad for illumination. The X-ray diffraction (XRD) patterns were recorded on a Miniflex600 X-ray diffractometer in a scan range of 10–80° at a scan rate of 10° min⁻¹. The percentages of Pd, Pt, and Cu in the samples were determined using inductively coupled plasma atomic emission spectrometry (ICP-AES, IRIS Intrepid II XSP, TJA Co., USA). TGA analysis was performed with a thermogravimetric analyzer (SDT Q600). The temperature was scanned from room temperature to 800 °C with a scan rate of 10 °C min⁻¹.

Ultravoilet-visible (UV-vis) absorption spectrum was recorded on a Shimadzu UV 2450PC spectrophotometer (Shimadzu Corp., Kyoto, Japan). Photoluminescence (PL) spectrum was monitored on a Perkin Elmer LS 55 luminescence spectrometer (PerkinElmer Inc., Waltham, MA, USA). High-resolution (HR) transmission electron microscopy (TEM) images were obtained with an FEI Tecnai G2F30 microscope (FEI, Hillsboro, OR, USA). The as-prepared realgar QDs were appropriately diluted with Milli-Q water before instrumental analysis.

Scanning electron microscope (SEM) images were obtained using a HITACHI S-4800 microscope (Japan). High-resolution transmission electron microscopy (HRTEM) images were obtained using a FEI Tecnai G2 F30 microscope (USA). The phase purity of the product was characterized by X-ray diffraction (XRD, German Bruker AXSD8 ADVANCE X-ray diffractometer) using an X-ray diffractometer with Cu KR radiation (λ = 1.5418 Å). The ultraviolet-visible (UV-Vis) diffuse reflectance spectra were obtained on an America Varian Cary 5000 spectrophotometer. Raman spectra were measured using a Britain Renishaw inVia Raman spectrometer at room temperature.

UV-vis absorption spectrum was recorded on a Shimadzu UV 2450PC spectrophotometer (Shimadzu Corp.). PL spectrum was monitored on a Perkin Elmer LS 55 luminescence spectrometer (PerkinElmer Inc.). Upconversion fluorescence spectrum was recorded by a Tsunami^® femtosecond Ti:sapphire oscillator (Spectra-Physics, Santa Clara, CA, USA). HRTEM images were observed with a FEI Tecnai G2F30 microscope (FEI). The as-prepared RQDs were appropriately diluted with Milli-Q water before instrumental analysis. Scanning electron microscopy (SEM) images were taken by a Hitachi S-4300 microscope (Hitachi Ltd., Tokyo, Japan). To prepare the samples for SEM imaging, dried precipitates obtained by adding formic acid into the solution of synthesized RQDs were firstly scattered onto carbon conductor tape followed by coating with gold.