Fei tecnai g2 f20 s twin

The structure of the prepared nanoparticles was visualized using transmission electron microscopy (TEM) with a FEI TECNAI G2 F20 S-TWIN (Thermo Fisher Scientific, Waltham, MA, USA).

For viewing the structure of the prepared nanoparticles and nanoformulations, we used transmission electron microscopy (TEM) or scanning TEM (STEM) with a FEI TECNAI G2 F20 S-TWIN (Thermo Fisher Scientific, Waltham, MA, USA).

Fourier transform infrared (FT–IR) spectra were recorded on a Nicolet 560 Fourier transform IR spectrometer (Thermo Scientific, Waltham, MA, USA). The XRD patterns were recorded using a Philips X’Pert PRO MPD (PANalytical B.V., Malvern, Holland). The Raman spectra were recorded on a LabRAM HR Raman Microscope (HORIBA Scientific, Paris, France) with an excitation length of 633 nm and a laser power of 0.5 mW. Morphology details were examined using scanning electron microscopy (SEM, JEOL JSM-5900LV, JEOL Ltd., Tokyo, Japan), transmission electron microscopy (TEM, FEI Tecnai G2 F20 S-TWIN, FEI Company, Hillsboro, OR, USA). The STEM and elemental mapping images were obtained from FEI Titan G2 60-300 (AC-TEM, FEI Company, Hillsboro, OR, USA). X-ray photoelectron spectroscopy (XPS) measurement was carried out on a Kratos ASAM 800 analyzer (Kratos Analytical Ltd., Manchester, UK), performing at 12 kV and 15 mA with a monochromatic Al Kα source (hν = 1486.6 eV). The nitrogen and adsorption–desorption measurements were performed on a BELSORB Max (MicrotracBEL Corp., Tokyo, Japan) sorption analyzer. The surface areas were calculated using the BET model in the pressure range P/P₀ from 0.05 to 0.3. The total pore volume was determined at a relative pressure of 0.99. The pore size distribution was analyzed from the gas adsorption data using an NLDFT method with a slit pore model.