Oxford Diffraction Gemini S diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Oxford Diffraction, 2010 ▸ ) Tmin = 0.550, Tmax = 1.000
5209 measured reflections
1466 independent reflections
1384 reflections with I > 2σ(I)
Rint = 0.101
The Gemini S diffractometer is a compact and versatile X-ray diffraction system designed for a variety of applications. It features a high-performance microfocus X-ray source and a sensitive detector, enabling efficient data collection and analysis of samples.
Oxford Diffraction Gemini S diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Oxford Diffraction, 2010 ▸ ) Tmin = 0.550, Tmax = 1.000
5209 measured reflections
1466 independent reflections
1384 reflections with I > 2σ(I)
Rint = 0.101
Oxford Diffraction Gemini S diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Oxford Diffraction, 2010 ▸ ) Tmin = 0.839, Tmax = 1.000
10366 measured reflections
10366 independent reflections
7015 reflections with I > 2σ(I)
Oxford Diffraction Gemini S diffractometer
Absorption correction: multi-scan (CrysAlis PRO; Oxford Diffraction, 2010 ▸ ) Tmin = 0.657, Tmax = 1.000
4952 measured reflections
2367 independent reflections
2259 reflections with I > 2σ(I)
Rint = 0.019
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